[{"name":"S4-161137","title":"On interruption time measurement","source":"ROHDE & SCHWARZ","contact":"Walter Nestler","contact-id":19412,"tdoctype":"discussion","for":"Discussion","abstract":"Test method for detection of gaps and calculation of the interruption time in a test signal (CSS without pauses).","secretary_remarks":"","agenda_item_sort_order":45,"ainumber":"9.7","ainame":"EXT_UED (Extension of UE delay test methods and requirements)","tdoc_agenda_sort_order":0,"status":"agreed","reservation_date":"2016-10-13 14:27:16","uploaded":"2016-10-17 08:49:13","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_SA\/WG4_CODEC\/TSGS4_91\/Docs\/S4-161137.zip","group":"S4","meeting":"S4-91","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"S4-161139","title":"Send direction test signal level for headset electrical interface","source":"ROHDE & SCHWARZ","contact":"Walter Nestler","contact-id":19412,"tdoctype":"discussion","for":"Discussion","abstract":"Draft TR 26.954 defines a test setup for delay and speech quality measurements through a headset electrical interface of a mobile device. In sending direction the input level to the headset interface is set to -60 dBV. The resulting level on the network side depends on the input gain of the UE under test. The source proposes to adjust the input level to the UE under test such that a level of -16 dBm0 is obtained on the network side.","secretary_remarks":"","agenda_item_sort_order":45,"ainumber":"9.7","ainame":"EXT_UED (Extension of UE delay test methods and requirements)","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2016-10-13 14:32:15","uploaded":"2016-10-17 08:49:13","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_SA\/WG4_CODEC\/TSGS4_91\/Docs\/S4-161139.zip","group":"S4","meeting":"S4-91","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"S4-161179","title":"Some data on end-to-end delay in a live VoLTE network","source":"Knowles Inc.","contact":"Scott Isabelle","contact-id":45142,"tdoctype":"other","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":45,"ainumber":"9.7","ainame":"EXT_UED (Extension of UE delay test methods and requirements)","tdoc_agenda_sort_order":0,"status":"agreed","reservation_date":"2016-10-17 17:47:48","uploaded":"2016-10-20 06:39:13","revisionof":"","revisedto":"","release":"Rel-14","crspec":"","crspecversion":"","workitem":[{"winame":"EXT_UED"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_SA\/WG4_CODEC\/TSGS4_91\/Docs\/S4-161179.zip","group":"S4","meeting":"S4-91","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"S4-161219","title":"Proposed new text for the EXT_UED headset interface test plan TR 26.954","source":"Sony Mobile Communications AB","contact":"Peter Isberg","contact-id":39837,"tdoctype":"discussion","for":"Agreement","abstract":"Within EXT_UED, TR 26.954 is being drafted to describe best practice for studying some speech quality related aspects where an electrical interface to the test equipment is more practical than an acoustical interface.\nTo give advice of how to handle speech enhancement processing, it is suggested to include the text in section 2 into the draft TR.","secretary_remarks":"","agenda_item_sort_order":45,"ainumber":"9.7","ainame":"EXT_UED (Extension of UE delay test methods and requirements)","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2016-10-18 13:18:03","uploaded":"2016-10-18 13:27:17","revisionof":"","revisedto":"","release":"Rel-14","crspec":26.954,"crspecversion":"0.0.1","workitem":[{"winame":"EXT_UED"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_SA\/WG4_CODEC\/TSGS4_91\/Docs\/S4-161219.zip","group":"S4","meeting":"S4-91","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"S4-161245","title":"Draft CR to TS 26.131 on EXT_UED","source":"ORANGE","contact":"Stephane Ragot","contact-id":32055,"tdoctype":"draftCR","for":"Agreement","abstract":"","secretary_remarks":"At next telco it could be agreed to transform it into a formal CR for SA4#92 meeting","agenda_item_sort_order":45,"ainumber":"9.7","ainame":"EXT_UED (Extension of UE delay test methods and requirements)","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2016-10-18 18:42:12","uploaded":"2016-10-18 20:39:34","revisionof":"","revisedto":"","release":"Rel-13","crspec":26.131,"crspecversion":"13.3.0","workitem":[{"winame":"EXT_UED"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_SA\/WG4_CODEC\/TSGS4_91\/Docs\/S4-161245.zip","group":"S4","meeting":"S4-91","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"S4-161246","title":"Draft