[{"name":"R4-153309","title":"Purpose of Test Tolerance for AAS BS","source":"NEC","contact":"Nader Zein","contact-id":27226,"tdoctype":"other","for":"Decision","abstract":"During RAN4#74bis a couple of contributions [1 and 2] were submitted discussing and proposing conformance testing aspects related to AAS BS EIRP requirements. Both contributions proposed relaxation of the core requirement by a Test Tolerance which values are based on the uncertainties related to the EIRP measurements. In this contribution we clarify the purpose of the shared risk principle and how it is applied to derive the Test Tolerance from specified requirements and measurement uncertainty. This contribution does not address the source of uncertainties in AAS EIRP measurement as these are well covered in [1 and 2].","secretary_remarks":"","agenda_item_sort_order":83,"ainumber":"7.2.7.1","ainame":"Measurement uncertainties","tdoc_agenda_sort_order":0,"status":"available","reservation_date":"2015-05-14 12:37:12","uploaded":"2015-05-18 15:31:21","revisionof":"","revisedto":"","release":"Rel-13","crspec":"37.842","crspecversion":"1.5.0","workitem":[{"winame":"AAS_BS_LTE_UTRA-Core"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_75\/Docs\/R4-153309.zip","group":"R4","meeting":"R4-75","year":2015,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-153429","title":"OTA testing accuracy","source":"Huawei","contact":"Alf Ahlstr\u00f6m","contact-id":23580,"tdoctype":"other","for":"Decision","abstract":"Discussion: On the applicability of TS34.114 concepts for AAS BS. Further development of R4-151797,","secretary_remarks":"","agenda_item_sort_order":83,"ainumber":"7.2.7.1","ainame":"Measurement uncertainties","tdoc_agenda_sort_order":0,"status":"available","reservation_date":"2015-05-14 15:59:48","uploaded":"2015-05-18 20:05:17","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_75\/Docs\/R4-153429.zip","group":"R4","meeting":"R4-75","year":2015,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-153430","title":"Contributions on uncertainty contributors for EIRP test methods.","source":"Huawei","contact":"Alf Ahlstr\u00f6m","contact-id":23580,"tdoctype":"other","for":"Decision","abstract":"Discussion:On unceratinty contributor for test methods of EIRP accuracy.","secretary_remarks":"","agenda_item_sort_order":83,"ainumber":"7.2.7.1","ainame":"Measurement uncertainties","tdoc_agenda_sort_order":0,"status":"reserved","reservation_date":"2015-05-14 15:59:48","uploaded":null,"revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"","group":"R4","meeting":"R4-75","year":2015,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-153431","title":"Contributions in uncertainty contributors of EIS test methods.","source":"Huawei","contact":"Alf Ahlstr\u00f6m","contact-id":23580,"tdoctype":"other","for":"Decision","abstract":"Discussion: On unceratinty contributor for test methods of OTA sensitivty.","secretary_remarks":"","agenda_item_sort_order":83,"ainumber":"7.2.7.1","ainame":"Measurement uncertainties","tdoc_agenda_sort_order":0,"status":"reserved","reservation_date":"2015-05-14 15:59:48","uploaded":null,"revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"","group":"R4","meeting":"R4-75","year":2015,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-153506","title":"Selection of AAS conformance test methodology","source":"Nokia Networks","contact":"Joseph Schumacher","contact-id":68458,"tdoctype":"other","for":"Decision","abstract":"Approval","secretary_remarks":"","agenda_item_sort_order":83,"ainumber":"7.2.7.1","ainame":"Measurement uncertainties","tdoc_agenda_sort_order":0,"status":"available","reservation_date":"2015-05-14 18:42:29","uploaded":"2015-05-18 19:28:05","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"AAS_BS_LTE_UTRA"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_75\/Docs\/R4-153506.zip","group":"R4","meeting":"R4-75","year":2015,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]