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{"name":"R5-176260","title":"Update NB-IoT RLM In-sync Test cases","source":"ANRITSU LTD","contact":"Ian Rose","contact-id":9381,"tdoctype":"CR","for":"Agreement","abstract":"5.3.5.5\na) Update test cases 7.3.62, 7.3.63, 7.3.64 and 7.3.65 to specify more clearly the SNR transition during the times labelled \u201cdT\u201d. Also, update the Test Procedure to align with the new definition.\nB) Update test cases 7.3.62, 7.3.63, 7.3.64 and 7.","secretary_remarks":"","agenda_item_sort_order":597,"ainumber":"7.2.1","ainame":"\tRF group docs still requiring WG verdict\/confirmation - original A.I. retained","tdoc_agenda_sort_order":62600,"status":"revised","reservation_date":"2017-11-14 22:11:47","uploaded":"2017-11-16 23:09:09","revisionof":"","revisedto":"R5-177456","release":"Rel-14","crspec":"36.521-3","crspecversion":"14.3.0","workitem":[{"winame":"NB_IOT-UEConTest"}],"crnumber":2023.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_77_Reno\/Docs\/R5-176260.zip","group":"R5","meeting":"R5-77","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-176442","title":"Test tolerance, update of 4.2.19 and 4.2.24 to add test tolerances","source":"Huawei","contact":"Chunying Gu","contact-id":65493,"tdoctype":"CR","for":"Agreement","abstract":"5.3.5.5","secretary_remarks":"","agenda_item_sort_order":597,"ainumber":"7.2.1","ainame":"\tRF group docs still requiring WG verdict\/confirmation - original A.I. retained","tdoc_agenda_sort_order":64420,"status":"agreed","reservation_date":"2017-11-16 09:36:19","uploaded":"2017-11-17 07:27:42","revisionof":"","revisedto":"","release":"Rel-14","crspec":"36.521-3","crspecversion":"14.3.0","workitem":[{"winame":"NB_IOT-UEConTest"}],"crnumber":2034.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-172202","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_77_Reno\/Docs\/R5-176442.zip","group":"R5","meeting":"R5-77","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-176853","title":"draft TS 38.509 v0.1.0","source":"Samsung","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"draft TS","for":"Approval","abstract":"5.3.20.3","secretary_remarks":"","agenda_item_sort_order":597,"ainumber":"7.2.1","ainame":"\tRF group docs still requiring WG verdict\/confirmation - original A.I. retained","tdoc_agenda_sort_order":685300,"status":"approved","reservation_date":"2017-12-05 14:02:14","uploaded":"2017-12-05 14:07:53","revisionof":"","revisedto":"","release":"Rel-15","crspec":"38.509","crspecversion":"0.1.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_77_Reno\/Docs\/R5-176853.zip","group":"R5","meeting":"R5-77","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
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{"name":"R5-177088","title":"Update NB-IoT RLM Out-of-sync Test cases","source":"ANRITSU LTD","contact":"Mathieu Mangion","contact-id":27904,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":597,"ainumber":"7.2.1","ainame":"\tRF group docs still requiring WG verdict\/confirmation - original A.I. retained","tdoc_agenda_sort_order":62581,"status":"agreed","reservation_date":"2017-12-05 14:06:02","uploaded":"2017-12-05 14:07:55","revisionof":"R5-176258","revisedto":"","release":"Rel-14","crspec":"36.521-3","crspecversion":"14.3.0","workitem":[{"winame":"NB_IOT-UEConTest"}],"crnumber":2022.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-172202","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_77_Reno\/Docs\/R5-177088.zip","group":"R5","meeting":"R5-77","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-177089","title":"Update Test Tolerance analysis for NB-IoT RLM In-sync Test cases","source":"ANRITSU LTD","contact":"Mathieu Mangion","contact-id":27904,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":597,"ainumber":"7.2.1","ainame":"\tRF group docs still requiring WG verdict\/confirmation - original A.I. retained","tdoc_agenda_sort_order":62591,"status":"revised","reservation_date":"2017-12-05 14:06:03","uploaded":"2017-12-05 14:07:55","revisionof":"R5-176259","revisedto":"R5-177126","release":"Rel-13","crspec":"36.903","crspecversion":"13.3.0","workitem":[{"winame":"NB_IOT-UEConTest"}],"crnumber":365.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_77_Reno\/Docs\/R5-177089.zip","group":"R5","meeting":"R5-77","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-177090","title":"Correction to MeasConfig-DEFAULT for Band > 64","source":"ANRITSU LTD","contact":"Mathieu Mangion","contact-id":27904,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":597,"ainumber":"7.2.1","ainame":"\tRF group docs still requiring WG verdict\/confirmation - original A.I. retained","tdoc_agenda_sort_order":65011,"status":"agreed","reservation_date":"2017-12-05 14:06:04","uploaded":"2017-12-05 14:07:55","revisionof":"R5-176501","revisedto":"","release":"Rel-14","crspec":"36.508","crspecversion":"14.3.0","workitem":[{"winame":"TEI13_Test"}],"crnumber":1068.