[{"name":"R4-1904186","title":"Clarifying EVM measurements for test model","source":"Huawei, HiSilicon","contact":"Vipul Desai","contact-id":78944,"tdoctype":"discussion","for":"Approval","abstract":"During the drafting of the TPs for the test models in subclause 4.9.2.2 of TS 38.141-1 and TS 38.141-2, the description of the EVM measurements in subclauses 6.5.2.3 and 9.6.2.3 of TS 38.104 was modified. In RAN4#90, contributions about clarifying EVM mea","secretary_remarks":"","agenda_item_sort_order":194,"ainumber":"6.8.3.1","ainame":"Test configurations [NR_newRAT-Perf]","tdoc_agenda_sort_order":418600,"status":"noted","reservation_date":"2019-04-01 15:36:28","uploaded":"2019-04-01 21:18:33","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_90Bis\/Docs\/R4-1904186.zip","group":"R4","meeting":"R4-90","year":2019,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1904202","title":"Corrections to TS38.141-1 subclause 6.5.3.5 EVM measurement","source":"Huawei, HiSilicon","contact":"Vipul Desai","contact-id":78944,"tdoctype":"draftCR","for":"Endorsement","abstract":"This EVM measurements is unclear for certain slot formats in TDD configurations. Factors such as the number of DM-RS symbols needed and which slots can be measured need clarification.","secretary_remarks":"","agenda_item_sort_order":194,"ainumber":"6.8.3.1","ainame":"Test configurations [NR_newRAT-Perf]","tdoc_agenda_sort_order":420200,"status":"revised","reservation_date":"2019-04-01 15:43:42","uploaded":"2019-04-01 21:18:33","revisionof":"","revisedto":"R4-1905117","release":"Rel-15","crspec":"38.141-1","crspecversion":"15.1.0","workitem":[{"winame":"NR_newRAT-Perf"}],"crnumber":"","crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_90Bis\/Docs\/R4-1904202.zip","group":"R4","meeting":"R4-90","year":2019,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1904203","title":"Corrections to TS38.141-2 subclause 6.6.3.5 EVM measurement","source":"Huawei, HiSilicon","contact":"Vipul Desai","contact-id":78944,"tdoctype":"draftCR","for":"Endorsement","abstract":"This EVM measurements is unclear for certain slot formats in TDD configurations. Factors such as the number of DM-RS symbols needed and which slots can be measured need clarification.","secretary_remarks":"","agenda_item_sort_order":194,"ainumber":"6.8.3.1","ainame":"Test configurations [NR_newRAT-Perf]","tdoc_agenda_sort_order":420300,"status":"revised","reservation_date":"2019-04-01 15:43:42","uploaded":"2019-04-01 21:18:33","revisionof":"","revisedto":"R4-1905118","release":"Rel-15","crspec":"38.141-2","crspecversion":"15.1.0","workitem":[{"winame":"NR_newRAT-Perf"}],"crnumber":"","crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_90Bis\/Docs\/R4-1904203.zip","group":"R4","meeting":"R4-90","year":2019,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1904204","title":"Corrections to 38.104 subclauses 6.5.2.3 and 9.6.2.3.1 EVM procedure","source":"Huawei, HiSilicon","contact":"Vipul Desai","contact-id":78944,"tdoctype":"draftCR","for":"Endorsement","abstract":"The core specification includes specific test procedures for EVM tests. The change removes TDD slot configuration restrictions for the test procedures.","secretary_remarks":"","agenda_item_sort_order":194,"ainumber":"6.8.3.1","ainame":"Test configurations [NR_newRAT-Perf]","tdoc_agenda_sort_order":420400,"status":"postponed","reservation_date":"2019-04-01 15:43:42","uploaded":"2019-04-01 21:18:33","revisionof":"","revisedto":"","release":"Rel-15","crspec":"38.104","crspecversion":"15.5.0","workitem":[{"winame":"NR_newRAT-Perf"}],"crnumber":"","crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_90Bis\/Docs\/R4-1904204.zip","group":"R4","meeting":"R4-90","year":2019,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1905117","title":"Corrections to TS38.141-1 subclause 6.5.3.5 EVM measurement","source":"Huawei, HiSilicon","contact":"Kyoungseok Oh","contact-id":66120,"tdoctype":"draftCR","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":194,"ainumber":"6.8.3.1","ainame":"Test configurations [NR_newRAT-Perf]","tdoc_agenda_sort_order":420201,"status":"revised","reservation_date":"2019-04-15 14:26:50","uploaded":"2019-04-15 14:37:58","revisionof":"R4-1904202","revisedto":"R4-1905214","release":"Rel-15","crspec":"38.141-1","crspecversion":"15.1.0","workitem":[{"winame":"NR_newRAT-Perf"}],"crnumber":"","crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_90Bis\/Docs\/R4-1905117.zip","group":"R4","meeting":"R4-90","year":2019,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1905118","title":"Corrections to TS38.141-2 subclause 6.6.3.5 EVM measurement","source":"Huawei, HiSilicon","contact":"Kyoungseok Oh","contact-id":66120,"tdoctype":"draftCR","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":194,"ainumber":"6.8.3.1","ainame":"Test configurations [NR_newRAT-Perf]","tdoc_agenda_sort_order":420301,"status":"endorsed","reservation_date":"2019-04-15 14:26:50","uploaded":"2019-04-15 14:37:58","revisionof":"R4-1904203","revisedto":"","release":"Rel-15","crspec":"38.141-2","crspecversion":"15.1.0","workitem":[{"winame":"NR_newRAT-Perf"}],"crnumber":"","crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_90Bis\/Docs\/R4-1905118.zip","group":"R4","meeting":"R4-90","year":2019,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1905214","title":"Corrections to TS38.141-1 subclause 6.5.3.5 EVM measurement","source":"Huawei, HiSilicon","contact":"Kyoungseok Oh","contact-id":66120,"tdoctype":"draftCR","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":194,"ainumber":"6.8.3.1","ainame":"Test configurations [NR_newRAT-Perf]","tdoc_agenda_sort_order":420202,"status":"endorsed","reservation_date":"2019-04-15 14:27:38","uploaded":"2019-04-15 14:37:58","revisionof":"R4-1905117","revisedto":"","release":"Rel-15","crspec":"38.141-1","crspecversion":"15.1.0","workitem":[{"winame":"NR_newRAT-Perf"}],"crnumber":"","crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_90Bis\/Docs\/R4-1905214.zip","group":"R4","meeting":"R4-90","year":2019,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]