[{"name":"R4-2500160","title":"Further consideration on UE RF testability issues for Rel-19 LP-WUS","source":"Huawei, HiSilicon","contact":"Ye Liu","contact-id":57639,"tdoctype":"other","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":411,"ainumber":"7.26.2.4","ainame":"Testability for UE RF requirements","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2025-02-05 02:11:06","uploaded":"2025-02-07 12:35:12","revisionof":"","revisedto":"","release":"Rel-19","crspec":"","crspecversion":"","workitem":[{"winame":"NR_LPWUS-Core"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG4_Radio\/TSGR4_114\/Docs\/R4-2500160.zip","group":"R4","meeting":"R4-114","year":2025,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2500504","title":"Discussion on testability for LP-WUR","source":"Samsung","contact":"Bozhi Li","contact-id":96503,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":411,"ainumber":"7.26.2.4","ainame":"Testability for UE RF requirements","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2025-02-06 23:03:19","uploaded":"2025-02-06 23:53:50","revisionof":"","revisedto":"","release":"Rel-19","crspec":"","crspecversion":"","workitem":[{"winame":"NR_LPWUS-Core"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG4_Radio\/TSGR4_114\/Docs\/R4-2500504.zip","group":"R4","meeting":"R4-114","year":2025,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2500554","title":"Discussion on testability of LP-WUR","source":"ZTE Corporation, Sanechips","contact":"Ke Liu","contact-id":101690,"tdoctype":"other","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":411,"ainumber":"7.26.2.4","ainame":"Testability for UE RF requirements","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2025-02-07 01:21:16","uploaded":"2025-02-07 09:12:27","revisionof":"","revisedto":"","release":"Rel-19","crspec":"","crspecversion":"","workitem":[{"winame":"NR_LPWUS-Core"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG4_Radio\/TSGR4_114\/Docs\/R4-2500554.zip","group":"R4","meeting":"R4-114","year":2025,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2500759","title":"Discussions on LP-WUS Testability","source":"vivo","contact":"Ruixin Wang","contact-id":104883,"tdoctype":"other","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":411,"ainumber":"7.26.2.4","ainame":"Testability for UE RF requirements","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2025-02-07 04:19:06","uploaded":"2025-02-07 17:38:52","revisionof":"","revisedto":"","release":"Rel-19","crspec":"","crspecversion":"","workitem":[{"winame":"NR_LPWUS-Core"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG4_Radio\/TSGR4_114\/Docs\/R4-2500759.zip","group":"R4","meeting":"R4-114","year":2025,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2501074","title":"Further discussion on Testability for UE RF requirements for LP-WUS","source":"CATT","contact":"Aijun Cao","contact-id":105513,"tdoctype":"other","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":411,"ainumber":"7.26.2.4","ainame":"Testability for UE RF requirements","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2025-02-07 07:36:58","uploaded":"2025-02-07 14:41:38","revisionof":"","revisedto":"","release":"Rel-19","crspec":"","crspecversion":"","workitem":[{"winame":"NR_LPWUS-Core"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG4_Radio\/TSGR4_114\/Docs\/R4-2501074.zip","group":"R4","meeting":"R4-114","year":2025,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2501380","title":"Testability aspects of LP-WUR","source":"Nokia","contact":"alok Sethi","contact-id":98977,"tdoctype":"other","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":411,"ainumber":"7.26.2.4","ainame":"Testability for UE RF requirements","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2025-02-07 09:42:32","uploaded":"2025-02-07 15:52:36","revisionof":"","revisedto":"","release":"Rel-19","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG4_Radio\/TSGR4_114\/Docs\/R4-2501380.zip","group":"R4","meeting":"R4-114","year":2025,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2502095","title":"On WUR RF requirement testability","source":"Ericsson","contact":"Chunhui Zhang","contact-id":78832,"tdoctype":"other","for":"Approval","abstract":"In this paper, we present our overview on the WUR RF requirement testability issue","secretary_remarks":"","agenda_item_sort_order":411,"ainumber":"7.26.2.4","ainame":"Testability for UE RF requirements","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2025-02-07 18:19:08","uploaded":"2025-02-07 19:17:11","revisionof":"","revisedto":"","release":"Rel-19","crspec":"","crspecversion":"","workitem":[{"winame":"NR_LPWUS-Core"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG4_Radio\/TSGR4_114\/Docs\/R4-2502095.zip","group":"R4","meeting":"R4-114","year":2025,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2503171","title":"On