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-172238","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_77_Reno\/Docs\/R5-177090.zip","group":"R5","meeting":"R5-77","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-177092","title":"Change of eMTC demodulation test cases numbering","source":"Ericsson","contact":"Mathieu Mangion","contact-id":27904,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":597,"ainumber":"7.2.1","ainame":"\tRF group docs still requiring WG verdict\/confirmation - original A.I. retained","tdoc_agenda_sort_order":65251,"status":"agreed","reservation_date":"2017-12-05 14:06:06","uploaded":"2017-12-05 14:07:55","revisionof":"R5-176525","revisedto":"","release":"Rel-14","crspec":"36.521-1","crspecversion":"14.4.0","workitem":[{"winame":"TEI13_Test"}],"crnumber":3888.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-172239","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_77_Reno\/Docs\/R5-177092.zip","group":"R5","meeting":"R5-77","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-177093","title":"Change of eMTC demodulation test cases numbering, part 2","source":"Ericsson","contact":"Mathieu Mangion","contact-id":27904,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":597,"ainumber":"7.2.1","ainame":"\tRF group docs still requiring WG verdict\/confirmation - original A.I. retained","tdoc_agenda_sort_order":65271,"status":"agreed","reservation_date":"2017-12-05 14:06:07","uploaded":"2017-12-05 14:07:55","revisionof":"R5-176527","revisedto":"","release":"Rel-14","crspec":"36.521-2","crspecversion":"14.4.0","workitem":[{"winame":"TEI13_Test"}],"crnumber":642.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-172239","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_77_Reno\/Docs\/R5-177093.zip","group":"R5","meeting":"R5-77","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-177094","title":"Editorial Change - Alignment of Channel spacing for CA to 36.101","source":"ROHDE & SCHWARZ","contact":"Mathieu Mangion","contact-id":27904,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":597,"ainumber":"7.2.1","ainame":"\tRF group docs still requiring WG verdict\/confirmation - original A.I. retained","tdoc_agenda_sort_order":68451,"status":"agreed","reservation_date":"2017-12-05 14:06:08","uploaded":"2017-12-05 14:07:55","revisionof":"R5-176845","revisedto":"","release":"Rel-14","crspec":"36.521-1","crspecversion":"14.4.0","workitem":[{"winame":"LTE_CA_R14-UEConTest"}],"crnumber":3956.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-172208","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_77_Reno\/Docs\/R5-177094.zip","group":"R5","meeting":"R5-77","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-177125","title":"Update Test Tolerance analysis for NB-IoT RLM Out-of-sync Test cases","source":"ANRITSU LTD","contact":"Mathieu Mangion","contact-id":27904,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":597,"ainumber":"7.2.1","ainame":"\tRF group docs still requiring WG verdict\/confirmation - original A.I. retained","tdoc_agenda_sort_order":62572,"status":"agreed","reservation_date":"2017-12-11 17:41:59","uploaded":"2017-12-11 17:47:52","revisionof":"R5-177087","revisedto":"","release":"Rel-13","crspec":"36.903","crspecversion":"13.3.0","workitem":[{"winame":"NB_IOT-UEConTest"}],"crnumber":364.0,"crrevision":2.0,"crcategory":"F","tsg_crp":"RP-172201","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_77_Reno\/Docs\/R5-177125.zip","group":"R5","meeting":"R5-77","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-177126","title":"Update Test Tolerance analysis for NB-IoT RLM In-sync Test cases","source":"ANRITSU LTD","contact":"Mathieu Mangion","contact-id":27904,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":597,"ainumber":"7.2.1","ainame":"\tRF group docs still requiring WG verdict\/confirmation - original A.I. retained","tdoc_agenda_sort_order":62592,"status":"agreed","reservation_date":"2017-12-11 17:42:00","uploaded":"2017-12-11 17:47:52","revisionof":"R5-177089","revisedto":"","release":"Rel-13","crspec":"36.903","crspecversion":"13.3.0","workitem":[{"winame":"NB_IOT-UEConTest"}],"crnumber":365.0,"crrevision":2.0,"crcategory":"F","tsg_crp":"RP-172201","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_77_Reno\/Docs\/R5-177126.zip","group":"R5","meeting":"R5-77","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-177312","title":"Update Test Tolerances and Test requirements for TS 36.521-3 Test cases  9.2.45+9.2.46","source":"ROHDE & SCHWARZ, ANRITSU","contact":"Mathieu Mangion","contact-id":27904,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":597,"ainumber":"7.2.1","ainame":"\tRF group docs still requiring WG verdict\/confirmation - original A.I. retained","tdoc_agenda_sort_order":61151,"status":"agreed","reservation_date":"2017-12-05 14:06:34","uploaded":"2017-12-05 14:07:55","revisionof":"R5-176115","revisedto":"","release":"Rel-14","crspec":"36.521-3","crspecversion":"14.3.0","workitem":[{"winame":"LTE_CA_Rel13-UEConTest"}],"crnumber":2017.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-172200","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_77_Reno\/Docs\/R5-177312.zip","group":"R5","meeting":"R5-77","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
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