[{"name":"R3-185727","title":"Use case for Minimization of Drive Testing","source":"Samsung","contact":"Lixiang Xu","contact-id":50973,"tdoctype":"other","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":106,"ainumber":"25.2.1","ainame":"Support for MDT","tdoc_agenda_sort_order":29800,"status":"revised","reservation_date":"2018-09-28 10:47:31","uploaded":"2018-09-29 06:31:07","revisionof":"","revisedto":"R3-186104","release":"Rel-16","crspec":37.816,"crspecversion":"","workitem":[{"winame":"FS_LTE_NR_data_collect"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG3_Iu\/TSGR3_101bis\/Docs\/R3-185727.zip","group":"R3","meeting":"R3-101","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]