[{"name":"R5-165327","title":"Prioritisation of NB-IoT Signalling Test Cases","source":"Vodafone GmbH","contact":"Petra Rauer","contact-id":16070,"tdoctype":"discussion","for":"","abstract":"At RAN5#71 RAN5 agreed a way forward ensuring that the industry demand for on time delivery of high quality NB-IoT conformance testing is fulfilled.\nOne of the agreements for TS 36.523-1 is the consideration of prioritisation of the test case list to ens","secretary_remarks":"","agenda_item_sort_order":358,"ainumber":"6.3.16.","ainame":"\tGeneral Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":53270,"status":"noted","reservation_date":"2016-08-10 12:17:29","uploaded":"2016-08-12 14:08:13","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_72_Gothenburg\/Docs\/R5-165327.zip","group":"R5","meeting":"R5-72","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-165472","title":"NB-IoT CIoT EMM ESM conformance testing","source":"Samsung","contact":"Stoyan Baev","contact-id":2367,"tdoctype":"discussion","for":"Decision","abstract":"The present document describes the findings and provides proposal for Protocol TCs for NB-IoT devices (UE in NB-S1) intended for verifying CIoT requirements as specified in TS 24.301. Among others the following areas are covered (some RRC requirements are","secretary_remarks":"","agenda_item_sort_order":358,"ainumber":"6.3.16.","ainame":"\tGeneral Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":54720,"status":"revised","reservation_date":"2016-08-11 13:07:47","uploaded":"2016-08-11 14:07:21","revisionof":"","revisedto":"R5-166276","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_72_Gothenburg\/Docs\/R5-165472.zip","group":"R5","meeting":"R5-72","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-165602","title":"Discussion on NB-IoT SIG Testcase list","source":"CATT","contact":"Xiaozhong Chen","contact-id":50266,"tdoctype":"discussion","for":"","abstract":"At RAN5#70 meeting NB-IoT WI was approved, it is agreed by RAN that signalling test cases for NB-IoT shall be designed in 36.523-1. The first draft version of testcase list is presented in RAN5#71 for reference and works for sub-section rapporteurs are as","secretary_remarks":"","agenda_item_sort_order":358,"ainumber":"6.3.16.","ainame":"\tGeneral Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":56020,"status":"revised","reservation_date":"2016-08-12 03:18:20","uploaded":"2016-08-19 10:17:15","revisionof":"","revisedto":"R5-166277","release":"Rel-13","crspec":"","crspecversion":"","workitem":[{"winame":"NB_IOT-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_72_Gothenburg\/Docs\/R5-165602.zip","group":"R5","meeting":"R5-72","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-165749","title":"Discussion NB-IoT testing frequencies definition","source":"Keysight Technologies UK Ltd","contact":"Emilio Ruiz","contact-id":62021,"tdoctype":"discussion","for":"Agreement","abstract":"R5-164063.\nIn RAN#71, a new WI was approved for NB-IoT. In RAN5#71, the work plan for this work item was endorsed.\nAccording to the approved work plan, it is necessary to define testing frequencies into TS 36.508.\nThis document provides an analysis on","secretary_remarks":"","agenda_item_sort_order":358,"ainumber":"6.3.16.","ainame":"\tGeneral Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":57490,"status":"noted","reservation_date":"2016-08-12 14:23:17","uploaded":"2016-08-12 21:15:01","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"NB_IOT-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_72_Gothenburg\/Docs\/R5-165749.zip","group":"R5","meeting":"R5-72","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-165755","title":"Discussion NB-IoT UE Test States optimisation","source":"Keysight Technologies UK Ltd","contact":"Emilio Ruiz","contact-id":62021,"tdoctype":"discussion","for":"Endorsement","abstract":"NB-IoT UE Test States are missing in TS 36.508 v13.0.1. Addition of new NB-IoT UE Test States are required to complete the NB-IoT test cases defined in WP.\nThis document describes current status of NB-IoT UE test states discussions held during RAN5#1-IoT","secretary_remarks":"","agenda_item_sort_order":358,"ainumber":"6.3.16.","ainame":"\tGeneral Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":57550,"status":"noted","reservation_date":"2016-08-12 14:50:14","uploaded":"2016-08-12 21:15:01","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"NB_IOT-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_72_Gothenburg\/Docs\/R5-165755.zip","group":"R5","meeting":"R5-72","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-165760","title":"NB-IoT - Working assumptions for Test Model design","source":"MCC TF160","contact":"Olivier Genoud","contact-id":58316,"tdoctype":"discussion","for":"Information","abstract":"Following RAN5#71 and as indicated in R5-163093, MCC TF160 has started Test Model analysis for NB-IoT signaling conformance testing and had a first synchronization point with the SS Vendors at the Workshop#34 on 7th July 2016, where TF160 made a presentat","secretary_remarks":"","agenda_item_sort_order":358,"ainumber":"6.3.16.","ainame":"\tGeneral Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":57600,"status":"noted","reservation_date":"2016-08-12 15:13:02","uploaded":"2016-08-19 10:08:20","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_72_Gothenburg\/Docs\/R5-165760.zip","group":"R5","meeting":"R5-72","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-165780","title":"Discussion paper on UE test functions for NB-IoT","source":"Ericsson","contact":"Leif Mattisson","contact-id":10602,"tdoctype":"discussion","for":"Endorsement","abstract":"The purpose of this paper is to discuss the need for specific UE test functions for conformance testing of NB-IoT. The paper also proposes a way forward. \n2.\tDiscussion\nThe different testing areas that need to be considered are:\n\u2022\tRF transmitter testin","secretary_remarks":"","agenda_item_sort_order":358,"ainumber":"6.3.16.","ainame":"\tGeneral Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":57800,"status":"revised","reservation_date":"2016-08-12 16:28:06","uploaded":"2016-08-12 16:34:57","revisionof":"","revisedto":"R5-165903","release":"Rel-13","crspec":"","crspecversion":"","workitem":[{"winame":"NB_IOT-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_72_Gothenburg\/Docs\/R5-165780.zip","group":"R5","meeting":"R5-72","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-165903","title":"Discussion paper on UE test functions for NB-IoT","source":"Ericsson","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":358,"ainumber":"6.3.16.","ainame":"\tGeneral Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":57801,"status":"noted","reservation_date":"2016-08-30 12:42:20","uploaded":"2016-08-31 14:46:50","revisionof":"R5-165780","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"NB_IOT-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_72_Gothenburg\/Docs\/R5-165903.zip","group":"R5","meeting":"R5-72","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-166276","title":"NB-IoT CIoT EMM ESM conformance testing","source":"Samsung","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Decision","abstract":"","secretary_remarks":"","agenda_item_sort_order":358,"ainumber":"6.3.16.","ainame":"\tGeneral Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":54721,"status":"noted","reservation_date":"2016-08-30 12:44:18","uploaded":"2016-08-31 14:46:51","revisionof":"R5-165472","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_72_Gothenburg\/Docs\/R5-166276.zip","group":"R5","meeting":"R5-72","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]