[{"name":"R4-1702923","title":"LTE V2X UE demodulation requirements: Maximum process test cases","source":"Intel Corporation","contact":"Yang Tang","contact-id":56725,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":191,"ainumber":"7.16.5.1","ainame":"Maximum process test [LTE_V2X-Perf]","tdoc_agenda_sort_order":30290,"status":"noted","reservation_date":"2017-03-23 15:08:20","uploaded":"2017-03-24 23:07:05","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"LTE_V2X-Perf"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_82Bis\/Docs\/R4-1702923.zip","group":"R4","meeting":"R4-82","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1703029","title":"Discussion on V2V\/V2X maximum process test","source":"CATT","contact":"Xuhua Tao","contact-id":62863,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":191,"ainumber":"7.16.5.1","ainame":"Maximum process test [LTE_V2X-Perf]","tdoc_agenda_sort_order":29230,"status":"revised","reservation_date":"2017-03-23 15:46:26","uploaded":"2017-03-24 15:52:02","revisionof":"","revisedto":"R4-1704232","release":"Rel-14","crspec":"","crspecversion":"","workitem":[{"winame":"LTE_V2X-Perf"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_82Bis\/Docs\/R4-1703029.zip","group":"R4","meeting":"R4-82","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1703297","title":"Further discussion open issues for V2V demodulation","source":"Ericsson","contact":"Shaohua Li","contact-id":46382,"tdoctype":"discussion","for":"Discussion","abstract":"Further discussion open issues for V2V demodulation","secretary_remarks":"","agenda_item_sort_order":191,"ainumber":"7.16.5.1","ainame":"Maximum process test [LTE_V2X-Perf]","tdoc_agenda_sort_order":37740,"status":"noted","reservation_date":"2017-03-24 06:17:10","uploaded":"2017-03-25 05:23:43","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"LTE_SL_V2V-Perf"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_82Bis\/Docs\/R4-1703297.zip","group":"R4","meeting":"R4-82","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1703774","title":"Discussion on maximum process test in V2X WI","source":"Huawei, HiSilicon","contact":"Xiang (Steven) Chen","contact-id":41576,"tdoctype":"discussion","for":"Discussion","abstract":"In this contribution, we disucss maximum process test in V2X WI.","secretary_remarks":"","agenda_item_sort_order":191,"ainumber":"7.16.5.1","ainame":"Maximum process test [LTE_V2X-Perf]","tdoc_agenda_sort_order":32970,"status":"noted","reservation_date":"2017-03-24 15:09:38","uploaded":"2017-03-24 22:46:55","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"LTE_V2X-Perf"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_82Bis\/Docs\/R4-1703774.zip","group":"R4","meeting":"R4-82","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1704232","title":"Discussion on V2V\/V2X maximum process test","source":"CATT","contact":"Kyoungseok Oh","contact-id":66120,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":191,"ainumber":"7.16.5.1","ainame":"Maximum process test [LTE_V2X-Perf]","tdoc_agenda_sort_order":29231,"status":"noted","reservation_date":"2017-04-13 16:03:15","uploaded":"2017-04-13 16:07:25","revisionof":"R4-1703029","revisedto":"","release":"Rel-14","crspec":"","crspecversion":"","workitem":[{"winame":"LTE_V2X-Perf"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_82Bis\/Docs\/R4-1704232.zip","group":"R4","meeting":"R4-82","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]