[{"name":"R4-1712357","title":"On gap pattern design and applicability for NR","source":"Intel Corporation","contact":"Yang Tang","contact-id":56725,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":414,"ainumber":"9.7.4.1","ainame":"MGL and MGRP [NR_newRAT]","tdoc_agenda_sort_order":248400,"status":"noted","reservation_date":"2017-11-16 00:58:29","uploaded":"2017-11-17 21:53:16","revisionof":"","revisedto":"","release":"Rel-15","crspec":"38.133","crspecversion":"","workitem":[{"winame":"NR_newRAT"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_85\/Docs\/R4-1712357.zip","group":"R4","meeting":"R4-85","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1712359","title":"LS to RAN2 on gap design for NR","source":"Intel Corporation","contact":"Yang Tang","contact-id":56725,"tdoctype":"LS out","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":414,"ainumber":"9.7.4.1","ainame":"MGL and MGRP [NR_newRAT]","tdoc_agenda_sort_order":343400,"status":"noted","reservation_date":"2017-11-16 00:58:29","uploaded":"2017-11-17 21:53:16","revisionof":"","revisedto":"","release":"Rel-15","crspec":"","crspecversion":"","workitem":[{"winame":"NR_newRAT"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"RAN2","Cc":"RAN1","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_85\/Docs\/R4-1712359.zip","group":"R4","meeting":"R4-85","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1712364","title":"TP on measurement gap in TS38.133 section 9.1.2","source":"Intel Corporation","contact":"Yang Tang","contact-id":56725,"tdoctype":"other","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":414,"ainumber":"9.7.4.1","ainame":"MGL and MGRP [NR_newRAT]","tdoc_agenda_sort_order":309800,"status":"revised","reservation_date":"2017-11-16 00:58:29","uploaded":"2017-11-17 21:53:16","revisionof":"","revisedto":"R4-1713937","release":"Rel-15","crspec":"38.133","crspecversion":"","workitem":[{"winame":"NR_newRAT"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_85\/Docs\/R4-1712364.zip","group":"R4","meeting":"R4-85","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1712484","title":"Introduction of measurement gaps for NR in 36.133","source":"Ericsson","contact":"Christopher Callender","contact-id":58614,"tdoctype":"CR","for":"Approval","abstract":"Introduction of NR measurement gap patterns in 36.133","secretary_remarks":"","agenda_item_sort_order":414,"ainumber":"9.7.4.1","ainame":"MGL and MGRP [NR_newRAT]","tdoc_agenda_sort_order":343200,"status":"noted","reservation_date":"2017-11-16 10:45:09","uploaded":"2017-11-17 14:52:54","revisionof":"","revisedto":"","release":"Rel-15","crspec":"36.133","crspecversion":"15.0.0","workitem":[{"winame":"NR_newRAT"}],"crnumber":5338.0,"crrevision":"","crcategory":"B","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_85\/Docs\/R4-1712484.zip","group":"R4","meeting":"R4-85","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1712485","title":"Further aspects of measurement gap design for NR: MGL and MGRP","source":"Ericsson","contact":"Christopher Callender","contact-id":58614,"tdoctype":"discussion","for":"Discussion","abstract":"Discussion of remaining issues in NR gap pattern design","secretary_remarks":"","agenda_item_sort_order":414,"ainumber":"9.7.4.1","ainame":"MGL and MGRP [NR_newRAT]","tdoc_agenda_sort_order":248500,"status":"noted","reservation_date":"2017-11-16 10:45:10","uploaded":"2017-11-17 14:52:54","revisionof":"","revisedto":"","release":"Rel-15","crspec":"","crspecversion":"","workitem":[{"winame":"NR_newRAT"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_85\/Docs\/R4-1712485.zip","group":"R4","meeting":"R4-85","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1713011","title":"Discussion on measurement gap pattern for NR","source":"NTT DOCOMO, INC.","contact":"Hiroki Harada","contact-id":47533,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":414,"ainumber":"9.7.4.1","ainame":"MGL and MGRP [NR_newRAT]","tdoc_agenda_sort_order":301100,"status":"noted","reservation_date":"2017-11-17 08:15:45","uploaded":"2017-11-17 12:19:25","revisionof":"","revisedto":"","release":"Rel-15","crspec":"","crspecversion":"","workitem":[{"winame":"NR_newRAT"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_85\/Docs\/R4-1713011.zip","group":"R4","meeting":"R4-85","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1713057","title":"Further discussion on MGL and MGRP in NR","source":"ZTE","contact":"Qian