[{"name":"R4-1804463","title":"On TRP Measurement Grids for mm-wave","source":"ROHDE & SCHWARZ","contact":"Thorsten Hertel","contact-id":60675,"tdoctype":"other","for":"Approval","abstract":"-----","secretary_remarks":"","agenda_item_sort_order":522,"ainumber":"7.12","ainame":"Testability [FS_NR_test_methods]","tdoc_agenda_sort_order":538900,"status":"noted","reservation_date":"2018-04-06 05:04:39","uploaded":"2018-04-06 21:14:21","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_86Bis\/Docs\/R4-1804463.zip","group":"R4","meeting":"R4-86","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1804464","title":"On spherical coverage\/CDF Measurement Grids for mm-wave","source":"ROHDE & SCHWARZ","contact":"Thorsten Hertel","contact-id":60675,"tdoctype":"other","for":"Approval","abstract":"-----","secretary_remarks":"","agenda_item_sort_order":522,"ainumber":"7.12","ainame":"Testability [FS_NR_test_methods]","tdoc_agenda_sort_order":589100,"status":"noted","reservation_date":"2018-04-06 05:09:50","uploaded":"2018-04-06 21:14:21","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_86Bis\/Docs\/R4-1804464.zip","group":"R4","meeting":"R4-86","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1805086","title":"Overview of TRP uncertainty versus sampling grid","source":"MVG Industries","contact":"Alessandro Scannavini","contact-id":52688,"tdoctype":"other","for":"Approval","abstract":"During the last RAN4 meetings, there have been discussions about sampling grid to be used for TRP computation. Specifically, two types of measurement grids have been compared, uniform and constant density. \nThis contribution highlights the TRP uncertainty","secretary_remarks":"","agenda_item_sort_order":522,"ainumber":"7.12","ainame":"Testability [FS_NR_test_methods]","tdoc_agenda_sort_order":588900,"status":"noted","reservation_date":"2018-04-06 13:47:04","uploaded":"2018-04-06 21:09:37","revisionof":"","revisedto":"","release":"Rel-16","crspec":"","crspecversion":"","workitem":[{"winame":"FS_NR_test_methods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_86Bis\/Docs\/R4-1805086.zip","group":"R4","meeting":"R4-86","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1805389","title":"Minor corrections to 38.810 Combined axes system sections","source":"Keysight Technologies UK Ltd, Rohde & Schwarz","contact":"Prasadh Ramachandran","contact-id":71622,"tdoctype":"pCR","for":"Endorsement","abstract":"-----","secretary_remarks":"","agenda_item_sort_order":522,"ainumber":"7.12","ainame":"Testability [FS_NR_test_methods]","tdoc_agenda_sort_order":589200,"status":"withdrawn","reservation_date":"2018-04-06 18:48:48","uploaded":"2018-04-06 19:08:52","revisionof":"","revisedto":"","release":"Rel-15","crspec":"38.810","crspecversion":"2.0.0","workitem":[{"winame":"FS_NR_test_methods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_86Bis\/Docs\/R4-1805389.zip","group":"R4","meeting":"R4-86","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1805425","title":"Corrections to 38.810 EIS Test procedure","source":"Keysight Technologies UK Ltd","contact":"Flores Fernandez Martos","contact-id":47301,"tdoctype":"pCR","for":"Endorsement","abstract":"-----","secretary_remarks":"","agenda_item_sort_order":522,"ainumber":"7.12","ainame":"Testability [FS_NR_test_methods]","tdoc_agenda_sort_order":589800,"status":"withdrawn","reservation_date":"2018-04-06 20:25:31","uploaded":"2018-04-06 20:29:43","revisionof":"","revisedto":"","release":"Rel-15","crspec":"38.810","crspecversion":"2.0.0","workitem":[{"winame":"FS_NR_test_methods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_86Bis\/Docs\/R4-1805425.zip","group":"R4","meeting":"R4-86","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1805889","title":"NR Test Methods SI evening ad-hoc meeting notes","source":"Intel Corporation","contact":"Kyoungseok Oh","contact-id":66120,"tdoctype":"report","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":522,"ainumber":"7.12","ainame":"Testability [FS_NR_test_methods]","tdoc_agenda_sort_order":446300,"status":"approved","reservation_date":"2018-04-21 09:33:07","uploaded":"2018-04-21 09:33:07","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_86Bis\/Docs\/R4-1805889.zip","group":"R4","meeting":"R4-86","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1805891","title":"LS to RAN5 on clarification on handling of MU for RRM and Demodulation between RAN4 and RAN5","source":"Keysight Technologies UK Ltd","contact":"Kyoungseok Oh","contact-id":66120,"tdoctype":"LS out","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":522,"ainumber":"7.12","ainame":"Testability [FS_NR_test_methods]","tdoc_agenda_sort_order":508600,"status":"withdrawn","reservation_date":"2018-04-23 14:34:12","uploaded":null,"revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"RAN5","Cc":"","lsoriginalls":"","lsreply":"","link":"","group":"R4","meeting":"R4-86","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1805892","title":"Way Forward on Measurement Grids for non sparse antenna arrays","source":"Rohde&Schwarz, Anritsu, Intel, Keysight Technologies","contact":"Kyoungseok Oh","contact-id":66120,"tdoctype":"other","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":522,"ainumber":"7.12","ainame":"Testability [FS_NR_test_methods]","tdoc_agenda_sort_order":542500,"status":"revised","reservation_date":"2018-04-21 09:33:07","uploaded":"2018-04-21 09:33:07","revisionof":"","revisedto":"R4-1805995","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_86Bis\/Docs\/R4-1805892.zip","group":"R4","meeting":"R4-86","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1805898","title":"NR Test Methods offline discussion summary","source":"Intel Corporation","contact":"Kyoungseok Oh","contact-id":66120,"tdoctype":"other","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":522,"ainumber":"7.12","ainame":"Testability [FS_NR_test_methods]","tdoc_agenda_sort_order":446400,"status":"approved","reservation_date":"2018-04-21 09:33:07","uploaded":"2018-04-21 09:33:07","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_86Bis\/Docs\/R4-1805898.zip","group":"R4","meeting":"R4-86","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1805995","title":"Way Forward on Measurement Grids for non sparse antenna arrays","source":"Rohde&Schwarz, Anritsu, Intel, Keysight Technologies","contact":"Kyoungseok Oh","contact-id":66120,"tdoctype":"other","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":522,"ainumber":"7.12","ainame":"Testability [FS_NR_test_methods]","tdoc_agenda_sort_order":542501,"status":"approved","reservation_date":"2018-04-21 09:33:07","uploaded":"2018-04-21 09:33:07","revisionof":"R4-1805892","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_86Bis\/Docs\/R4-1805995.zip","group":"R4","meeting":"R4-86","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]