CR to TS 26.132 on EXT_UED","source":"ORANGE","contact":"Stephane Ragot","contact-id":32055,"tdoctype":"draftCR","for":"Agreement","abstract":"","secretary_remarks":"At next telco it could be agreed to transform it into a formal CR for SA4#92 meeting","agenda_item_sort_order":45,"ainumber":"9.7","ainame":"EXT_UED (Extension of UE delay test methods and requirements)","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2016-10-18 18:42:12","uploaded":"2016-10-18 20:39:34","revisionof":"","revisedto":"","release":"Rel-13","crspec":26.132,"crspecversion":"13.3.0","workitem":[{"winame":"EXT_UED"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_SA\/WG4_CODEC\/TSGS4_91\/Docs\/S4-161246.zip","group":"S4","meeting":"S4-91","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"S4-161247","title":"Enhancements to existing delay tests","source":"ORANGE","contact":"Stephane Ragot","contact-id":32055,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":45,"ainumber":"9.7","ainame":"EXT_UED (Extension of UE delay test methods and requirements)","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2016-10-18 18:42:12","uploaded":"2016-10-18 20:39:34","revisionof":"","revisedto":"","release":"Rel-14","crspec":"","crspecversion":"","workitem":[{"winame":"EXT_UED"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_SA\/WG4_CODEC\/TSGS4_91\/Docs\/S4-161247.zip","group":"S4","meeting":"S4-91","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"S4-161254","title":"DRAFT TR 26.954","source":"Qualcomm,Incorporated","contact":"Andre Schevciw","contact-id":44155,"tdoctype":"pCR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":45,"ainumber":"9.7","ainame":"EXT_UED (Extension of UE delay test methods and requirements)","tdoc_agenda_sort_order":0,"status":"revised","reservation_date":"2016-10-18 20:59:17","uploaded":"2016-10-19 22:14:05","revisionof":"","revisedto":"S4-161349","release":"","crspec":26.954,"crspecversion":"0.0.1","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_SA\/WG4_CODEC\/TSGS4_91\/Docs\/S4-161254.zip","group":"S4","meeting":"S4-91","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"S4-161255","title":"Proposed updates to TR 26.954","source":"Qualcomm,Incorporated","contact":"Andre Schevciw","contact-id":44155,"tdoctype":"pCR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":45,"ainumber":"9.7","ainame":"EXT_UED (Extension of UE delay test methods and requirements)","tdoc_agenda_sort_order":0,"status":"agreed","reservation_date":"2016-10-18 21:01:16","uploaded":"2016-10-25 15:12:38","revisionof":"","revisedto":"","release":"","crspec":26.954,"crspecversion":"0.0.1","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_SA\/WG4_CODEC\/TSGS4_91\/Docs\/S4-161255.zip","group":"S4","meeting":"S4-91","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"S4-161347","title":"pCR to TR 26.954: proposed new sub-clause","source":"Sony Mobile Communications","contact":"Paolino Usai","contact-id":3209,"tdoctype":"pCR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":45,"ainumber":"9.7","ainame":"EXT_UED (Extension of UE delay test methods and requirements)","tdoc_agenda_sort_order":0,"status":"revised","reservation_date":"2016-11-05 14:16:52","uploaded":"2016-11-07 07:17:26","revisionof":"","revisedto":"S4-161348","release":"","crspec":26.954,"crspecversion":"0.1.0","workitem":[{"winame":"EXT_UED"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_SA\/WG4_CODEC\/TSGS4_91\/Docs\/S4-161347.zip","group":"S4","meeting":"S4-91","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"S4-161348","title":"pCR to TR 26.954: proposed new sub-clause","source":"Sony Mobile Communications","contact":"Paolino Usai","contact-id":3209,"tdoctype":"pCR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":45,"ainumber":"9.7","ainame":"EXT_UED (Extension of UE delay test methods and requirements)","tdoc_agenda_sort_order":0,"status":"agreed","reservation_date":"2016-11-05 14:16:52","uploaded":"2016-11-07 07:17:26","revisionof":"S4-161347","revisedto":"","release":"","crspec":26.954,"crspecversion":"0.1.0","workitem":[{"winame":"EXT_UED"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_SA\/WG4_CODEC\/TSGS4_91\/Docs\/S4-161348.zip","group":"S4","meeting":"S4-91","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]