test method for UE RF requirements for the LPWUR","source":"Qualcomm Incorporated","contact":"Sumant Iyer","contact-id":75048,"tdoctype":"other","for":"Approval","abstract":"A test method without specifying a test mode is preferred","secretary_remarks":"","agenda_item_sort_order":290,"ainumber":"7.26.2.4","ainame":"Testability for UE RF requirements","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2025-03-25 18:28:31","uploaded":"2025-03-28 20:56:18","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG4_Radio\/TSGR4_114bis\/Docs\/R4-2503171.zip","group":"R4","meeting":"R4-114-bis","year":2025,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2503486","title":"Further discussion on Testability for UE RF requirements for LP-WUS","source":"CATT","contact":"Aijun Cao","contact-id":105513,"tdoctype":"other","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":290,"ainumber":"7.26.2.4","ainame":"Testability for UE RF requirements","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2025-03-27 14:06:58","uploaded":"2025-03-28 13:31:53","revisionof":"","revisedto":"","release":"Rel-19","crspec":"","crspecversion":"","workitem":[{"winame":"NR_LPWUS-Core"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG4_Radio\/TSGR4_114bis\/Docs\/R4-2503486.zip","group":"R4","meeting":"R4-114-bis","year":2025,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2503640","title":"Discussion on testability of LP-WUR","source":"ZTE Corporation, Sanechips","contact":"Ke Liu","contact-id":101690,"tdoctype":"other","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":290,"ainumber":"7.26.2.4","ainame":"Testability for UE RF requirements","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2025-03-28 02:30:00","uploaded":"2025-03-28 09:20:14","revisionof":"","revisedto":"","release":"Rel-19","crspec":"","crspecversion":"","workitem":[{"winame":"NR_LPWUS-Core"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG4_Radio\/TSGR4_114bis\/Docs\/R4-2503640.zip","group":"R4","meeting":"R4-114-bis","year":2025,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2503649","title":"Discussion on testability for LP-WUR","source":"Samsung","contact":"Bozhi Li","contact-id":96503,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":290,"ainumber":"7.26.2.4","ainame":"Testability for UE RF requirements","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2025-03-28 02:44:26","uploaded":"2025-03-28 12:35:05","revisionof":"","revisedto":"","release":"Rel-19","crspec":"","crspecversion":"","workitem":[{"winame":"NR_LPWUS-Core"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG4_Radio\/TSGR4_114bis\/Docs\/R4-2503649.zip","group":"R4","meeting":"R4-114-bis","year":2025,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2503807","title":"Further consideration on UE RF testability issues for Rel-19 LP-WUS","source":"Huawei, HiSilicon","contact":"Ye Liu","contact-id":57639,"tdoctype":"other","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":290,"ainumber":"7.26.2.4","ainame":"Testability for UE RF requirements","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2025-03-28 07:38:21","uploaded":"2025-03-28 13:33:59","revisionof":"","revisedto":"","release":"Rel-19","crspec":"","crspecversion":"","workitem":[{"winame":"NR_LPWUS-Core"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG4_Radio\/TSGR4_114bis\/Docs\/R4-2503807.zip","group":"R4","meeting":"R4-114-bis","year":2025,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2504395","title":"On WUR RF requirement testability","source":"Ericsson","contact":"Chunhui Zhang","contact-id":78832,"tdoctype":"other","for":"Approval","abstract":"In this paper, we present our overview on the WUR RF requirement testability issue","secretary_remarks":"","agenda_item_sort_order":290,"ainumber":"7.26.2.4","ainame":"Testability for UE RF requirements","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2025-03-28 14:30:31","uploaded":"2025-03-28 18:00:58","revisionof":"","revisedto":"","release":"Rel-19","crspec":"","crspecversion":"","workitem":[{"winame":"NR_LPWUS-Core"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG4_Radio\/TSGR4_114bis\/Docs\/R4-2504395.zip","group":"R4","meeting":"R4-114-bis","year":2025,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2504416","title":"Testability aspects of LP-WUR","source":"Nokia","contact":"alok Sethi","contact-id":98977,"tdoctype":"other","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":290,"ainumber":"7.26.2.4","ainame":"Testability for UE RF requirements","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2025-03-28 14:57:41","uploaded":"2025-03-28 16:24:25","revisionof":"","revisedto":"","release":"Rel-19","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG4_Radio\/TSGR4_114bis\/Docs\/R4-2504416.zip","group":"R4","meeting":"R4-114-bis","year":2025,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0}]