[{"name":"R5-180376","title":"Correction to TC 7.1.6.5 applicability in case of CAT-M1 UEs","source":"ROHDE & SCHWARZ, Qualcomm Incorporated","contact":"Holger Jauch","contact-id":12992,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":565,"ainumber":"6.4.4","ainame":"\tRoutine Maintenance for TS 36.523-2","tdoc_agenda_sort_order":3760,"status":"withdrawn","reservation_date":"2018-02-09 13:23:02","uploaded":"2018-02-09 13:24:34","revisionof":"","revisedto":"","release":"Rel-15","crspec":"36.523-2","crspecversion":"15.0.0","workitem":[{"winame":"TEI13_Test"},{"winame":"LTE_MTCe2_L1-UEConTest"}],"crnumber":1123.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_78_Athens\/Docs\/R5-180376.zip","group":"R5","meeting":"R5-78","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-180553","title":"Correction to applicability of 22.6.x series NB-IoT test cases","source":"ROHDE & SCHWARZ, Qualcomm Incorporated","contact":"Ramakrishnan Thiruvathirai","contact-id":33272,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":565,"ainumber":"6.4.4","ainame":"\tRoutine Maintenance for TS 36.523-2","tdoc_agenda_sort_order":5530,"status":"agreed","reservation_date":"2018-02-13 19:43:02","uploaded":"2018-02-16 09:22:40","revisionof":"","revisedto":"","release":"Rel-15","crspec":"36.523-2","crspecversion":"15.0.0","workitem":[{"winame":"TEI13_Test"},{"winame":"NB_IOT-UEConTest"}],"crnumber":1128.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-180109","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_78_Athens\/Docs\/R5-180553.zip","group":"R5","meeting":"R5-78","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-181069","title":"Correction to applicability of SMS-over-SGs test cases 11.1.5 and 11.1.6 in case of CAT-M1 UEs","source":"ROHDE & SCHWARZ, Qualcomm Incorporated, Ericsson","contact":"Holger Jauch","contact-id":12992,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":565,"ainumber":"6.4.4","ainame":"\tRoutine Maintenance for TS 36.523-2","tdoc_agenda_sort_order":10690,"status":"agreed","reservation_date":"2018-02-16 18:53:40","uploaded":"2018-02-16 19:27:39","revisionof":"","revisedto":"","release":"Rel-15","crspec":"36.523-2","crspecversion":"15.0.0","workitem":[{"winame":"TEI13_Test"},{"winame":"LTE_MTCe2_L1-UEConTest"}],"crnumber":1145.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-180109","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_78_Athens\/Docs\/R5-181069.zip","group":"R5","meeting":"R5-78","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-181088","title":"Addition of DL Category 20 to Table A.4.3.2-2","source":"Intel Corporation (UK) Ltd","contact":"Graham Brand","contact-id":43647,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":565,"ainumber":"6.4.4","ainame":"\tRoutine Maintenance for TS 36.523-2","tdoc_agenda_sort_order":10880,"status":"withdrawn","reservation_date":"2018-02-16 22:40:48","uploaded":null,"revisionof":"","revisedto":"","release":"Rel-14","crspec":"36.523-2","crspecversion":"14.4.0","workitem":[{"winame":"TEI8_Test"}],"crnumber":1146.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"","group":"R5","meeting":"R5-78","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-181106","title":"Addition of DL Category 20 to Table A.4.3.2-2","source":"Intel Corporation (UK) Ltd","contact":"Mathieu Mangion","contact-id":27904,"tdoctype":"CR","for":"Agreement","abstract":"reissued fron R5-181088 because of wrong spec version & release.","secretary_remarks":"","agenda_item_sort_order":565,"ainumber":"6.4.4","ainame":"\tRoutine Maintenance for TS 36.523-2","tdoc_agenda_sort_order":10881,"status":"revised","reservation_date":"2018-03-05 13:48:32","uploaded":"2018-03-05 13:57:55","revisionof":"","revisedto":"R5-181159","release":"Rel-15","crspec":"36.523-2","crspecversion":"15.0.0","workitem":[{"winame":"TEI8_Test"}],"crnumber":1149.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_78_Athens\/Docs\/R5-181106.zip","group":"R5","meeting":"R5-78","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-181121","title":"Removing the applicability of test case 22.4.17","source":"MediaTek Inc.","contact":"Mathieu Mangion","contact-id":27904,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":565,"ainumber":"6.4.4","ainame":"\tRoutine Maintenance for TS 36.523-2","tdoc_agenda_sort_order":112100,"status":"revised","reservation_date":"2018-03-05 13:49:14","uploaded":"2018-03-05 13:57:55","revisionof":"","revisedto":"R5-181160","release":"Rel-15","crspec":"36.523-2","crspecversion":"15.0.0","workitem":[{"winame":"TEI13_Test"},{"winame":"NB_IOT-UEConTest"}],"crnumber":1151.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_78_Athens\/Docs\/R5-181121.zip","group":"R5","meeting":"R5-78","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-181159","title":"Addition of DL Category 20 to Table A.4.3.2-2","source":"Intel Corporation (UK) Ltd","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":565,"ainumber":"6.4.4","ainame":"\tRoutine Maintenance for TS 36.523-2","tdoc_agenda_sort_order":10882,"status":"agreed","reservation_date":"2018-03-05 13:50:15","uploaded":"2018-03-05 13:57:56","revisionof":"R5-181106","revisedto":"","release":"Rel-15","crspec":"36.523-2","crspecversion":"15.0.0","workitem":[{"winame":"TEI8_Test"}],"crnumber":1149.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-180104","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_78_Athens\/Docs\/R5-181159.zip","group":"R5","meeting":"R5-78","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-181160","title":"Removing the applicability of test case 22.4.17","source":"MediaTek Inc.","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":565,"ainumber":"6.4.4","ainame":"\tRoutine Maintenance for TS 36.523-2","tdoc_agenda_sort_order":112101,"status":"agreed","reservation_date":"2018-03-05 13:50:17","uploaded":"2018-03-05 13:57:56","revisionof":"R5-181121","revisedto":"","release":"Rel-15","crspec":"36.523-2","crspecversion":"15.0.0","workitem":[{"winame":"TEI13_Test"},{"winame":"NB_IOT-UEConTest"}],"crnumber":1151.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-180109","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_78_Athens\/Docs\/R5-181160.zip","group":"R5","meeting":"R5-78","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-181162","title":"Correction to applicability of CA test cases when executed using LAA band combination","source":"Keysight Technologies UK Ltd","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"to replace TDoc R5-180879 which will be covered in MCC TF160 maintenance part 3 CR","secretary_remarks":"","agenda_item_sort_order":565,"ainumber":"6.4.4","ainame":"\tRoutine Maintenance for TS 36.523-2","tdoc_agenda_sort_order":116200,"status":"agreed","reservation_date":"2018-03-05 13:50:20","uploaded":"2018-03-05 13:57:56","revisionof":"","revisedto":"","release":"Rel-15","crspec":"36.523-2","crspecversion":"15.0.0","workitem":[{"winame":"TEI13_Test"},{"winame":"LTE_LAA-UEConTest"}],"crnumber":1152.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-180109","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_78_Athens\/Docs\/R5-181162.zip","group":"R5","meeting":"R5-78","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]