[{"name":"S4-160138","title":"Delay targets for EVS 13.2 CA","source":"Qualcomm Incorporated","contact":"Andre Schevciw","contact-id":44155,"tdoctype":"discussion","for":"","abstract":"","secretary_remarks":"","agenda_item_sort_order":43,"ainumber":"9.7","ainame":"Enhanced LTE UE delay test methods and requirements (E_LTE_UED)","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2016-01-19 21:35:33","uploaded":"2016-03-01 15:03:18","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_SA\/WG4_CODEC\/TSGS4_87\/Docs\/S4-160138.zip","group":"S4","meeting":"S4-87","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"S4-160139","title":"UE EVS delay and speech quality measurements with fading channel conditions","source":"Qualcomm Incorporated","contact":"Andre Schevciw","contact-id":44155,"tdoctype":"discussion","for":"","abstract":"","secretary_remarks":"","agenda_item_sort_order":43,"ainumber":"9.7","ainame":"Enhanced LTE UE delay test methods and requirements (E_LTE_UED)","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2016-01-19 21:46:02","uploaded":"2016-03-01 15:03:18","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_SA\/WG4_CODEC\/TSGS4_87\/Docs\/S4-160139.zip","group":"S4","meeting":"S4-87","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"S4-160140","title":"Issues with existing delay and loss profiles","source":"Qualcomm Incorporated","contact":"Andre Schevciw","contact-id":44155,"tdoctype":"discussion","for":"","abstract":"","secretary_remarks":"","agenda_item_sort_order":43,"ainumber":"9.7","ainame":"Enhanced LTE UE delay test methods and requirements (E_LTE_UED)","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2016-01-19 21:55:11","uploaded":"2016-03-01 15:03:18","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_SA\/WG4_CODEC\/TSGS4_87\/Docs\/S4-160140.zip","group":"S4","meeting":"S4-87","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"S4-160141","title":"UE frequency response measurements with EVS SWB","source":"Qualcomm Incorporated","contact":"Andre Schevciw","contact-id":44155,"tdoctype":"discussion","for":"","abstract":"","secretary_remarks":"","agenda_item_sort_order":43,"ainumber":"9.7","ainame":"Enhanced LTE UE delay test methods and requirements (E_LTE_UED)","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2016-01-19 22:07:59","uploaded":"2016-03-01 15:03:18","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_SA\/WG4_CODEC\/TSGS4_87\/Docs\/S4-160141.zip","group":"S4","meeting":"S4-87","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"S4-160255","title":"Pending issues within E_LTE_UED work item","source":"Qualcomm Incorporated","contact":"Paolino Usai","contact-id":3209,"tdoctype":"other","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":43,"ainumber":"9.7","ainame":"Enhanced LTE UE delay test methods and requirements (E_LTE_UED)","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2016-02-03 10:54:44","uploaded":"2016-03-01 15:03:18","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_SA\/WG4_CODEC\/TSGS4_87\/Docs\/S4-160255.zip","group":"S4","meeting":"S4-87","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]