Yang","contact-id":45032,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":414,"ainumber":"9.7.4.1","ainame":"MGL and MGRP [NR_newRAT]","tdoc_agenda_sort_order":305700,"status":"noted","reservation_date":"2017-11-17 08:56:03","uploaded":"2017-11-17 12:35:08","revisionof":"","revisedto":"","release":"Rel-15","crspec":"","crspecversion":"","workitem":[{"winame":"NR_newRAT"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_85\/Docs\/R4-1713057.zip","group":"R4","meeting":"R4-85","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1713097","title":"Consideration on measurement gap patterns and applicability","source":"Nokia, Nokia Shanghai Bell","contact":"Li Zhang","contact-id":73683,"tdoctype":"discussion","for":"Discussion","abstract":"In this paper, we will provide our views on the measurement gap pattern and applicability.","secretary_remarks":"","agenda_item_sort_order":414,"ainumber":"9.7.4.1","ainame":"MGL and MGRP [NR_newRAT]","tdoc_agenda_sort_order":309700,"status":"noted","reservation_date":"2017-11-17 09:12:39","uploaded":"2017-11-17 17:55:29","revisionof":"","revisedto":"","release":"Rel-15","crspec":"","crspecversion":"","workitem":[{"winame":"NR_newRAT"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_85\/Docs\/R4-1713097.zip","group":"R4","meeting":"R4-85","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1713098","title":"TP on measurement gap pattern for NR","source":"Nokia, Nokia Shanghai Bell","contact":"Li Zhang","contact-id":73683,"tdoctype":"other","for":"Endorsement","abstract":"This contribution is a text proposal for TS 38.133 v0.3.0 on measurement gap pattern for NR.","secretary_remarks":"","agenda_item_sort_order":414,"ainumber":"9.7.4.1","ainame":"MGL and MGRP [NR_newRAT]","tdoc_agenda_sort_order":342900,"status":"noted","reservation_date":"2017-11-17 09:12:39","uploaded":"2017-11-17 17:55:29","revisionof":"","revisedto":"","release":"Rel-15","crspec":"","crspecversion":"","workitem":[{"winame":"NR_newRAT"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_85\/Docs\/R4-1713098.zip","group":"R4","meeting":"R4-85","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1713429","title":"Further discussion on MGL and MGRP in NR","source":"Huawei,HiSilicon","contact":"Xiang (Steven) Chen","contact-id":41576,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":414,"ainumber":"9.7.4.1","ainame":"MGL and MGRP [NR_newRAT]","tdoc_agenda_sort_order":235700,"status":"noted","reservation_date":"2017-11-17 12:02:39","uploaded":"2017-11-17 20:16:43","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_85\/Docs\/R4-1713429.zip","group":"R4","meeting":"R4-85","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1713430","title":"Discussion on the combination of measurement gap pattern","source":"Huawei,HiSilicon","contact":"Xiang (Steven) Chen","contact-id":41576,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":414,"ainumber":"9.7.4.1","ainame":"MGL and MGRP [NR_newRAT]","tdoc_agenda_sort_order":235900,"status":"noted","reservation_date":"2017-11-17 12:02:39","uploaded":"2017-11-17 20:16:43","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_85\/Docs\/R4-1713430.zip","group":"R4","meeting":"R4-85","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1713431","title":"CR on measurement gap patterns in TS 36.133","source":"Huawei,HiSilicon","contact":"Xiang (Steven) Chen","contact-id":41576,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":414,"ainumber":"9.7.4.1","ainame":"MGL and MGRP [NR_newRAT]","tdoc_agenda_sort_order":343100,"status":"revised","reservation_date":"2017-11-17 12:02:39","uploaded":"2017-11-17 20:16:43","revisionof":"","revisedto":"R4-1713939","release":"Rel-15","crspec":"36.133","crspecversion":"15.0.0","workitem":[{"winame":"NR_newRAT"}],"crnumber":5467.0,"crrevision":"","crcategory":"B","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_85\/Docs\/R4-1713431.zip","group":"R4","meeting":"R4-85","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1713432","title":"TP on TS38.133 for measurement gap based requirements","source":"Huawei,HiSilicon","contact":"Xiang (Steven) Chen","contact-id":41576,"tdoctype":"pCR","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":414,"ainumber":"9.7.4.1","ainame":"MGL and MGRP [NR_newRAT]","tdoc_agenda_sort_order":343000,"status":"noted","reservation_date":"2017-11-17 12:02:40","uploaded":"2017-11-17 