[{"name":"R4-2301917","title":"further discussion of UE EMC","source":"Xiaomi","contact":"Rui Zhou","contact-id":88539,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":376,"ainumber":"9.17.3","ainame":"UE EMC enhancements","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2023-02-17 13:11:18","uploaded":"2023-02-17 13:16:03","revisionof":"","revisedto":"","release":"Rel-18","crspec":"","crspecversion":"","workitem":[{"winame":"NR_LTE_EMC_enh-Core"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_106\/Docs\/R4-2301917.zip","group":"R4","meeting":"R4-106","year":2023,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2302465","title":"Discussion on the EMC testing enhancements for UE","source":"Huawei, HiSilicon","contact":"Michal Szydelko","contact-id":65553,"tdoctype":"discussion","for":"Discussion","abstract":"In this contribution we provide our views and propose solutions to progress with the potential UE EMC testing simplifications.","secretary_remarks":"","agenda_item_sort_order":376,"ainumber":"9.17.3","ainame":"UE EMC enhancements","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2023-02-17 17:02:32","uploaded":"2023-02-17 18:01:56","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"NR_LTE_EMC_enh-Core"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_106\/Docs\/R4-2302465.zip","group":"R4","meeting":"R4-106","year":2023,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0}]