[{"name":"R5-170987","title":"Applicability of V2V SIG test cases","source":"Huawei","contact":"Chunying Gu","contact-id":65493,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":346,"ainumber":"6.3.16.3","ainame":"\tTS 36.523-2","tdoc_agenda_sort_order":9870,"status":"agreed","reservation_date":"2017-02-03 03:02:25","uploaded":"2017-02-17 11:37:27","revisionof":"","revisedto":"","release":"Rel-14","crspec":"36.523-2","crspecversion":"14.0.0","workitem":[{"winame":"LTE_SL_V2V-UEConTest"}],"crnumber":973.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-170091","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_74_Athens\/Docs\/R5-170987.zip","group":"R5","meeting":"R5-74","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]