[{"name":"R5-260714","title":"Proposal for new test case related to UE Assistance Information including overheatingAssistance including reducedMaxCCs","source":"NTT DOCOMO INC.","contact":"Takuya Yashima","contact-id":104606,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":1226,"ainumber":"6.4.7","ainame":"Discussion Papers, Work Plan, TC lists","tdoc_agenda_sort_order":7140,"status":"revised","reservation_date":"2026-01-30 04:19:11","uploaded":"2026-01-30 05:25:39","revisionof":"","revisedto":"R5-261186","release":"Rel-19","crspec":"38.523-1","crspecversion":"","workitem":[{"winame":"TEI16_Test"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5__110_Gothenburg\/Docs\/R5-260714.zip","group":"R5","meeting":"R5-110","year":2026,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R5-260862","title":"Discussion on Uplink Data Compression Test Cases","source":"Qualcomm Incorporated","contact":"Bharadwaj Kumar Cheruvu","contact-id":68613,"tdoctype":"discussion","for":"Endorsement","abstract":"3GPP Rel-17 work item NR_UDC-UEConTest introduced nine test cases for verifying PDCP Uplink Data Compression (UDC) functionality in clause 7.1.3.6 of [1]. Across all these test cases, UE TEST LOOP MODE A is configured and primary DRB used for loopback data transfer, according to clause 7.1.3.0 of [1] is:\na.\t\"Default DRB of the first PDU session on NR Cell\" for Connectivity (NR) and \nb.\t\"SCG DRB\" for Connectivity (NR-DC), Connectivity (NE-DC).\nProposal-1: Introduce a new PIXIT parameter px_UDC_DNN_Type with Supported Values as ims, internet and refer in test cases as needed.\nCRs [7] and [8] raised at this meeting handling this proposal.\nProposal-2: Add two new PICS parameters pc_NRDC_SCG_udc_r17, pc_NEDC_SCG_udc_r17 in [5] and update the applicability of test cases 7.1.3.6.8 and 7.1.3.6.9 in [6] accordingly.\nCRs [9] and [10] are raised at this meeting handling this proposal.","secretary_remarks":"","agenda_item_sort_order":1226,"ainumber":"6.4.7","ainame":"Discussion Papers, Work Plan, TC lists","tdoc_agenda_sort_order":8620,"status":"revised","reservation_date":"2026-01-30 08:58:29","uploaded":"2026-01-30 09:47:00","revisionof":"","revisedto":"R5-261188","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5__110_Gothenburg\/Docs\/R5-260862.zip","group":"R5","meeting":"R5-110","year":2026,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R5-260882","title":"Discussion on reducing the impact of SOR-CMCI test case on SOR test case","source":"Huawei, HiSilicon","contact":"Ya Zhao","contact-id":81385,"tdoctype":"discussion","for":"Endorsement","abstract":"Proposal 1: Update the default value of the Store SOR-CMCI in ME indicator (SSCMI) in TS 38.508-1 Table 4.7.1-11 from \"determined by test implementation\" to \"Do not store SOR-CMCI in ME\". In this way, the four test cases (6.3.2.2\/6.3.2.6\/6.3.3.3\/6.3.3.5) will follow this default configuration.\n\nProposal 2: Add test procedure of sending a SOR-CMCI with no SOR-CMCI rules at the end of 6.3.2.5 [2].\n\nProposal 3: Permit testers to delete the SOR-CMCI stored in the non-volatile memory at the start of all SOR test cases.[3]\n\nProposal 4:Update the IMSI of USIM card used in SOR-CMCI test case..","secretary_remarks":"","agenda_item_sort_order":1226,"ainumber":"6.4.7","ainame":"Discussion Papers, Work Plan, TC lists","tdoc_agenda_sort_order":8820,"status":"revised","reservation_date":"2026-01-30 09:32:06","uploaded":"2026-01-31 08:28:48","revisionof":"","revisedto":"R5-261131","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"TEI17_Test"},{"winame":" eCPSOR_CON-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5__110_Gothenburg\/Docs\/R5-260882.zip","group":"R5","meeting":"R5-110","year":2026,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R5-260900","title":"TS 38.523-1 Tracker status before RAN5-110","source":"Huawei, HiSilicon","contact":"Ya Zhao","contact-id":81385,"tdoctype":"other","for":"Information","abstract":"","secretary_remarks":"","agenda_item_sort_order":1226,"ainumber":"6.4.7","ainame":"Discussion Papers, Work Plan, TC lists","tdoc_agenda_sort_order":9000,"status":"noted","reservation_date":"2026-01-30 09:32:48","uploaded":"2026-01-31 02:39:18","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5__110_Gothenburg\/Docs\/R5-260900.zip","group":"R5","meeting":"R5-110","year":2026,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R5-261131","title":"Discussion on reducing the impact of SOR-CMCI test case on SOR test case","source":"Huawei, HiSilicon","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":1226,"ainumber":"6.4.7","ainame":"Discussion Papers, Work Plan, TC lists","tdoc_agenda_sort_order":8821,"status":"noted","reservation_date":"2026-02-18 19:21:29","uploaded":"2026-02-18 19:31:04","revisionof":"R5-260882","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"TEI17_Test"},{"winame":" eCPSOR_CON-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5__110_Gothenburg\/Docs\/R5-261131.zip","group":"R5","meeting":"R5-110","year":2026,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R5-261186","title":"Proposal for new test case related to UE Assistance Information including overheatingAssistance including reducedMaxCCs","source":"NTT DOCOMO INC.","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":1226,"ainumber":"6.4.7","ainame":"Discussion Papers, Work Plan, TC lists","tdoc_agenda_sort_order":7141,"status":"noted","reservation_date":"2026-02-18 19:22:09","uploaded":"2026-02-18 19:31:04","revisionof":"R5-260714","revisedto":"","release":"Rel-19","crspec":"38.523-1","crspecversion":"","workitem":[{"winame":"TEI16_Test"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5__110_Gothenburg\/Docs\/R5-261186.zip","group":"R5","meeting":"R5-110","year":2026,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R5-261188","title":"Discussion on Uplink Data Compression Test Cases","source":"Qualcomm Incorporated","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":1226,"ainumber":"6.4.7","ainame":"Discussion Papers, Work Plan, TC lists","tdoc_agenda_sort_order":8621,"status":"noted","reservation_date":"2026-02-18 19:22:09","uploaded":"2026-02-18 19:31:04","revisionof":"R5-260862","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5__110_Gothenburg\/Docs\/R5-261188.zip","group":"R5","meeting":"R5-110","year":2026,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0}]