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{"name":"R4-2315290","title":"Draft CR to Rel-17 TS 38.133 on SDT test cases","source":"MediaTek inc.","contact":"Ogeen Toma","contact-id":93920,"tdoctype":"draftCR","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":537,"ainumber":"7.2.4","ainame":"LS on CG-SDT RRM test procedure (R5-235340)","tdoc_agenda_sort_order":0,"status":"revised","reservation_date":"2023-09-26 20:14:56","uploaded":"2023-09-27 20:58:36","revisionof":"","revisedto":"R4-2317398","release":"Rel-17","crspec":"38.133","crspecversion":"17.11.0","workitem":[{"winame":"NR_SmallData_INACTIVE-Perf"}],"crnumber":"","crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_108bis\/Docs\/R4-2315290.zip","group":"R4","meeting":"R4-108-bis","year":2023,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2315291","title":"Draft CR to Rel-18 TS 38.133 on SDT test cases (Mirror)","source":"MediaTek inc.","contact":"Ogeen Toma","contact-id":93920,"tdoctype":"draftCR","for":"Endorsement","abstract":"This draftCR is reserved as CAT A.","secretary_remarks":"","agenda_item_sort_order":537,"ainumber":"7.2.4","ainame":"LS on CG-SDT RRM test procedure (R5-235340)","tdoc_agenda_sort_order":0,"status":"endorsed","reservation_date":"2023-09-26 20:14:56","uploaded":"2023-10-13 07:51:08","revisionof":"","revisedto":"","release":"Rel-18","crspec":"38.133","crspecversion":"18.3.0","workitem":[{"winame":"NR_SmallData_INACTIVE-Perf"}],"crnumber":"","crrevision":"","crcategory":"A","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_108bis\/Docs\/R4-2315291.zip","group":"R4","meeting":"R4-108-bis","year":2023,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2316068","title":"Discussion on SDT RRM test cases","source":"Huawei, HiSilicon","contact":"Jing Han","contact-id":47284,"tdoctype":"LS out","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":537,"ainumber":"7.2.4","ainame":"LS on CG-SDT RRM test procedure (R5-235340)","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2023-09-27 11:24:22","uploaded":"2023-09-27 16:12:35","revisionof":"","revisedto":"","release":"Rel-17","crspec":"","crspecversion":"","workitem":[{"winame":"NR_SmallData_INACTIVE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"R5-235340","lsto":"RAN5","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_108bis\/Docs\/R4-2316068.zip","group":"R4","meeting":"R4-108-bis","year":2023,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2316069","title":"draftCR on SDT RRM test cases","source":"Huawei, HiSilicon","contact":"Jing Han","contact-id":47284,"tdoctype":"draftCR","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":537,"ainumber":"7.2.4","ainame":"LS on CG-SDT RRM test procedure (R5-235340)","tdoc_agenda_sort_order":0,"status":"merged","reservation_date":"2023-09-27 11:24:22","uploaded":"2023-09-27 16:12:35","revisionof":"","revisedto":"","release":"Rel-17","crspec":"38.133","crspecversion":"17.11.0","workitem":[{"winame":"NR_SmallData_INACTIVE-Perf"}],"crnumber":"","crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_108bis\/Docs\/R4-2316069.zip","group":"R4","meeting":"R4-108-bis","year":2023,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2316070","title":"draftCR on SDT RRM test cases R18","source":"Huawei, HiSilicon","contact":"Jing Han","contact-id":47284,"tdoctype":"draftCR","for":"Endorsement","abstract":"[Not available]; This draftCR is reserved as CAT A.","secretary_remarks":"","agenda_item_sort_order":537,"ainumber":"7.2.4","ainame":"LS on CG-SDT RRM test procedure (R5-235340)","tdoc_agenda_sort_order":0,"status":"withdrawn","reservation_date":"2023-09-27 11:24:22","uploaded":null,"revisionof":"","revisedto":"","release":"Rel-18","crspec":"38.133","crspecversion":"18.3.0","workitem":[{"winame":"NR_SmallData_INACTIVE-Perf"}],"crnumber":"","crrevision":"","crcategory":"A","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"","group":"R4","meeting":"R4-108-bis","year":2023,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2316355","title":"Discussions