[{"name":"R5-176089","title":"Correction to eMDT2 testcase 8.6.4.11","source":"Intel Corporation (UK) Ltd., Keysight Technologies UK Ltd.","contact":"Graham Brand","contact-id":43647,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":547,"ainumber":"6.4.3.3.5","ainame":"\tRRC LTE MDT (clause 8.6)","tdoc_agenda_sort_order":60890,"status":"agreed","reservation_date":"2017-11-09 23:52:32","uploaded":"2017-11-17 00:42:53","revisionof":"","revisedto":"","release":"Rel-14","crspec":"36.523-1","crspecversion":"14.2.0","workitem":[{"winame":"TEI13_Test"}],"crnumber":4258.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-172238","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_77_Reno\/Docs\/R5-176089.zip","group":"R5","meeting":"R5-77","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-176090","title":"Correction to eMDT2 testcase 8.6.1.3","source":"Intel Corporation (UK) Ltd., Keysight Technologies UK Ltd.","contact":"Graham Brand","contact-id":43647,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":547,"ainumber":"6.4.3.3.5","ainame":"\tRRC LTE MDT (clause 8.6)","tdoc_agenda_sort_order":60900,"status":"withdrawn","reservation_date":"2017-11-10 00:03:04","uploaded":"2017-11-17 00:42:53","revisionof":"","revisedto":"","release":"Rel-14","crspec":"36.523-1","crspecversion":"14.2.0","workitem":[{"winame":"TEI13_Test"}],"crnumber":4259.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_77_Reno\/Docs\/R5-176090.zip","group":"R5","meeting":"R5-77","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-176120","title":"Removal of MDT test case 8.6.5.4","source":"Qualcomm Incorporated","contact":"Ankit Banaudha","contact-id":58157,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":547,"ainumber":"6.4.3.3.5","ainame":"\tRRC LTE MDT (clause 8.6)","tdoc_agenda_sort_order":61200,"status":"agreed","reservation_date":"2017-11-11 14:39:54","uploaded":"2017-11-17 17:58:54","revisionof":"","revisedto":"","release":"Rel-14","crspec":"36.523-1","crspecversion":"14.2.0","workitem":[{"winame":"TEI11_Test"}],"crnumber":4260.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-172236","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_77_Reno\/Docs\/R5-176120.zip","group":"R5","meeting":"R5-77","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-176152","title":"Corrections to MDT test cases for LTE Bands>64","source":"MCC TF160","contact":"Olivier Genoud","contact-id":58316,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":547,"ainumber":"6.4.3.3.5","ainame":"\tRRC LTE MDT (clause 8.6)","tdoc_agenda_sort_order":61520,"status":"withdrawn","reservation_date":"2017-11-11 20:56:15","uploaded":null,"revisionof":"","revisedto":"","release":"Rel-14","crspec":"36.523-3","crspecversion":"14.1.0","workitem":[{"winame":"TEI10_Test"}],"crnumber":3962.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"","group":"R5","meeting":"R5-77","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-176653","title":"Correction to LTE<>IRAT testcases for IMS disabled over UMTS","source":"Anritsu Ltd., Qualcomm","contact":"Narendra Kalahasti","contact-id":59863,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":547,"ainumber":"6.4.3.3.5","ainame":"\tRRC LTE MDT (clause 8.6)","tdoc_agenda_sort_order":66530,"status":"revised","reservation_date":"2017-11-17 06:36:42","uploaded":"2017-11-17 06:52:54","revisionof":"","revisedto":"R5-176898","release":"Rel-14","crspec":"36.523-1","crspecversion":"14.2.0","workitem":[{"winame":"TEI10_Test"}],"crnumber":4318.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_77_Reno\/Docs\/R5-176653.zip","group":"R5","meeting":"R5-77","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-176846","title":"Corrections to MDT test cases for LTE Bands>64","source":"MCC TF160","contact":"Olivier Genoud","contact-id":58316,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":547,"ainumber":"6.4.3.3.5","ainame":"\tRRC LTE MDT (clause 8.6)","tdoc_agenda_sort_order":68460,"status":"revised","reservation_date":"2017-11-17 22:19:39","uploaded":"2017-11-17 22:25:07","revisionof":"","revisedto":"R5-176899","release":"Rel-14","crspec":"36.523-1","crspecversion":"14.2.0","workitem":[{"winame":"TEI10_Test"}],"crnumber":4358.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_77_Reno\/Docs\/R5-176846.zip","group":"R5","meeting":"R5-77","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-176898","title":"Correction to LTE<>IRAT testcases for IMS disabled over UMTS","source":"Anritsu Ltd., Qualcomm","contact":"Mathieu Mangion","contact-id":27904,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":547,"ainumber":"6.4.3.3.5","ainame":"\tRRC LTE MDT (clause 8.6)","tdoc_agenda_sort_order":66531,"status":"agreed","reservation_date":"2017-12-05 14:03:06","uploaded":"2017-12-05 14:07:54","revisionof":"R5-176653","revisedto":"","release":"Rel-14","crspec":"36.523-1","crspecversion":"14.2.0","workitem":[{"winame":"TEI10_Test"}],"crnumber":4318.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-172235","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_77_Reno\/Docs\/R5-176898.zip","group":"R5","meeting":"R5-77","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-176899","title":"Corrections to MDT test cases for LTE Bands>64","source":"MCC TF160","contact":"Mathieu Mangion","contact-id":27904,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":547,"ainumber":"6.4.3.3.5","ainame":"\tRRC LTE MDT (clause 8.6)","tdoc_agenda_sort_order":68461,"status":"agreed","reservation_date":"2017-12-05 14:03:07","uploaded":"2017-12-05 14:07:54","revisionof":"R5-176846","revisedto":"","release":"Rel-14","crspec":"36.523-1","crspecversion":"14.2.0","workitem":[{"winame":"TEI10_Test"}],"crnumber":4358.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-172235","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_77_Reno\/Docs\/R5-176899.zip","group":"R5","meeting":"R5-77","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]