[{"name":"R5-162370","title":"Applicability updates for Dual Connectivity tests 8.2.2.9.5 and 8.5.1.8.2","source":"BlackBerry UK Limited, Ericsson","contact":"Claude Arzelier","contact-id":14266,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":268,"ainumber":"6.3.6.3","ainame":"TS 36.523-2","tdoc_agenda_sort_order":23700,"status":"agreed","reservation_date":"2016-05-12 13:48:05","uploaded":"2016-05-12 14:41:59","revisionof":"","revisedto":"","release":"Rel-13","crspec":"36.523-2","crspecversion":"13.0.0","workitem":[{"winame":"LTE_SC_enh_dualC-UEConTest"}],"crnumber":850.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-160837","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_71_Nanjing\/Docs\/R5-162370.zip","group":"R5","meeting":"R5-71","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-162444","title":"Add applicability for new dual connectivity test cases","source":"Ericsson","contact":"Bo J\u00f6nsson","contact-id":37092,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":268,"ainumber":"6.3.6.3","ainame":"TS 36.523-2","tdoc_agenda_sort_order":24440,"status":"revised","reservation_date":"2016-05-12 22:04:15","uploaded":"2016-05-13 18:48:28","revisionof":"","revisedto":"R5-163034","release":"Rel-13","crspec":"36.523-2","crspecversion":"13.0.0","workitem":[{"winame":"LTE_SC_enh_dualC-UEConTest"}],"crnumber":853.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_71_Nanjing\/Docs\/R5-162444.zip","group":"R5","meeting":"R5-71","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-162452","title":"Applicability of new test cases 7.1.4.26.1 \/ 8.2.2.9.3 \/ 8.2.2.9.4","source":"LG Electronics Inc.","contact":"Byoung Hak Jeong","contact-id":65611,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":268,"ainumber":"6.3.6.3","ainame":"TS 36.523-2","tdoc_agenda_sort_order":24520,"status":"agreed","reservation_date":"2016-05-13 01:54:24","uploaded":"2016-05-13 02:33:30","revisionof":"","revisedto":"","release":"Rel-13","crspec":"36.523-2","crspecversion":"13.0.0","workitem":[{"winame":"LTE_SC_enh_dualC-UEConTest"}],"crnumber":855.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-160837","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_71_Nanjing\/Docs\/R5-162452.zip","group":"R5","meeting":"R5-71","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-163034","title":"Add applicability for new dual connectivity test cases","source":"Ericsson","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":268,"ainumber":"6.3.6.3","ainame":"TS 36.523-2","tdoc_agenda_sort_order":24441,"status":"agreed","reservation_date":"2016-05-31 13:30:49","uploaded":"2016-08-31 15:49:15","revisionof":"R5-162444","revisedto":"","release":"Rel-13","crspec":"36.523-2","crspecversion":"13.0.0","workitem":[{"winame":"LTE_SC_enh_dualC-UEConTest"}],"crnumber":853.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-160837","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_71_Nanjing\/Docs\/R5-163034.zip","group":"R5","meeting":"R5-71","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]