[{"name":"R4-1704715","title":"CR on reduced MGL test case for FDD-FDD","source":"Intel Corporation","contact":"Yang Tang","contact-id":56725,"tdoctype":"CR","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":272,"ainumber":"7.26.3","ainame":"RRM performance (36.133) [LTE_meas_gap_enh-Perf]","tdoc_agenda_sort_order":47840,"status":"revised","reservation_date":"2017-05-03 23:04:49","uploaded":"2017-05-06 17:38:10","revisionof":"","revisedto":"R4-1705953","release":"Rel-14","crspec":"36.133","crspecversion":"14.3.0","workitem":[{"winame":"LTE_meas_gap_enh-Perf"}],"crnumber":4853.0,"crrevision":"","crcategory":"B","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_83\/Docs\/R4-1704715.zip","group":"R4","meeting":"R4-83","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1704716","title":"CR on reduced MGL test case for TDD-TDD","source":"Intel Corporation","contact":"Yang Tang","contact-id":56725,"tdoctype":"CR","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":272,"ainumber":"7.26.3","ainame":"RRM performance (36.133) [LTE_meas_gap_enh-Perf]","tdoc_agenda_sort_order":574600,"status":"revised","reservation_date":"2017-05-03 23:04:50","uploaded":"2017-05-06 17:38:10","revisionof":"","revisedto":"R4-1705954","release":"Rel-14","crspec":"36.133","crspecversion":"14.3.0","workitem":[{"winame":"LTE_meas_gap_enh-Perf"}],"crnumber":4854.0,"crrevision":"","crcategory":"B","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_83\/Docs\/R4-1704716.zip","group":"R4","meeting":"R4-83","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1704717","title":"CR on per-CC measurement gap for FDD-FDD inter-frequency measurements","source":"Intel Corporation","contact":"Yang Tang","contact-id":56725,"tdoctype":"CR","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":272,"ainumber":"7.26.3","ainame":"RRM performance (36.133) [LTE_meas_gap_enh-Perf]","tdoc_agenda_sort_order":575300,"status":"noted","reservation_date":"2017-05-03 23:04:51","uploaded":"2017-05-06 17:38:10","revisionof":"","revisedto":"","release":"Rel-14","crspec":"36.133","crspecversion":"14.3.0","workitem":[{"winame":"LTE_meas_gap_enh-Perf"}],"crnumber":4855.0,"crrevision":"","crcategory":"B","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_83\/Docs\/R4-1704717.zip","group":"R4","meeting":"R4-83","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1704718","title":"CR  on NCSG for FDD-FDD inter-frequency measurements","source":"Intel Corporation","contact":"Yang Tang","contact-id":56725,"tdoctype":"CR","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":272,"ainumber":"7.26.3","ainame":"RRM performance (36.133) [LTE_meas_gap_enh-Perf]","tdoc_agenda_sort_order":47190,"status":"noted","reservation_date":"2017-05-03 23:04:51","uploaded":"2017-05-06 17:38:10","revisionof":"","revisedto":"","release":"Rel-14","crspec":"36.133","crspecversion":"14.3.0","workitem":[{"winame":"LTE_meas_gap_enh-Perf"}],"crnumber":4856.0,"crrevision":"","crcategory":"B","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_83\/Docs\/R4-1704718.zip","group":"R4","meeting":"R4-83","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1704719","title":"CR on per-CC measurement gap for TDD-TDD inter-frequency measurements","source":"Intel Corporation","contact":"Yang Tang","contact-id":56725,"tdoctype":"CR","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":272,"ainumber":"7.26.3","ainame":"RRM performance (36.133) [LTE_meas_gap_enh-Perf]","tdoc_agenda_sort_order":575400,"status":"noted","reservation_date":"2017-05-03 23:04:52","uploaded":"2017-05-06 17:38:10","revisionof":"","revisedto":"","release":"Rel-14","crspec":"36.133","crspecversion":"14.3.0","workitem":[{"winame":"LTE_meas_gap_enh-Perf"}],"crnumber":4857.0,"crrevision":"","crcategory":"B","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_83\/Docs\/R4-1704719.zip","group":"R4","meeting":"R4-83","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1704720","title":"CR  