[{"name":"R4-2208252","title":"General consideration on conductive conformance testing for SAN","source":"CATT","contact":"Yuexia Song","contact-id":34261,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"[103-e][309] NTN_Solutions_RFConformance","agenda_item_sort_order":312,"ainumber":"9.12.4.2","ainame":"Conductive conformance Testing","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2022-04-24 10:45:38","uploaded":"2022-04-25 17:32:02","revisionof":"","revisedto":"","release":"Rel-17","crspec":"","crspecversion":"","workitem":[{"winame":"NR_NTN_solutions-Perf"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_103-e\/Docs\/R4-2208252.zip","group":"R4","meeting":"R4-103-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2209594","title":"Initial discussion on SAN conformance testing: conducted part","source":"ZTE Corporation","contact":"Fei Xue","contact-id":59676,"tdoctype":"other","for":"Approval","abstract":"","secretary_remarks":"[103-e][309] NTN_Solutions_RFConformance","agenda_item_sort_order":312,"ainumber":"9.12.4.2","ainame":"Conductive conformance Testing","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2022-04-25 15:11:15","uploaded":"2022-04-25 16:08:05","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_103-e\/Docs\/R4-2209594.zip","group":"R4","meeting":"R4-103-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2210035","title":"Initial considerations on SAN conformance testing - conducted requirements","source":"Ericsson","contact":"Aurelian Bria","contact-id":40914,"tdoctype":"discussion","for":"Discussion","abstract":"Several initial observations and proposals for SAN conformance testing","secretary_remarks":"[103-e][309] NTN_Solutions_RFConformance","agenda_item_sort_order":312,"ainumber":"9.12.4.2","ainame":"Conductive conformance Testing","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2022-04-25 18:54:21","uploaded":"2022-04-25 22:05:15","revisionof":"","revisedto":"","release":"Rel-17","crspec":"","crspecversion":"","workitem":[{"winame":"NR_NTN_solutions-Perf"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_103-e\/Docs\/R4-2210035.zip","group":"R4","meeting":"R4-103-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]