[{"name":"R4-2104522","title":"Discussions on test procedure of FR2 enhanced test methods","source":"vivo","contact":"Ruixin Wang","contact-id":88368,"tdoctype":"discussion","for":"Approval","abstract":"","secretary_remarks":"[98bis-e][327] FR2_enhTestMethods","agenda_item_sort_order":525,"ainumber":"9.1.2","ainame":"Test methodology for high DL power and low UL power test cases","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2021-03-31 23:59:47","uploaded":"2021-04-02 15:27:38","revisionof":"","revisedto":"","release":"Rel-17","crspec":"","crspecversion":"","workitem":[{"winame":"FS_FR2_enhTestMethods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_98bis_e\/Docs\/R4-2104522.zip","group":"R4","meeting":"R4-98-bis-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2104684","title":"On black box test","source":"Huawei Tech.(UK) Co.. Ltd","contact":"Hai Zhou","contact-id":63180,"tdoctype":"discussion","for":"Discussion","abstract":"This contribution highlights the possibility to determine device antenna positions using a commercially available scanning method to enable white box tests with the aim to reduce uplink pathloss.","secretary_remarks":"[98bis-e][327] FR2_enhTestMethods","agenda_item_sort_order":525,"ainumber":"9.1.2","ainame":"Test methodology for high DL power and low UL power test cases","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2021-04-01 13:33:54","uploaded":"2021-04-01 13:54:13","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"FS_FR2_enhTestMethods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_98bis_e\/Docs\/R4-2104684.zip","group":"R4","meeting":"R4-98-bis-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2106130","title":"On CFFNF and CFFDNF test methodologies for high DL power and low UL power test cases","source":"Keysight Technologies UK Ltd","contact":"Thorsten Hertel","contact-id":77978,"tdoctype":"other","for":"Approval","abstract":"","secretary_remarks":"[98bis-e][327] FR2_enhTestMethods","agenda_item_sort_order":525,"ainumber":"9.1.2","ainame":"Test methodology for high DL power and low UL power test cases","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2021-04-02 08:14:01","uploaded":"2021-04-21 06:31:54","revisionof":"R4-2107130","revisedto":"","release":"Rel-17","crspec":"","crspecversion":"","workitem":[{"winame":"FS_FR2_enhTestMethods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_98bis_e\/Docs\/R4-2106130.zip","group":"R4","meeting":"R4-98-bis-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2106695","title":"DNF Method \u2013 EIRP and TRP accuracy","source":"MVG Industries, Sony","contact":"Alessandro Scannavini","contact-id":52688,"tdoctype":"other","for":"Approval","abstract":"During RAN4#e-98, a WF was agreed [1] for enhanced test methods for NR FR2. Specifically, \u201cThe applicability of the low UL power\/high DL power EIRP\/EIS test cases in the known BP direction and with the black&white-box approach is FFS\u201d. This contribution aims to address this open issue by showing EIRP and TRP error in the BP direction between NF and FF when using black&white box approach.","secretary_remarks":"[98bis-e][327] FR2_enhTestMethods","agenda_item_sort_order":525,"ainumber":"9.1.2","ainame":"Test methodology for high DL power and low UL power test cases","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2021-04-02 12:51:28","uploaded":"2021-04-02 21:27:12","revisionof":"","revisedto":"","release":"Rel-17","crspec":"","crspecversion":"","workitem":[{"winame":"FS_NR_test_methods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_98bis_e\/Docs\/R4-2106695.zip","group":"R4","meeting":"R4-98-bis-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2107130","title":"On CFFNF and CFFDNF test methodologies for high DL power and low UL power test cases","source":"Keysight Technologies UK Ltd","contact":"Thorsten Hertel","contact-id":77978,"tdoctype":"other","for":"Approval","abstract":"","secretary_remarks":"[98bis-e][327] FR2_enhTestMethods","agenda_item_sort_order":525,"ainumber":"9.1.2","ainame":"Test methodology for high DL power and low UL power test cases","tdoc_agenda_sort_order":0,"status":"revised","reservation_date":"2021-04-02 16:58:37","uploaded":"2021-04-02 22:19:08","revisionof":"","revisedto":"R4-2106130","release":"Rel-17","crspec":"","crspecversion":"","workitem":[{"winame":"FS_FR2_enhTestMethods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_98bis_e\/Docs\/R4-2107130.zip","group":"R4","meeting":"R4-98-bis-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2107187","title":"Analysis of NF based solutions","source":"ROHDE & SCHWARZ","contact":"Jose M. Fortes Lopez","contact-id":78787,"tdoctype":"discussion","for":"Approval","abstract":"","secretary_remarks":"[98bis-e][327] FR2_enhTestMethods","agenda_item_sort_order":525,"ainumber":"9.1.2","ainame":"Test methodology for high DL power and low UL power test cases","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2021-04-02 17:17:58","uploaded":"2021-04-02 22:53:44","revisionof":"","revisedto":"","release":"Rel-17","crspec":"38.884","crspecversion":"","workitem":[{"winame":"FS_FR2_enhTestMethods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_98bis_e\/Docs\/R4-2107187.zip","group":"R4","meeting":"R4-98-bis-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]