[{"name":"R5-220592","title":"Correction to test loop procedures for SL test","source":"Huawei, Hisilicon","contact":"Yuchun Wu","contact-id":77331,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":717,"ainumber":"6.3.10.3","ainame":"TS 38.509","tdoc_agenda_sort_order":5920,"status":"revised","reservation_date":"2022-02-10 06:16:18","uploaded":"2022-02-11 08:34:38","revisionof":"","revisedto":"R5-221516","release":"Rel-16","crspec":"38.509","crspecversion":"16.3.0","workitem":[{"winame":"5G_V2X_NRSL_eV2XARC-UEConTest"}],"crnumber":54.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_94_Electronic\/Docs\/R5-220592.zip","group":"R5","meeting":"R5-94-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-220593","title":"Correction to test protocol messages for SL test","source":"Huawei, Hisilicon","contact":"Yuchun Wu","contact-id":77331,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":717,"ainumber":"6.3.10.3","ainame":"TS 38.509","tdoc_agenda_sort_order":5930,"status":"revised","reservation_date":"2022-02-10 06:16:19","uploaded":"2022-02-11 08:34:38","revisionof":"","revisedto":"R5-221517","release":"Rel-16","crspec":"38.509","crspecversion":"16.3.0","workitem":[{"winame":"5G_V2X_NRSL_eV2XARC-UEConTest"}],"crnumber":55.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_94_Electronic\/Docs\/R5-220593.zip","group":"R5","meeting":"R5-94-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-221516","title":"Correction to test loop procedures for SL test","source":"Huawei, Hisilicon","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":717,"ainumber":"6.3.10.3","ainame":"TS 38.509","tdoc_agenda_sort_order":5921,"status":"agreed","reservation_date":"2022-03-06 15:04:19","uploaded":"2022-03-08 07:51:14","revisionof":"R5-220592","revisedto":"","release":"Rel-16","crspec":"38.509","crspecversion":"16.3.0","workitem":[{"winame":"5G_V2X_NRSL_eV2XARC-UEConTest"}],"crnumber":54.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-220093","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_94_Electronic\/Docs\/R5-221516.zip","group":"R5","meeting":"R5-94-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-221517","title":"Correction to test protocol messages for SL test","source":"Huawei, Hisilicon","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":717,"ainumber":"6.3.10.3","ainame":"TS 38.509","tdoc_agenda_sort_order":5931,"status":"agreed","reservation_date":"2022-03-06 15:04:20","uploaded":"2022-03-08 07:51:14","revisionof":"R5-220593","revisedto":"","release":"Rel-16","crspec":"38.509","crspecversion":"16.3.0","workitem":[{"winame":"5G_V2X_NRSL_eV2XARC-UEConTest"}],"crnumber":55.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-220093","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_94_Electronic\/Docs\/R5-221517.zip","group":"R5","meeting":"R5-94-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]