20:16:43","revisionof":"","revisedto":"","release":"Rel-15","crspec":"38.133","crspecversion":"0.3.0","workitem":[{"winame":"NR_newRAT"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_85\/Docs\/R4-1713432.zip","group":"R4","meeting":"R4-85","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1713433","title":"LS on measurement gap in NR","source":"Huawei,HiSilicon","contact":"Xiang (Steven) Chen","contact-id":41576,"tdoctype":"LS out","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":414,"ainumber":"9.7.4.1","ainame":"MGL and MGRP [NR_newRAT]","tdoc_agenda_sort_order":343300,"status":"revised","reservation_date":"2017-11-17 12:02:40","uploaded":"2017-11-17 20:16:43","revisionof":"","revisedto":"R4-1713938","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"RAN2","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_85\/Docs\/R4-1713433.zip","group":"R4","meeting":"R4-85","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1713937","title":"TP on measurement gap in TS38.133 section 9.1.2","source":"Intel Corporation","contact":"Kyoungseok Oh","contact-id":66120,"tdoctype":"other","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":414,"ainumber":"9.7.4.1","ainame":"MGL and MGRP [NR_newRAT]","tdoc_agenda_sort_order":309801,"status":"revised","reservation_date":"2017-12-05 15:05:48","uploaded":"2017-12-05 15:07:57","revisionof":"R4-1712364","revisedto":"R4-1714497","release":"Rel-15","crspec":"38.133","crspecversion":"","workitem":[{"winame":"NR_newRAT"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_85\/Docs\/R4-1713937.zip","group":"R4","meeting":"R4-85","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1713938","title":"LS on measurement gap in NR","source":"Huawei,HiSilicon","contact":"Kyoungseok Oh","contact-id":66120,"tdoctype":"LS out","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":414,"ainumber":"9.7.4.1","ainame":"MGL and MGRP [NR_newRAT]","tdoc_agenda_sort_order":343301,"status":"revised","reservation_date":"2017-12-05 15:05:48","uploaded":"2017-12-05 15:07:57","revisionof":"R4-1713433","revisedto":"R4-1714503","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"RAN2","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_85\/Docs\/R4-1713938.zip","group":"R4","meeting":"R4-85","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1713939","title":"CR on measurement gap patterns in TS 36.133","source":"Huawei,HiSilicon","contact":"Kyoungseok Oh","contact-id":66120,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":414,"ainumber":"9.7.4.1","ainame":"MGL and MGRP [NR_newRAT]","tdoc_agenda_sort_order":343101,"status":"agreed","reservation_date":"2017-12-05 15:05:48","uploaded":"2017-12-05 15:07:57","revisionof":"R4-1713431","revisedto":"","release":"Rel-15","crspec":"36.133","crspecversion":"15.0.0","workitem":[{"winame":"NR_newRAT"}],"crnumber":5467.0,"crrevision":1.0,"crcategory":"B","tsg_crp":"RP-172571","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_85\/Docs\/R4-1713939.zip","group":"R4","meeting":"R4-85","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1714497","title":"TP on measurement gap in TS38.133 section 9.1.2","source":"Intel Corporation","contact":"Kyoungseok Oh","contact-id":66120,"tdoctype":"other","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":414,"ainumber":"9.7.4.1","ainame":"MGL and MGRP [NR_newRAT]","tdoc_agenda_sort_order":309802,"status":"endorsed","reservation_date":"2017-12-05 15:12:14","uploaded":"2017-12-05 15:17:58","revisionof":"R4-1713937","revisedto":"","release":"Rel-15","crspec":"38.133","crspecversion":"","workitem":[{"winame":"NR_newRAT"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_85\/Docs\/R4-1714497.zip","group":"R4","meeting":"R4-85","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1714503","title":"LS on measurement gap in NR","source":"Huawei,HiSilicon","contact":"Kyoungseok Oh","contact-id":66120,"tdoctype":"LS out","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":414,"ainumber":"9.7.4.1","ainame":"MGL and MGRP [NR_newRAT]","tdoc_agenda_sort_order":343302,"status":"approved","reservation_date":"2017-12-05 15:12:17","uploaded":"2017-12-05 15:17:58","revisionof":"R4-1713938","revisedto":"","release":"Rel-15","crspec":"","crspecversion":"","workitem":[{"winame":"NR_newRAT-Core"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"RAN2","Cc":"RAN1","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_85\/Docs\/R4-1714503.zip","group":"R4","meeting":"R4-85","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]