on NCSG for TDD-TDD inter-frequency measurements","source":"Intel Corporation","contact":"Yang Tang","contact-id":56725,"tdoctype":"CR","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":272,"ainumber":"7.26.3","ainame":"RRM performance (36.133) [LTE_meas_gap_enh-Perf]","tdoc_agenda_sort_order":47200,"status":"noted","reservation_date":"2017-05-03 23:04:53","uploaded":"2017-05-06 17:38:10","revisionof":"","revisedto":"","release":"Rel-14","crspec":"36.133","crspecversion":"14.3.0","workitem":[{"winame":"LTE_meas_gap_enh-Perf"}],"crnumber":4858.0,"crrevision":"","crcategory":"B","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_83\/Docs\/R4-1704720.zip","group":"R4","meeting":"R4-83","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1704784","title":"Discussion on eGAP RRM tests","source":"Ericsson","contact":"Christopher Callender","contact-id":58614,"tdoctype":"discussion","for":"Discussion","abstract":"Consideration on feasibility of per CC and parallel measurement for gap enhancement","secretary_remarks":"","agenda_item_sort_order":272,"ainumber":"7.26.3","ainame":"RRM performance (36.133) [LTE_meas_gap_enh-Perf]","tdoc_agenda_sort_order":574800,"status":"noted","reservation_date":"2017-05-04 09:48:03","uploaded":"2017-05-05 16:51:24","revisionof":"","revisedto":"","release":"Rel-14","crspec":"","crspecversion":"","workitem":[{"winame":"LTE_meas_gap_enh-Perf"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_83\/Docs\/R4-1704784.zip","group":"R4","meeting":"R4-83","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1705746","title":"Test Configuration for Burst Gap","source":"Qualcomm Incorporated","contact":"Kyoungseok Oh","contact-id":66120,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":272,"ainumber":"7.26.3","ainame":"RRM performance (36.133) [LTE_meas_gap_enh-Perf]","tdoc_agenda_sort_order":47150,"status":"noted","reservation_date":"2017-05-08 10:25:57","uploaded":"2017-05-08 10:27:53","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"LTE_meas_gap_enh-Perf"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_83\/Docs\/R4-1705746.zip","group":"R4","meeting":"R4-83","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1705748","title":"Test Configuration for NCSG","source":"Qualcomm Incorporated","contact":"Kyoungseok Oh","contact-id":66120,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":272,"ainumber":"7.26.3","ainame":"RRM performance (36.133) [LTE_meas_gap_enh-Perf]","tdoc_agenda_sort_order":47170,"status":"noted","reservation_date":"2017-05-08 10:25:58","uploaded":"2017-05-08 10:27:53","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"LTE_meas_gap_enh-Perf"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_83\/Docs\/R4-1705748.zip","group":"R4","meeting":"R4-83","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1705753","title":"Introduction of test case for Burst gap","source":"Qualcomm Incorporated","contact":"Kyoungseok Oh","contact-id":66120,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":272,"ainumber":"7.26.3","ainame":"RRM performance (36.133) [LTE_meas_gap_enh-Perf]","tdoc_agenda_sort_order":47160,"status":"revised","reservation_date":"2017-05-08 10:25:59","uploaded":"2017-05-08 10:27:53","revisionof":"","revisedto":"R4-1706171","release":"Rel-14","crspec":"36.133","crspecversion":"14.3.0","workitem":[{"winame":"LTE_meas_gap_enh-Perf"}],"crnumber":4997.0,"crrevision":"","crcategory":"B","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_83\/Docs\/R4-1705753.zip","group":"R4","meeting":"R4-83","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1705754","title":"Introduction of test case for NCSG","source":"Qualcomm Incorporated","contact":"Kyoungseok Oh","contact-id":66120,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":272,"ainumber":"7.26.3","ainame":"RRM