[{"name":"R4-1704777","title":"Test case design for CSI-RS enhancement","source":"Samsung","contact":"Haijie Qiu","contact-id":46265,"tdoctype":"discussion","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":287,"ainumber":"7.28.2.5","ainame":"CRI-RS Enhancement [LTE_eFDMIMO-Perf]","tdoc_agenda_sort_order":575100,"status":"noted","reservation_date":"2017-05-04 08:36:51","uploaded":"2017-05-05 17:57:51","revisionof":"","revisedto":"","release":"Rel-14","crspec":"","crspecversion":"","workitem":[{"winame":"LTE_eFDMIMO-Perf"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_83\/Docs\/R4-1704777.zip","group":"R4","meeting":"R4-83","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1705751","title":"Discussion on test configuration for Class B eFD-MIMO enhancement","source":"Qualcomm Incorporated","contact":"Kyoungseok Oh","contact-id":66120,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":287,"ainumber":"7.28.2.5","ainame":"CRI-RS Enhancement [LTE_eFDMIMO-Perf]","tdoc_agenda_sort_order":47770,"status":"noted","reservation_date":"2017-05-08 10:25:59","uploaded":"2017-05-08 10:27:53","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"LTE_eFDMIMO-Perf"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_83\/Docs\/R4-1705751.zip","group":"R4","meeting":"R4-83","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]