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{"name":"R5-162126","title":"Correction of MBMS test case 17.1.4","source":"LG Electronics Inc.","contact":"Byoung Hak Jeong","contact-id":65611,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":374,"ainumber":"6.4.3","ainame":"Routine Maintenance for TS 36.523-1","tdoc_agenda_sort_order":21260,"status":"withdrawn","reservation_date":"2016-05-09 07:53:09","uploaded":"2016-05-09 07:55:48","revisionof":"","revisedto":"","release":"Rel-13","crspec":"36.523-1","crspecversion":"13.0.0","workitem":[{"winame":"TEI10_Test"}],"crnumber":3382.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_71_Nanjing\/Docs\/R5-162126.zip","group":"R5","meeting":"R5-71","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]