[{"name":"R4-1712547","title":"Measurement Uncertainty values of EIRP\/EIS for mmWave","source":"Anritsu Corporation","contact":"Osamu Yamashita","contact-id":66204,"tdoctype":"discussion","for":"Discussion","abstract":"Based on the agreed baseline test setup at the telecon after #84bis, we provide our calculation result of MU values for EIRP\/EIS at mmWave range.","secretary_remarks":"","agenda_item_sort_order":444,"ainumber":"9.8.2","ainame":"Measurement uncertainty and test tolerance [FS_NR_test_methods]","tdoc_agenda_sort_order":288600,"status":"noted","reservation_date":"2017-11-16 15:29:21","uploaded":"2017-11-17 17:35:19","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"FS_NR_test_methods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_85\/Docs\/R4-1712547.zip","group":"R4","meeting":"R4-85","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1712661","title":"Extension of quiet zone characterization method to include phase characterization","source":"Keysight Technologies UK Ltd,MVG Industries","contact":"Moray Rumney","contact-id":6630,"tdoctype":"other","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":444,"ainumber":"9.8.2","ainame":"Measurement uncertainty and test tolerance [FS_NR_test_methods]","tdoc_agenda_sort_order":368000,"status":"noted","reservation_date":"2017-11-16 17:48:23","uploaded":"2017-11-17 20:59:34","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_85\/Docs\/R4-1712661.zip","group":"R4","meeting":"R4-85","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1712662","title":"MU aspects for EIS","source":"Keysight Technologies UK Ltd","contact":"Moray Rumney","contact-id":6630,"tdoctype":"other","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":444,"ainumber":"9.8.2","ainame":"Measurement uncertainty and test tolerance [FS_NR_test_methods]","tdoc_agenda_sort_order":300600,"status":"noted","reservation_date":"2017-11-16 17:50:24","uploaded":"2017-11-17 20:59:34","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_85\/Docs\/R4-1712662.zip","group":"R4","meeting":"R4-85","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1712663","title":"QZ calibration procedure for CATR","source":"Keysight Technologies UK Ltd","contact":"Moray Rumney","contact-id":6630,"tdoctype":"other","for":"Information","abstract":"","secretary_remarks":"","agenda_item_sort_order":444,"ainumber":"9.8.2","ainame":"Measurement uncertainty and test tolerance [FS_NR_test_methods]","tdoc_agenda_sort_order":368200,"status":"noted","reservation_date":"2017-11-16 17:54:52","uploaded":"2017-11-17 20:59:34","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_85\/Docs\/R4-1712663.zip","group":"R4","meeting":"R4-85","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1712664","title":"MU proposal for CATR","source":"Keysight Technologies UK Ltd","contact":"Moray Rumney","contact-id":6630,"tdoctype":"other","for":"Information","abstract":"","secretary_remarks":"","agenda_item_sort_order":444,"ainumber":"9.8.2","ainame":"Measurement uncertainty and test tolerance [FS_NR_test_methods]","tdoc_agenda_sort_order":300800,"status":"revised","reservation_date":"2017-11-16 17:56:24","uploaded":"2017-11-17 22:56:34","revisionof":"","revisedto":"R4-1714534","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_85\/Docs\/R4-1712664.zip","group":"R4","meeting":"R4-85","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1712809","title":"WF on NR MU and test tolerance","source":"CATR, Intel, Rohde & Schwarz","contact":"Ruixin Wang","contact-id":64036,"tdoctype":"other","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":444,"ainumber":"9.8.2","ainame":"Measurement uncertainty and test tolerance [FS_NR_test_methods]","tdoc_agenda_sort_order":266200,"status":"approved","reservation_date":"2017-11-17 02:25:37","uploaded":"2017-12-05 14:17:58","revisionof":"","revisedto":"","release":"Rel-15","crspec":"","crspecversion":"","workitem":[{"winame":"FS_NR_test_methods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_85\/Docs\/R4-1712809.zip","group":"R4","meeting":"R4-85","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1712886","title":"Whitebox approach MU improvements","source":"Intel Corporation","contact":"Yang Tang","contact-id":56725,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":444,"ainumber":"9.8.2","ainame":"Measurement uncertainty and test tolerance [FS_NR_test_methods]","tdoc_agenda_sort_order":266400,"status":"noted","reservation_date":"2017-11-17 04:58:54","uploaded":"2017-11-17 21:53:16","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"FS_NR_test_methods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_85\/Docs\/R4-1712886.zip","group":"R4","meeting":"R4-85","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1713006","title":"NR