[{"name":"R4-2309244","title":"Discussion on demodulation test method for FR2 multi-Rx UE","source":"Qualcomm Incorporated","contact":"Bin Han","contact-id":75122,"tdoctype":"other","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":235,"ainumber":"8.3.4","ainame":"Test methods for Demodulation requirements","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2023-05-15 14:52:11","uploaded":"2023-05-15 22:42:03","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_107\/Docs\/R4-2309244.zip","group":"R4","meeting":"R4-107","year":2023,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2309307","title":"Discussion on Test methods for demod requirements","source":"Huawei,HiSilicon","contact":"Lingyu Kong","contact-id":90594,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":235,"ainumber":"8.3.4","ainame":"Test methods for Demodulation requirements","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2023-05-15 15:27:38","uploaded":"2023-05-15 15:39:50","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"FS_NR_FR2_OTA_enh"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_107\/Docs\/R4-2309307.zip","group":"R4","meeting":"R4-107","year":2023,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0}]