[{"name":"R5-162662","title":"NB-IoT SIG Test Issues for discussion","source":"CATT, CMCC, TDIA, StarPoint","contact":"Xiaozhong Chen","contact-id":50266,"tdoctype":"discussion","for":"Discussion","abstract":"New Test States\nNew Test loop function:\nThe existing UE test loop functions for layer 2 (MAC, RLC, PDCP) and data radio bearer testing of Legacy LTE are based on DRB data\u2019s loopback through User Plane.\nIt has been agreed that CP solution is mandatory f","secretary_remarks":"","agenda_item_sort_order":346,"ainumber":"6.3.17.","ainame":"General Papers, Work Plan, TC lists","tdoc_agenda_sort_order":26620,"status":"revised","reservation_date":"2016-05-13 14:46:40","uploaded":"2016-05-13 15:28:13","revisionof":"","revisedto":"R5-162769","release":"Rel-13","crspec":"","crspecversion":"","workitem":[{"winame":"NB_IOT-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_71_Nanjing\/Docs\/R5-162662.zip","group":"R5","meeting":"R5-71","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-162747","title":"NB-IOT Protocol testing development","source":"Samsung","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Discussion","abstract":"This contribution suggests NB-IOT Protocol testing development tests structure and provides some guidance on developing TC scope and TC prose with the aim at facilitating the on time completion of the NB-IOT RAN5 Protocol conformance testing project.\n2\tT","secretary_remarks":"","agenda_item_sort_order":346,"ainumber":"6.3.17.","ainame":"General Papers, Work Plan, TC lists","tdoc_agenda_sort_order":274700,"status":"noted","reservation_date":"2016-05-31 13:24:38","uploaded":"2016-08-31 15:49:13","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_71_Nanjing\/Docs\/R5-162747.zip","group":"R5","meeting":"R5-71","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-162769","title":"NB-IoT SIG Test Issues for discussion","source":"CATT, CMCC, TDIA, StarPoint","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":346,"ainumber":"6.3.17.","ainame":"General Papers, Work Plan, TC lists","tdoc_agenda_sort_order":26621,"status":"noted","reservation_date":"2016-05-31 13:25:00","uploaded":"2016-08-31 15:49:14","revisionof":"R5-162662","revisedto":"","release":"Rel-13","crspec":"","crspecversion":"","workitem":[{"winame":"NB_IOT-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_71_Nanjing\/Docs\/R5-162769.zip","group":"R5","meeting":"R5-71","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]