on CG-SDT RRM test procedure","source":"Ericsson","contact":"Santhan Thangarasa","contact-id":79425,"tdoctype":"discussion","for":"Discussion","abstract":"RAN4 has received a LS from RAN4 regarding test procedure for CG-SDT in [1]. In this contribution we discuss the recommended testing procedure by RAN5 and provide our view on the topic.","secretary_remarks":"","agenda_item_sort_order":537,"ainumber":"7.2.4","ainame":"LS on CG-SDT RRM test procedure (R5-235340)","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2023-09-27 12:49:54","uploaded":"2023-09-27 20:19:57","revisionof":"","revisedto":"","release":"Rel-17","crspec":"","crspecversion":"","workitem":[{"winame":"NR_SmallData_INACTIVE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_108bis\/Docs\/R4-2316355.zip","group":"R4","meeting":"R4-108-bis","year":2023,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2316717","title":"Discussion on LS on CG-SDT RRM test procedure","source":"Qualcomm Incorporated","contact":"Hyunwoo Cho","contact-id":94041,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":537,"ainumber":"7.2.4","ainame":"LS on CG-SDT RRM test procedure (R5-235340)","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2023-09-27 16:27:44","uploaded":"2023-09-27 20:27:40","revisionof":"","revisedto":"","release":"Rel-17","crspec":"","crspecversion":"","workitem":[{"winame":"NR_SmallData_INACTIVE-Perf"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_108bis\/Docs\/R4-2316717.zip","group":"R4","meeting":"R4-108-bis","year":2023,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2316750","title":"Discussion on CG-SDT RRM test procedure","source":"Nokia, Nokia Shanghai Bell","contact":"Juergen Hofmann","contact-id":68332,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":537,"ainumber":"7.2.4","ainame":"LS on CG-SDT RRM test procedure (R5-235340)","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2023-09-27 17:11:19","uploaded":"2023-09-27 19:54:05","revisionof":"","revisedto":"","release":"Rel-17","crspec":"","crspecversion":"","workitem":[{"winame":"NR_SmallData_INACTIVE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_108bis\/Docs\/R4-2316750.zip","group":"R4","meeting":"R4-108-bis","year":2023,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2316887","title":"Discussion on LS on CG-SDT RRM test procedure","source":"Qualcomm Incorporated","contact":"Hyunwoo Cho","contact-id":94041,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":537,"ainumber":"7.2.4","ainame":"LS on CG-SDT RRM test procedure (R5-235340)","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2023-09-27 23:12:53","uploaded":"2023-09-27 23:24:05","revisionof":"","revisedto":"","release":"Rel-17","crspec":"","crspecversion":"","workitem":[{"winame":"NR_SmallData_INACTIVE-Perf"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_108bis\/Docs\/R4-2316887.zip","group":"R4","meeting":"R4-108-bis","year":2023,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2317398","title":"Draft CR to Rel-17 TS 38.133 on SDT test cases","source":"MediaTek inc.","contact":"Carolyn Taylor","contact-id":90657,"tdoctype":"draftCR","for":"Endorsement","abstract":"[108-bis][200] RRM Session","secretary_remarks":"","agenda_item_sort_order":537,"ainumber":"7.2.4","ainame":"LS on CG-SDT RRM test procedure (R5-235340)","tdoc_agenda_sort_order":0,"status":"endorsed","reservation_date":"2023-02-10 13:01:01","uploaded":"2023-10-13 07:51:10","revisionof":"R4-2315290","revisedto":"","release":"Rel-17","crspec":"38.133","crspecversion":"17.11.0","workitem":[{"winame":"NR_SmallData_INACTIVE-Perf"}],"crnumber":"","crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_108bis\/Docs\/R4-2317398.zip","group":"R4","meeting":"R4-108-bis","year":2023,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0}]