[{"name":"RP-253313","title":"Status report for WI Perf. part: Enh. requirements and conductive test methodology for NR NTN and IoT NTN","source":"Samsung","contact":"HyunJeong Kang","contact-id":44019,"tdoctype":"WI status report","for":"","abstract":"","secretary_remarks":"FLAG D","agenda_item_sort_order":99,"ainumber":"9.5.4.7","ainame":"Perf. part: Enh. requirements and conductive test methodology for NR NTN and IoT NTN [RAN4 WI: NR_IoT_NTN_req_test_enh-Perf]","tdoc_agenda_sort_order":1000,"status":"revised","reservation_date":"2025-11-26 16:03:48","uploaded":"2025-12-01 10:23:55","revisionof":"","revisedto":"RP-253815","release":"Rel-19","crspec":"","crspecversion":"","workitem":[{"winame":"NR_IoT_NTN_req_test_enh-Perf"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/tsg_ran\/TSG_RAN\/TSGR_110\/Docs\/RP-253313.zip","group":"RP","meeting":"RP-110","year":2025,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"RP-253637","title":"RAN4 CRs to NR_IoT_NTN_req_test_enh-Perf","source":"RAN4","contact":"Kyoungseok Oh","contact-id":112391,"tdoctype":"CR pack","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":99,"ainumber":"9.5.4.7","ainame":"Perf. part: Enh. requirements and conductive test methodology for NR NTN and IoT NTN [RAN4 WI: NR_IoT_NTN_req_test_enh-Perf]","tdoc_agenda_sort_order":3400,"status":"approved","reservation_date":"2025-11-28 14:53:47","uploaded":"2025-12-03 15:15:51","revisionof":"","revisedto":"","release":"Rel-19","crspec":"","crspecversion":"","workitem":[{"winame":"NR_IoT_NTN_req_test_enh-Perf"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/tsg_ran\/TSG_RAN\/TSGR_110\/Docs\/RP-253637.zip","group":"RP","meeting":"RP-110","year":2025,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":[{"crtdoc":"R4-2520480","crwgdecision":"agreed","crtsgdecision":"approved","crspec":"38.133","crnumber":6060,"crrevision":"","crcategory":"B","crrelease":"Rel-19","crspecversion":"19.2.0","crtitle":"Big CR on RRM test cases for NTN less than 5MHz in Rel-19"}],"crsinpacknumber":1},
{"name":"RP-253815","title":"Status report for WI Perf. part: Enh. requirements and conductive test methodology for NR NTN and IoT NTN","source":"Samsung","contact":"Joern Krause","contact-id":12578,"tdoctype":"WI status report","for":"","abstract":"","secretary_remarks":"FLAG S","agenda_item_sort_order":99,"ainumber":"9.5.4.7","ainame":"Perf. part: Enh. requirements and conductive test methodology for NR NTN and IoT NTN [RAN4 WI: NR_IoT_NTN_req_test_enh-Perf]","tdoc_agenda_sort_order":1001,"status":"noted","reservation_date":"2025-12-10 14:49:13","uploaded":"2025-12-10 14:49:13","revisionof":"RP-253313","revisedto":"","release":"Rel-19","crspec":"","crspecversion":"","workitem":[{"winame":"NR_IoT_NTN_req_test_enh-Perf"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/tsg_ran\/TSG_RAN\/TSGR_110\/Docs\/RP-253815.zip","group":"RP","meeting":"RP-110","year":2025,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0}]