[{"name":"R4-2513818","title":"Simplification of BS TRP test methods","source":"Nokia","contact":"Man Hung Ng","contact-id":95559,"tdoctype":"other","for":"Approval","abstract":"This contribution provides proposals to progress this topic in RAN4 according to the discussion and agreed WF","secretary_remarks":"","agenda_item_sort_order":215,"ainumber":"6.8.4.2.2","ainame":"Simplification of BS TRP test methods","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2025-02-10 18:02:46","uploaded":"2025-10-03 10:47:18","revisionof":"","revisedto":"","release":"Rel-19","crspec":"","crspecversion":"","workitem":[{"winame":"NR_BS_RF_req_evo-Perf"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG4_Radio\/TSGR4_116bis\/Docs\/R4-2513818.zip","group":"R4","meeting":"R4-116-bis","year":2025,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2513819","title":"Draft CR to TR 37.941 on definition of anechoic chamber","source":"Nokia","contact":"Man Hung Ng","contact-id":95559,"tdoctype":"draftCR","for":"Endorsement","abstract":"Add definition of anechoic chamber, other minor corrections are also included.","secretary_remarks":"","agenda_item_sort_order":215,"ainumber":"6.8.4.2.2","ainame":"Simplification of BS TRP test methods","tdoc_agenda_sort_order":0,"status":"revised","reservation_date":"2025-02-10 18:02:46","uploaded":"2025-10-03 11:00:39","revisionof":"","revisedto":"R4-2515072","release":"Rel-19","crspec":"37.941","crspecversion":"19.0.0","workitem":[{"winame":"NR_BS_RF_req_evo-Perf"}],"crnumber":"","crrevision":"","crcategory":"B","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG4_Radio\/TSGR4_116bis\/Docs\/R4-2513819.zip","group":"R4","meeting":"R4-116-bis","year":2025,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2513820","title":"Draft CR on TRP sampling grid for the preferred test method","source":"Nokia","contact":"Man Hung Ng","contact-id":95559,"tdoctype":"draftCR","for":"Endorsement","abstract":"Define spherical equal angle grid as the TRP sampling grid for the preferred test method.","secretary_remarks":"","agenda_item_sort_order":215,"ainumber":"6.8.4.2.2","ainame":"Simplification of BS TRP test methods","tdoc_agenda_sort_order":0,"status":"not pursued","reservation_date":"2025-02-10 18:02:46","uploaded":"2025-10-03 11:03:02","revisionof":"","revisedto":"","release":"Rel-19","crspec":"38.141-2","crspecversion":"19.2.0","workitem":[{"winame":"NR_BS_RF_req_evo-Perf"}],"crnumber":"","crrevision":"","crcategory":"B","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG4_Radio\/TSGR4_116bis\/Docs\/R4-2513820.zip","group":"R4","meeting":"R4-116-bis","year":2025,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2514107","title":"draft CR to TS 38.141-2: Improvements on Annex I - TRP measurement procedures","source":"Ericsson","contact":"Aurelian Bria","contact-id":40914,"tdoctype":"draftCR","for":"Endorsement","abstract":"Proposals for improvement of applicability conditions and description of different test methods for TRP","secretary_remarks":"","agenda_item_sort_order":215,"ainumber":"6.8.4.2.2","ainame":"Simplification of BS TRP test methods","tdoc_agenda_sort_order":0,"status":"revised","reservation_date":"2025-03-10 10:35:24","uploaded":"2025-10-03 20:10:43","revisionof":"","revisedto":"R4-2515073","release":"Rel-19","crspec":"38.141-2","crspecversion":"19.2.0","workitem":[{"winame":"NR_BS_RF_req_evo-Perf"}],"crnumber":"","crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG4_Radio\/TSGR4_116bis\/Docs\/R4-2514107.zip","group":"R4","meeting":"R4-116-bis","year":2025,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2514272","title":"Discussion on the applicability improvement of TRP measurement","source":"ZTE Corporation, Sanechips","contact":"Fei Xue","contact-id":59676,"tdoctype":"other","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":215,"ainumber":"6.8.4.2.2","ainame":"Simplification of BS TRP test methods","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2025-03-10 14:29:06","uploaded":"2025-10-03 16:55:36","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG4_Radio\/TSGR4_116bis\/Docs\/R4-2514272.zip","group":"R4","meeting":"R4-116-bis","year":2025,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2514473","title":"Discussion on the proposed conclusions for the preferred OTA test methods","source":"Huawei, HiSilicon","contact":"Michal Szydelko","contact-id":65553,"tdoctype":"discussion","for":"Discussion","abstract":"In this contribution we provide discussion towards the proposed conclusions for the preferred OTA test methods topic.","secretary_remarks":"","agenda_item_sort_order":215,"ainumber":"6.8.4.2.2","ainame":"Simplification of BS TRP test methods","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2025-03-10 20:48:26","uploaded":"2025-10-03 21:04:04","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"NR_BS_RF_req_evo-Perf"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG4_Radio\/TSGR4_116bis\/Docs\/R4-2514473.zip","group":"R4","meeting":"R4-116-bis","year":2025,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2514474","title":"Draft CR to TS 38.141-2: implementation of the preferred test method solution","source":"Huawei, HiSilicon","contact":"Michal Szydelko","contact-id":65553,"tdoctype":"draftCR","for":"Endorsement","abstract":"Based on related discussion, in this Draft CR we