[{"name":"R4-1609479","title":"Discussion on maximum sidelink processes test for V2V","source":"Huawei, HiSilicon","contact":"Xiang (Steven) Chen","contact-id":41576,"tdoctype":"discussion","for":"Discussion","abstract":"In this contribution, we will discussion  maximum sidelink processes test for V2V.","secretary_remarks":"","agenda_item_sort_order":271,"ainumber":"8.19.4.3","ainame":"Maximum process test [LTE_SL_V2V-Perf]","tdoc_agenda_sort_order":976300000,"status":"noted","reservation_date":"2016-11-03 14:56:38","uploaded":"2016-11-07 11:32:15","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"LTE_SL_V2V-Perf"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_81\/Docs\/R4-1609479.zip","group":"R4","meeting":"R4-81","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1609763","title":"Discussion about maximum process tests for Rel-14 V2V","source":"LG Electronics Inc.","contact":"Jin-yup Hwang","contact-id":47026,"tdoctype":"discussion","for":"Discussion","abstract":"---","secretary_remarks":"","agenda_item_sort_order":271,"ainumber":"8.19.4.3","ainame":"Maximum process test [LTE_SL_V2V-Perf]","tdoc_agenda_sort_order":947900000,"status":"noted","reservation_date":"2016-11-04 04:43:33","uploaded":"2016-11-04 09:00:29","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_81\/Docs\/R4-1609763.zip","group":"R4","meeting":"R4-81","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]