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{"name":"R5-221074","title":"Update to EIEI test case 11.3.6","source":"Qualcomm Incorporated","contact":"Bharadwaj Kumar Cheruvu","contact-id":68613,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":911,"ainumber":"6.5.3.6","ainame":"General Tests","tdoc_agenda_sort_order":10740,"status":"agreed","reservation_date":"2022-02-11 09:19:22","uploaded":"2022-02-11 12:26:01","revisionof":"","revisedto":"","release":"Rel-17","crspec":"36.523-1","crspecversion":"17.0.0","workitem":[{"winame":"TEI14_Test"},{"winame":" EIEI-UEConTest"}],"crnumber":5077.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-220122","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_94_Electronic\/Docs\/R5-221074.zip","group":"R5","meeting":"R5-94-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]