[{"name":"R2-156236","title":"Logged MDT under IDC interference","source":"ZTE Corporation","contact":"Zhongda Du","contact-id":38890,"tdoctype":"discussion","for":"","abstract":"Discussion, Rel-13,LTE_eMDT2-Core","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"7.13.2","ainame":"LTE Rel-13: WI: Further Enhancements of Minimization of Drive Tests for E-UTRAN: Coverage Optimization","tdoc_agenda_sort_order":0,"status":"available","reservation_date":"2015-11-06 01:49:31","uploaded":"2015-11-06 02:18:40","revisionof":"","revisedto":"","release":"Rel-13","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG2_RL2\/TSGR2_92\/Docs\/R2-156236.zip","group":"R2","meeting":"R2-92","year":2015,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R2-156507","title":"Measurement logging under in-device interference","source":"LG Electronics France","contact":"SungHoon Jung","contact-id":45636,"tdoctype":"discussion","for":"","abstract":"","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"7.13.2","ainame":"LTE Rel-13: WI: Further Enhancements of Minimization of Drive Tests for E-UTRAN: Coverage Optimization","tdoc_agenda_sort_order":0,"status":"available","reservation_date":"2015-11-06 12:13:36","uploaded":"2015-11-07 05:19:34","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"LTE_eMDT2"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG2_RL2\/TSGR2_92\/Docs\/R2-156507.zip","group":"R2","meeting":"R2-92","year":2015,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R2-156657","title":"FFS issues on data filtering due to IDC","source":"Kyocera","contact":"Henry Chang","contact-id":23830,"tdoctype":"discussion","for":"","abstract":"","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"7.13.2","ainame":"LTE Rel-13: WI: Further Enhancements of Minimization of Drive Tests for E-UTRAN: Coverage Optimization","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2015-11-06 18:33:11","uploaded":"2015-11-07 05:00:54","revisionof":"","revisedto":"","release":"Rel-13","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG2_RL2\/TSGR2_92\/Docs\/R2-156657.zip","group":"R2","meeting":"R2-92","year":2015,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R2-156824","title":"Further Analysis on MDT with eICIC","source":"CATT","contact":"Jianhua Liu","contact-id":33241,"tdoctype":"discussion","for":"","abstract":"","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"7.13.2","ainame":"LTE Rel-13: WI: Further Enhancements of Minimization of Drive Tests for E-UTRAN: Coverage Optimization","tdoc_agenda_sort_order":0,"status":"available","reservation_date":"2015-11-07 07:09:53","uploaded":"2015-11-07 07:21:51","revisionof":"","revisedto":"","release":"Rel-13","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG2_RL2\/TSGR2_92\/Docs\/R2-156824.zip","group":"R2","meeting":"R2-92","year":2015,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]