MU offline call#1 meeting minutes","source":"CATR","contact":"Ruixin Wang","contact-id":64036,"tdoctype":"report","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":444,"ainumber":"9.8.2","ainame":"Measurement uncertainty and test tolerance [FS_NR_test_methods]","tdoc_agenda_sort_order":254700,"status":"approved","reservation_date":"2017-11-17 08:07:24","uploaded":"2017-11-17 12:27:17","revisionof":"","revisedto":"","release":"Rel-15","crspec":"38.810","crspecversion":"","workitem":[{"winame":"FS_NR_test_methods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_85\/Docs\/R4-1713006.zip","group":"R4","meeting":"R4-85","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1713008","title":"NR MU offline call#2 meeting minutes","source":"CATR","contact":"Ruixin Wang","contact-id":64036,"tdoctype":"report","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":444,"ainumber":"9.8.2","ainame":"Measurement uncertainty and test tolerance [FS_NR_test_methods]","tdoc_agenda_sort_order":266100,"status":"approved","reservation_date":"2017-11-17 08:12:01","uploaded":"2017-11-17 12:27:17","revisionof":"","revisedto":"","release":"Rel-15","crspec":"38.810","crspecversion":"","workitem":[{"winame":"FS_NR_test_methods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_85\/Docs\/R4-1713008.zip","group":"R4","meeting":"R4-85","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1713215","title":"TP on Measurement Uncertainty assessment","source":"CATR","contact":"Ruixin Wang","contact-id":64036,"tdoctype":"other","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":444,"ainumber":"9.8.2","ainame":"Measurement uncertainty and test tolerance [FS_NR_test_methods]","tdoc_agenda_sort_order":266300,"status":"approved","reservation_date":"2017-11-17 09:49:51","uploaded":"2017-12-05 14:17:58","revisionof":"","revisedto":"","release":"Rel-15","crspec":"38.810","crspecversion":"","workitem":[{"winame":"FS_NR_test_methods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_85\/Docs\/R4-1713215.zip","group":"R4","meeting":"R4-85","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1713659","title":"Estimating the Measurement Distance Uncertainty for the measurement baseline setup at mmWave","source":"MVG Industries","contact":"Alessandro Scannavini","contact-id":52688,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":444,"ainumber":"9.8.2","ainame":"Measurement uncertainty and test tolerance [FS_NR_test_methods]","tdoc_agenda_sort_order":280900,"status":"noted","reservation_date":"2017-11-17 16:41:05","uploaded":"2017-11-17 21:43:42","revisionof":"","revisedto":"","release":"Rel-15","crspec":"","crspecversion":"","workitem":[{"winame":"FS_NR_test_methods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_85\/Docs\/R4-1713659.zip","group":"R4","meeting":"R4-85","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1713662","title":"QZ Ripple Test at mm-Wave ? Proposal for directivity mask for reference antenna","source":"MVG Industries","contact":"Alessandro Scannavini","contact-id":52688,"tdoctype":"other","for":"Approval","abstract":"During 3GPP RAN4 #84-bis, contribution R4-1711272 was approved [1]. Basically, it was agreed on standardize a mask for directivity and HPBW for the reference antenna to be used for the QZ ripple test at mm-Wave.\nThis contribution is proposing a directivit","secretary_remarks":"","agenda_item_sort_order":444,"ainumber":"9.8.2","ainame":"Measurement uncertainty and test tolerance [FS_NR_test_methods]","tdoc_agenda_sort_order":369500,"status":"noted","reservation_date":"2017-11-17 16:45:05","uploaded":"2017-11-17 21:44:15","revisionof":"","revisedto":"","release":"Rel-15","crspec":"","crspecversion":"","workitem":[{"winame":"FS_NR_test_methods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_85\/Docs\/R4-1713662.zip","group":"R4","meeting":"R4-85","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1713677","title":"Test Equipment Measurement Uncertainties for NR UE RF Baseline System","source":"ROHDE & SCHWARZ","contact":"Thorsten Hertel","contact-id":60675,"tdoctype":"other","for":"Approval","abstract":"This contribution introduces test equipment measurement uncertainties for the NR UE RF baseline system.","secretary_remarks":"","agenda_item_sort_order":444,"ainumber":"9.8.2","ainame":"Measurement uncertainty and test tolerance [FS_NR_test_methods]","tdoc_agenda_sort_order":365900,"status":"noted","reservation_date":"2017-11-17 17:36:59","uploaded":"2017-11-17 22:56:04","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_85\/Docs\/R4-1713677.zip","group":"R4","meeting":"R4-85","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1713680","title":"FR2 