[{"name":"R4-2003181","title":"Discussion on test method and requirements for Ultra-low BLER","source":"Intel Corporation","contact":"Andrey Chervyakov","contact-id":47232,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":238,"ainumber":"6.9.1.1","ainame":"Test feasibility [NR_L1enh_URLLC-Perf]","tdoc_agenda_sort_order":10,"status":"noted","reservation_date":"2020-04-09 09:35:32","uploaded":"2020-04-10 22:13:57","revisionof":"","revisedto":"","release":"Rel-16","crspec":"","crspecversion":"","workitem":[{"winame":"NR_L1enh_URLLC-Perf"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_94_eBis\/Docs\/R4-2003181.zip","group":"R4","meeting":"R4-ah-38107","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2003678","title":"Discussion on URLLC high reliability test feasibility","source":"Huawei, HiSilicon","contact":"Tricia Li","contact-id":56874,"tdoctype":"discussion","for":"Discussion","abstract":"Discussion on the open issues for URLLC high reliability with BLER target of 10^-5","secretary_remarks":"","agenda_item_sort_order":238,"ainumber":"6.9.1.1","ainame":"Test feasibility [NR_L1enh_URLLC-Perf]","tdoc_agenda_sort_order":20,"status":"noted","reservation_date":"2020-04-10 07:34:04","uploaded":"2020-04-10 14:48:44","revisionof":"","revisedto":"","release":"Rel-16","crspec":"","crspecversion":"","workitem":[{"winame":"NR_L1enh_URLLC-Perf"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_94_eBis\/Docs\/R4-2003678.zip","group":"R4","meeting":"R4-ah-38107","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2003842","title":"URLLC ultra-low BLER test","source":"Ericsson","contact":"Thomas Chapman","contact-id":46692,"tdoctype":"other","for":"Approval","abstract":"Proposals for ultra-low BLER test","secretary_remarks":"","agenda_item_sort_order":238,"ainumber":"6.9.1.1","ainame":"Test feasibility [NR_L1enh_URLLC-Perf]","tdoc_agenda_sort_order":30,"status":"noted","reservation_date":"2020-04-10 09:05:03","uploaded":"2020-04-10 20:45:21","revisionof":"","revisedto":"","release":"Rel-16","crspec":"","crspecversion":"","workitem":[{"winame":"NR_L1enh_URLLC-Perf"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_94_eBis\/Docs\/R4-2003842.zip","group":"R4","meeting":"R4-ah-38107","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2003900","title":"On NR Rel-16 high reliability BS demodulation test feasibility and methodology","source":"Nokia, Nokia Shanghai Bell","contact":"Axel Mueller","contact-id":83425,"tdoctype":"discussion","for":"Discussion","abstract":"In this contribution we have provided our views on various open NR Rel-16 high reliability BS demodulation test feasibility and methodology issues. In particular, the introduction of requirements and tests for FR2, TDD patterns for the BS, DFT-s-OFDM, DM-","secretary_remarks":"","agenda_item_sort_order":238,"ainumber":"6.9.1.1","ainame":"Test feasibility [NR_L1enh_URLLC-Perf]","tdoc_agenda_sort_order":40,"status":"noted","reservation_date":"2020-04-10 09:38:47","uploaded":"2020-04-10 12:59:12","revisionof":"","revisedto":"","release":"Rel-16","crspec":"","crspecversion":"","workitem":[{"winame":"NR_L1enh_URLLC-Perf"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_94_eBis\/Docs\/R4-2003900.zip","group":"R4","meeting":"R4-ah-38107","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2004557","title":"Views on URLLC Test Feasibility","source":"Qualcomm Incorporated","contact":"Gaurav Nigam","contact-id":74911,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":238,"ainumber":"6.9.1.1","ainame":"Test feasibility [NR_L1enh_URLLC-Perf]","tdoc_agenda_sort_order":50,"status":"noted","reservation_date":"2020-04-10 17:00:37","uploaded":"2020-04-10 22:56:21","revisionof":"","revisedto":"","release":"Rel-16","crspec":"","crspecversion":"","workitem":[{"winame":"NR_L1enh_URLLC-Perf"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_94_eBis\/Docs\/R4-2004557.zip","group":"R4","meeting":"R4-ah-38107","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]