provide proposal to address the preferred\/reference test method issue.","secretary_remarks":"","agenda_item_sort_order":215,"ainumber":"6.8.4.2.2","ainame":"Simplification of BS TRP test methods","tdoc_agenda_sort_order":0,"status":"not pursued","reservation_date":"2025-03-10 20:48:26","uploaded":"2025-10-03 21:04:04","revisionof":"","revisedto":"","release":"Rel-19","crspec":"38.141-2","crspecversion":"19.2.0","workitem":[{"winame":"NR_BS_RF_req_evo-Perf"}],"crnumber":"","crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG4_Radio\/TSGR4_116bis\/Docs\/R4-2514474.zip","group":"R4","meeting":"R4-116-bis","year":2025,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2514475","title":"Draft CR to TS 37.145-2: implementation of the preferred test method solution","source":"Huawei, HiSilicon","contact":"Michal Szydelko","contact-id":65553,"tdoctype":"draftCR","for":"Endorsement","abstract":"Based on related discussion, in this Draft CR we provide proposal to address the preferred\/reference test method issue.","secretary_remarks":"","agenda_item_sort_order":215,"ainumber":"6.8.4.2.2","ainame":"Simplification of BS TRP test methods","tdoc_agenda_sort_order":0,"status":"revised","reservation_date":"2025-03-10 20:48:26","uploaded":"2025-10-03 21:04:04","revisionof":"","revisedto":"R4-2515074","release":"Rel-19","crspec":"37.145-2","crspecversion":"19.2.0","workitem":[{"winame":"NR_BS_RF_req_evo-Perf"}],"crnumber":"","crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG4_Radio\/TSGR4_116bis\/Docs\/R4-2514475.zip","group":"R4","meeting":"R4-116-bis","year":2025,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2514476","title":"Draft CR to TR 37.941: Definition of anechoic chamber","source":"Huawei, HiSilicon","contact":"Michal Szydelko","contact-id":65553,"tdoctype":"draftCR","for":"Endorsement","abstract":"Based on related discussion, in this Draft CR we provide proposal to add missing definition of anechoic chamber.","secretary_remarks":"","agenda_item_sort_order":215,"ainumber":"6.8.4.2.2","ainame":"Simplification of BS TRP test methods","tdoc_agenda_sort_order":0,"status":"not pursued","reservation_date":"2025-03-10 20:48:26","uploaded":"2025-10-03 21:04:04","revisionof":"","revisedto":"","release":"Rel-15","crspec":"37.941","crspecversion":"15.5.0","workitem":[{"winame":"NR_BS_RF_req_evo-Perf"}],"crnumber":"","crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG4_Radio\/TSGR4_116bis\/Docs\/R4-2514476.zip","group":"R4","meeting":"R4-116-bis","year":2025,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2515072","title":"Draft CR to TR 37.941 on definition of anechoic chamber","source":"Nokia","contact":"Man Hung Ng","contact-id":95559,"tdoctype":"draftCR","for":"Endorsement","abstract":"Add definition of anechoic chamber, other minor corrections are also included.","secretary_remarks":"","agenda_item_sort_order":215,"ainumber":"6.8.4.2.2","ainame":"Simplification of BS TRP test methods","tdoc_agenda_sort_order":0,"status":"endorsed","reservation_date":"2025-09-10 09:51:07","uploaded":"2025-10-20 09:58:06","revisionof":"R4-2513819","revisedto":"","release":"Rel-19","crspec":"37.941","crspecversion":"19.0.0","workitem":[{"winame":"NR_BS_RF_req_evo-Perf"}],"crnumber":"","crrevision":"","crcategory":"B","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG4_Radio\/TSGR4_116bis\/Docs\/R4-2515072.zip","group":"R4","meeting":"R4-116-bis","year":2025,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2515073","title":"draft CR to TS 38.141-2: Improvements on Annex I - TRP measurement procedures","source":"Ericsson","contact":"Aurelian Bria","contact-id":40914,"tdoctype":"draftCR","for":"Endorsement","abstract":"Proposals for improvement of applicability conditions and description of different test methods for TRP","secretary_remarks":"","agenda_item_sort_order":215,"ainumber":"6.8.4.2.2","ainame":"Simplification of BS TRP test methods","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2025-09-10 09:51:07","uploaded":"2025-10-20 09:58:06","revisionof":"R4-2514107","revisedto":"","release":"Rel-19","crspec":"38.141-2","crspecversion":"19.2.0","workitem":[{"winame":"NR_BS_RF_req_evo-Perf"}],"crnumber":"","crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG4_Radio\/TSGR4_116bis\/Docs\/R4-2515073.zip","group":"R4","meeting":"R4-116-bis","year":2025,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2515074","title":"Draft CR to TS 37.145-2: implementation of the preferred test method solution","source":"Huawei, HiSilicon","contact":"Michal Szydelko","contact-id":65553,"tdoctype":"draftCR","for":"Endorsement","abstract":"Based on related discussion, in this Draft CR we provide proposal to address the preferred\/reference test method issue.","secretary_remarks":"","agenda_item_sort_order":215,"ainumber":"6.8.4.2.2","ainame":"Simplification of BS TRP test methods","tdoc_agenda_sort_order":0,"status":"endorsed","reservation_date":"2025-09-10 09:51:07","uploaded":"2025-10-20 09:58:06","revisionof":"R4-2514475","revisedto":"","release":"Rel-19","crspec":"37.145-2","crspecversion":"19.2.0","workitem":[{"winame":"NR_BS_RF_req_evo-Perf"}],"crnumber":"","crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG4_Radio\/TSGR4_116bis\/Docs\/R4-2515074.zip","group":"R4","meeting":"R4-116-bis","year":2025,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0}]