NR UE RF Baseline Test System Assumptions for assessing the measurement uncertainty","source":"ROHDE & SCHWARZ","contact":"Thorsten Hertel","contact-id":60675,"tdoctype":"other","for":"Approval","abstract":"This contribution introduces a sample system setup for in-band UE RF conformance measurements excluding carrier aggregation for the NR UE RF baseline system for FR2.","secretary_remarks":"","agenda_item_sort_order":444,"ainumber":"9.8.2","ainame":"Measurement uncertainty and test tolerance [FS_NR_test_methods]","tdoc_agenda_sort_order":321500,"status":"noted","reservation_date":"2017-11-17 17:50:49","uploaded":"2017-11-17 22:56:04","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_85\/Docs\/R4-1713680.zip","group":"R4","meeting":"R4-85","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1713682","title":"Measurement Results for the NR UE RF Baseline System QZ Validation","source":"ROHDE & SCHWARZ","contact":"Thorsten Hertel","contact-id":60675,"tdoctype":"other","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":444,"ainumber":"9.8.2","ainame":"Measurement uncertainty and test tolerance [FS_NR_test_methods]","tdoc_agenda_sort_order":371600,"status":"noted","reservation_date":"2017-11-17 17:55:35","uploaded":"2017-12-05 14:17:58","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_85\/Docs\/R4-1713682.zip","group":"R4","meeting":"R4-85","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1713695","title":"Mismatch Uncertainty Example for the Calibration Stage","source":"ROHDE & SCHWARZ","contact":"Thorsten Hertel","contact-id":60675,"tdoctype":"other","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":444,"ainumber":"9.8.2","ainame":"Measurement uncertainty and test tolerance [FS_NR_test_methods]","tdoc_agenda_sort_order":367700,"status":"revised","reservation_date":"2017-11-17 17:59:17","uploaded":"2017-11-17 22:56:04","revisionof":"","revisedto":"R4-1714378","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_85\/Docs\/R4-1713695.zip","group":"R4","meeting":"R4-85","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1713716","title":"MU proposal for RF baseline","source":"Keysight Technologies UK Ltd","contact":"Moray Rumney","contact-id":6630,"tdoctype":"other","for":"Information","abstract":"","secretary_remarks":"","agenda_item_sort_order":444,"ainumber":"9.8.2","ainame":"Measurement uncertainty and test tolerance [FS_NR_test_methods]","tdoc_agenda_sort_order":366200,"status":"noted","reservation_date":"2017-11-17 18:19:53","uploaded":"2017-11-17 22:13:30","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_85\/Docs\/R4-1713716.zip","group":"R4","meeting":"R4-85","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1714378","title":"Mismatch Uncertainty Example for the Calibration Stage","source":"ROHDE & SCHWARZ","contact":"Kyoungseok Oh","contact-id":66120,"tdoctype":"other","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":444,"ainumber":"9.8.2","ainame":"Measurement uncertainty and test tolerance [FS_NR_test_methods]","tdoc_agenda_sort_order":367701,"status":"noted","reservation_date":"2017-12-05 15:10:50","uploaded":"2017-12-05 15:17:57","revisionof":"R4-1713695","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_85\/Docs\/R4-1714378.zip","group":"R4","meeting":"R4-85","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1714534","title":"MU proposal for CATR","source":"Keysight Technologies UK Ltd","contact":"Kyoungseok Oh","contact-id":66120,"tdoctype":"other","for":"Information","abstract":"","secretary_remarks":"","agenda_item_sort_order":444,"ainumber":"9.8.2","ainame":"Measurement uncertainty and test tolerance [FS_NR_test_methods]","tdoc_agenda_sort_order":300801,"status":"revised","reservation_date":"2017-12-05 15:12:34","uploaded":"2017-12-05 15:17:58","revisionof":"R4-1712664","revisedto":"R4-1714541","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_85\/Docs\/R4-1714534.zip","group":"R4","meeting":"R4-85","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1714541","title":"MU proposal for CATR","source":"Keysight Technologies UK Ltd","contact":"Kyoungseok Oh","contact-id":66120,"tdoctype":"other","for":"Information","abstract":"","secretary_remarks":"","agenda_item_sort_order":444,"ainumber":"9.8.2","ainame":"Measurement uncertainty and test tolerance [FS_NR_test_methods]","tdoc_agenda_sort_order":300802,"status":"noted","reservation_date":"2017-12-05 15:12:38","uploaded":"2017-12-05 15:17:58","revisionof":"R4-1714534","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_85\/Docs\/R4-1714541.zip","group":"R4","meeting":"R4-85","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]