performance (36.133) [LTE_meas_gap_enh-Perf]","tdoc_agenda_sort_order":47180,"status":"revised","reservation_date":"2017-05-08 10:26:04","uploaded":"2017-05-08 10:27:53","revisionof":"","revisedto":"R4-1706170","release":"Rel-14","crspec":"36.133","crspecversion":"14.3.0","workitem":[{"winame":"LTE_meas_gap_enh-Perf"}],"crnumber":4998.0,"crrevision":"","crcategory":"B","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_83\/Docs\/R4-1705754.zip","group":"R4","meeting":"R4-83","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1705953","title":"E-UTRAN FDD-FDD Inter-frequency event triggered reporting with MGL=3ms under fading propagation conditions in synchronous cells","source":"Intel Corporation","contact":"Kyoungseok Oh","contact-id":66120,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":272,"ainumber":"7.26.3","ainame":"RRM performance (36.133) [LTE_meas_gap_enh-Perf]","tdoc_agenda_sort_order":47841,"status":"agreed","reservation_date":"2017-05-24 17:14:43","uploaded":"2017-05-24 17:17:51","revisionof":"R4-1704715","revisedto":"","release":"Rel-14","crspec":"36.133","crspecversion":"14.3.0","workitem":[{"winame":"LTE_meas_gap_enh-Core"}],"crnumber":4853.0,"crrevision":1.0,"crcategory":"B","tsg_crp":"RP-171264","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_83\/Docs\/R4-1705953.zip","group":"R4","meeting":"R4-83","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1705954","title":"E-UTRAN TDD-TDD Inter-frequency event triggered reporting with MGL=3ms under fading propagation conditions in synchronous cells","source":"Intel Corporation","contact":"Kyoungseok Oh","contact-id":66120,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":272,"ainumber":"7.26.3","ainame":"RRM performance (36.133) [LTE_meas_gap_enh-Perf]","tdoc_agenda_sort_order":574601,"status":"agreed","reservation_date":"2017-05-24 17:14:44","uploaded":"2017-05-24 17:17:51","revisionof":"R4-1704716","revisedto":"","release":"Rel-14","crspec":"36.133","crspecversion":"14.3.0","workitem":[{"winame":"LTE_meas_gap_enh-Core"}],"crnumber":4854.0,"crrevision":1.0,"crcategory":"B","tsg_crp":"RP-171264","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_83\/Docs\/R4-1705954.zip","group":"R4","meeting":"R4-83","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1706170","title":"Introduction of test cases for NCSG","source":"Qualcomm Incorporated","contact":"Kyoungseok Oh","contact-id":66120,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":272,"ainumber":"7.26.3","ainame":"RRM performance (36.133) [LTE_meas_gap_enh-Perf]","tdoc_agenda_sort_order":47181,"status":"agreed","reservation_date":"2017-05-24 17:17:36","uploaded":"2017-05-24 17:17:52","revisionof":"R4-1705754","revisedto":"","release":"Rel-14","crspec":"36.133","crspecversion":"14.3.0","workitem":[{"winame":"LTE_meas_gap_enh-Perf"}],"crnumber":4998.0,"crrevision":1.0,"crcategory":"B","tsg_crp":"RP-171264","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_83\/Docs\/R4-1706170.zip","group":"R4","meeting":"R4-83","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1706171","title":"Introduction of test cases for burst gap","source":"Qualcomm Incorporated","contact":"Kyoungseok Oh","contact-id":66120,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":272,"ainumber":"7.26.3","ainame":"RRM performance (36.133) [LTE_meas_gap_enh-Perf]","tdoc_agenda_sort_order":47161,"status":"agreed","reservation_date":"2017-05-24 17:17:38","uploaded":"2017-05-24 17:17:52","revisionof":"R4-1705753","revisedto":"","release":"Rel-14","crspec":"36.133","crspecversion":"14.3.0","workitem":[{"winame":"LTE_meas_gap_enh-Perf"}],"crnumber":4997.0,"crrevision":1.0,"crcategory":"B","tsg_crp":"RP-171264","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_83\/Docs\/R4-1706171.zip","group":"R4","meeting":"R4-83","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]