[{"name":"R1-2101235","title":"On mechanisms to improve reliability for RRC_CONNECTED UEs","source":"Samsung","contact":"Youngbum Kim","contact-id":80122,"tdoctype":"discussion","for":"Decision","abstract":"","secretary_remarks":"","agenda_item_sort_order":102,"ainumber":"8.12.2","ainame":"Mechanisms to improve reliability for RRC_CONNECTED UEs","tdoc_agenda_sort_order":0,"status":"not treated","reservation_date":"2021-01-15 11:23:34","uploaded":"2021-01-19 04:45:22","revisionof":"","revisedto":"","release":"Rel-17","crspec":"","crspecversion":"","workitem":[{"winame":"NR_MBS-Core"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG1_RL1\/TSGR1_104-e\/Docs\/R1-2101235.zip","group":"R1","meeting":"R1-104-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]