[{"name":"R4-2307933","title":"On measurement grid for multi-RX DL 2AoA spherical coverage","source":"Samsung","contact":"Bozhi Li","contact-id":96503,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":233,"ainumber":"8.3.2","ainame":"Test methods for RF requirements","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2023-05-15 08:39:12","uploaded":"2023-05-15 09:55:42","revisionof":"","revisedto":"","release":"Rel-18","crspec":"","crspecversion":"","workitem":[{"winame":"FS_NR_FR2_OTA_enh"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_107\/Docs\/R4-2307933.zip","group":"R4","meeting":"R4-107","year":2023,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2308235","title":"Discussion on FR2 OTA test method","source":"vivo","contact":"Ruixin Wang","contact-id":104883,"tdoctype":"other","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":233,"ainumber":"8.3.2","ainame":"Test methods for RF requirements","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2023-05-15 09:52:04","uploaded":"2023-05-15 17:06:51","revisionof":"","revisedto":"","release":"Rel-18","crspec":"","crspecversion":"","workitem":[{"winame":"FS_NR_FR2_OTA_enh"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_107\/Docs\/R4-2308235.zip","group":"R4","meeting":"R4-107","year":2023,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2308980","title":"On representing the test point on measurement grid","source":"OPPO","contact":"Jinqiang Xing","contact-id":104933,"tdoctype":"other","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":233,"ainumber":"8.3.2","ainame":"Test methods for RF requirements","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2023-05-15 12:56:15","uploaded":"2023-05-15 13:25:16","revisionof":"","revisedto":"","release":"Rel-18","crspec":"","crspecversion":"","workitem":[{"winame":"FS_NR_FR2_OTA_enh"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_107\/Docs\/R4-2308980.zip","group":"R4","meeting":"R4-107","year":2023,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2309300","title":"Discussion on Test methods for RF requirements","source":"Huawei,HiSilicon","contact":"Lingyu Kong","contact-id":90594,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":233,"ainumber":"8.3.2","ainame":"Test methods for RF requirements","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2023-05-15 15:27:36","uploaded":"2023-05-15 15:39:50","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"FS_NR_FR2_OTA_enh"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_107\/Docs\/R4-2309300.zip","group":"R4","meeting":"R4-107","year":2023,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2309435","title":"Test procedure for Multi-Rx spherical coverage","source":"Rohde & Schwarz","contact":"Jose M. Fortes Lopez","contact-id":78787,"tdoctype":"other","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":233,"ainumber":"8.3.2","ainame":"Test methods for RF requirements","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2023-05-15 17:03:55","uploaded":"2023-05-15 17:06:35","revisionof":"","revisedto":"","release":"Rel-18","crspec":"38.871","crspecversion":"","workitem":[{"winame":"FS_NR_FR2_OTA_enh"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_107\/Docs\/R4-2309435.zip","group":"R4","meeting":"R4-107","year":2023,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2309469","title":"On Absolute Probe Locations for Multi-Rx Testing","source":"Keysight Technologies UK Ltd","contact":"Thorsten Hertel","contact-id":77978,"tdoctype":"other","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":233,"ainumber":"8.3.2","ainame":"Test methods for RF requirements","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2023-05-15 17:53:53","uploaded":"2023-05-15 22:15:11","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"FS_NR_FR2_OTA_enh"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_107\/Docs\/R4-2309469.zip","group":"R4","meeting":"R4-107","year":2023,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0}]