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{"name":"R5-204495","title":"Correction to test applicability for sTTI test cases","source":"Huawei, Hisilicon","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":455,"ainumber":"6.3.6.4","ainame":"\tTS 36.523-2","tdoc_agenda_sort_order":39261,"status":"agreed","reservation_date":"2020-09-02 09:11:38","uploaded":"2020-09-02 09:21:14","revisionof":"R5-203926","revisedto":"","release":"Rel-16","crspec":"36.523-2","crspecversion":"16.5.0","workitem":[{"winame":"LTE_sTTIandPT-UEConTest"}],"crnumber":1318.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-201455","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_88_Electronic\/Docs\/R5-204495.zip","group":"R5","meeting":"R5-88-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]