[{"name":"R4-2417631","title":"On test method for LPWUS","source":"Qualcomm Incorporated","contact":"Sumant Iyer","contact-id":75048,"tdoctype":"other","for":"Discussion","abstract":"Test method must be able to tell  false alarms","secretary_remarks":"","agenda_item_sort_order":409,"ainumber":"7.23.2.4","ainame":"Testability for UE RF requirements","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2024-06-11 02:43:28","uploaded":"2024-11-08 16:11:41","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_113\/Docs\/R4-2417631.zip","group":"R4","meeting":"R4-113","year":2024,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2417866","title":"Further discussion on Testability for UE RF requirements for LP-WUS","source":"CATT","contact":"Aijun Cao","contact-id":105513,"tdoctype":"other","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":409,"ainumber":"7.23.2.4","ainame":"Testability for UE RF requirements","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2024-07-11 07:53:25","uploaded":"2024-11-08 15:13:46","revisionof":"","revisedto":"","release":"Rel-19","crspec":"","crspecversion":"","workitem":[{"winame":"NR_LPWUS-Core"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_113\/Docs\/R4-2417866.zip","group":"R4","meeting":"R4-113","year":2024,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2417888","title":"Further consideration on UE RF testability issues for Rel-19 LP-WUS","source":"Huawei, HiSilicon","contact":"Ye Liu","contact-id":57639,"tdoctype":"other","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":409,"ainumber":"7.23.2.4","ainame":"Testability for UE RF requirements","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2024-07-11 07:54:27","uploaded":"2024-11-08 16:36:21","revisionof":"","revisedto":"","release":"Rel-19","crspec":"","crspecversion":"","workitem":[{"winame":"NR_LPWUS-Core"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_113\/Docs\/R4-2417888.zip","group":"R4","meeting":"R4-113","year":2024,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2418218","title":"Discussions on LP-WUS Testability","source":"vivo","contact":"Ruixin Wang","contact-id":104883,"tdoctype":"other","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":409,"ainumber":"7.23.2.4","ainame":"Testability for UE RF requirements","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2024-08-11 04:36:23","uploaded":"2024-11-08 16:08:42","revisionof":"","revisedto":"","release":"Rel-19","crspec":"","crspecversion":"","workitem":[{"winame":"NR_LPWUS-Core"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_113\/Docs\/R4-2418218.zip","group":"R4","meeting":"R4-113","year":2024,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2418339","title":"Discussion on testability for LP-WUR","source":"Samsung","contact":"Bozhi Li","contact-id":96503,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":409,"ainumber":"7.23.2.4","ainame":"Testability for UE RF requirements","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2024-08-11 06:03:02","uploaded":"2024-11-08 10:30:19","revisionof":"","revisedto":"","release":"Rel-19","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_113\/Docs\/R4-2418339.zip","group":"R4","meeting":"R4-113","year":2024,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2418830","title":"Discussion on testability of LP-WUR","source":"ZTE Corporation, Sanechips","contact":"Ke Liu","contact-id":101690,"tdoctype":"other","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":409,"ainumber":"7.23.2.4","ainame":"Testability for UE RF requirements","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2024-08-11 09:15:33","uploaded":"2024-11-08 13:17:56","revisionof":"","revisedto":"","release":"Rel-19","crspec":"","crspecversion":"","workitem":[{"winame":"NR_LPWUS-Core"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_113\/Docs\/R4-2418830.zip","group":"R4","meeting":"R4-113","year":2024,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2418984","title":"Testability aspects of LP-WUR","source":"Nokia","contact":"alok Sethi","contact-id":98977,"tdoctype":"other","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":409,"ainumber":"7.23.2.4","ainame":"Testability for UE RF requirements","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2024-08-11 10:59:48","uploaded":"2024-11-08 17:04:22","revisionof":"","revisedto":"","release":"Rel-19","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_113\/Docs\/R4-2418984.zip","group":"R4","meeting":"R4-113","year":2024,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2419485","title":"On WUR RF requirement testability","source":"Ericsson","contact":"Chunhui Zhang","contact-id":78832,"tdoctype":"other","for":"Discussion","abstract":"In this paper, we present our overview on the WUR RF requirement testability issue","secretary_remarks":"","agenda_item_sort_order":409,"ainumber":"7.23.2.4","ainame":"Testability for UE RF requirements","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2024-08-11 16:27:23","uploaded":"2024-11-08 20:36:18","revisionof":"","revisedto":"","release":"Rel-19","crspec":"","crspecversion":"","workitem":[{"winame":"NR_LPWUS-Core"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_113\/Docs\/R4-2419485.zip","group":"R4","meeting":"R4-113","year":2024,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0}]