[{"name":"R5-210626","title":"Correction to Table 6.4.1-11 USIM Configuration 11","source":"Huawei, Hisilicon","contact":"Yuchun Wu","contact-id":77331,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":506,"ainumber":"6.3.2.1.4","ainame":"\tTest environment for SIG (Clause 6)","tdoc_agenda_sort_order":6260,"status":"agreed","reservation_date":"2021-02-07 01:55:59","uploaded":"2021-02-08 03:08:30","revisionof":"","revisedto":"","release":"Rel-16","crspec":"38.508-1","crspecversion":"16.6.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":1717.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-210132","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-210626.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-211033","title":"Correction test frequencies for CA_n261(2A) for protocol testing","source":"Ericsson","contact":"Leif Mattisson","contact-id":10602,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":506,"ainumber":"6.3.2.1.4","ainame":"\tTest environment for SIG (Clause 6)","tdoc_agenda_sort_order":10330,"status":"agreed","reservation_date":"2021-02-08 10:14:51","uploaded":"2021-02-08 18:30:38","revisionof":"","revisedto":"","release":"Rel-16","crspec":"38.508-1","crspecversion":"16.6.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":1760.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-210132","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-211033.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-211034","title":"Correction of protocol applicability for test frequencies for DC_xA_n261(2A) configurations","source":"Ericsson","contact":"Leif Mattisson","contact-id":10602,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":506,"ainumber":"6.3.2.1.4","ainame":"\tTest environment for SIG (Clause 6)","tdoc_agenda_sort_order":10340,"status":"agreed","reservation_date":"2021-02-08 10:14:53","uploaded":"2021-02-08 18:30:38","revisionof":"","revisedto":"","release":"Rel-16","crspec":"38.508-1","crspecversion":"16.6.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":1761.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-210132","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-211034.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]