[{"name":"R4-2112544","title":"Remaining issues on PRS RSTD accuracy requirements","source":"vivo","contact":"Qian Yang","contact-id":89939,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"[100-e][210] NR_pos_2","agenda_item_sort_order":140,"ainumber":"6.1.6.2.2.2.1","ainame":"PRS RSTD","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2021-08-06 03:04:27","uploaded":"2021-08-06 15:34:55","revisionof":"","revisedto":"","release":"Rel-16","crspec":"","crspecversion":"","workitem":[{"winame":"NR_pos-Perf"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_100-e\/Docs\/R4-2112544.zip","group":"R4","meeting":"R4-100-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2113154","title":"Discussion on NR PRS RSTD measurement accuracy requirements","source":"Intel Corporation","contact":"Andrey Chervyakov","contact-id":47232,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"[100-e][210] NR_pos_2","agenda_item_sort_order":140,"ainumber":"6.1.6.2.2.2.1","ainame":"PRS RSTD","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2021-08-06 09:25:06","uploaded":"2021-08-06 22:12:48","revisionof":"","revisedto":"","release":"Rel-16","crspec":"","crspecversion":"","workitem":[{"winame":"NR_pos-Perf"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_100-e\/Docs\/R4-2113154.zip","group":"R4","meeting":"R4-100-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2113264","title":"Discussion on PRS RSTD accuracy requirements","source":"OPPO","contact":"Roy Hu","contact-id":77326,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"[100-e][210] NR_pos_2","agenda_item_sort_order":140,"ainumber":"6.1.6.2.2.2.1","ainame":"PRS RSTD","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2021-08-06 10:09:13","uploaded":"2021-08-06 11:16:39","revisionof":"","revisedto":"","release":"Rel-16","crspec":"","crspecversion":"","workitem":[{"winame":"NR_pos-Perf"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_100-e\/Docs\/R4-2113264.zip","group":"R4","meeting":"R4-100-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2114196","title":"On PRS-RSTD measurement accuracy requirements","source":"Qualcomm Incorporated","contact":"Carlos Cabrera-Mercader","contact-id":88732,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"[100-e][210] NR_pos_2","agenda_item_sort_order":140,"ainumber":"6.1.6.2.2.2.1","ainame":"PRS RSTD","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2021-08-06 15:31:11","uploaded":"2021-08-06 21:13:49","revisionof":"","revisedto":"","release":"Rel-16","crspec":"","crspecversion":"","workitem":[{"winame":"NR_pos-Perf"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_100-e\/Docs\/R4-2114196.zip","group":"R4","meeting":"R4-100-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2114282","title":"Discussion on accuracy requirements for RSTD measurement","source":"Huawei, HiSilicon","contact":"Jing Han","contact-id":47284,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"[100-e][210] NR_pos_2","agenda_item_sort_order":140,"ainumber":"6.1.6.2.2.2.1","ainame":"PRS RSTD","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2021-08-06 16:58:02","uploaded":"2021-08-06 17:23:03","revisionof":"","revisedto":"","release":"Rel-16","crspec":"","crspecversion":"","workitem":[{"winame":"NR_pos-Perf"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_100-e\/Docs\/R4-2114282.zip","group":"R4","meeting":"R4-100-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2114283","title":"CR on accuracy requirements for RSTD measurement","source":"Huawei, HiSilicon","contact":"Jing Han","contact-id":47284,"tdoctype":"draftCR","for":"Endorsement","abstract":"","secretary_remarks":"[100-e][210] NR_pos_2","agenda_item_sort_order":140,"ainumber":"6.1.6.2.2.2.1","ainame":"PRS RSTD","tdoc_agenda_sort_order":0,"status":"revised","reservation_date":"2021-08-06 16:58:15","uploaded":"2021-08-06 17:23:03","revisionof":"","revisedto":"R4-2115308","release":"Rel-16","crspec":"38.133","crspecversion":"16.8.0","workitem":[{"winame":"NR_pos-Perf"}],"crnumber":"","crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_100-e\/Docs\/R4-2114283.zip","group":"R4","meeting":"R4-100-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2114284","title":"CR on accuracy requirements for RSTD measurement R17","source":"Huawei, HiSilicon","contact":"Jing Han","contact-id":47284,"tdoctype":"draftCR","for":"Endorsement","abstract":"","secretary_remarks":"[100-e][210] NR_pos_2","agenda_item_sort_order":140,"ainumber":"6.1.6.2.2.2.1","ainame":"PRS RSTD","tdoc_agenda_sort_order":0,"status":"endorsed","reservation_date":"2021-08-06 16:58:15","uploaded":"2021-08-30 09:31:10","revisionof":"","revisedto":"","release":"Rel-17","crspec":"38.133","crspecversion":"17.2.0","workitem":[{"winame":"NR_pos-Perf"}],"crnumber":"","crrevision":"","crcategory":"A","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_100-e\/Docs\/R4-2114284.zip","group":"R4","meeting":"R4-100-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2115308","title":"CR on accuracy requirements for RSTD measurement","source":"Huawei, HiSilicon","contact":"Carolyn Taylor","contact-id":90657,"tdoctype":"draftCR","for":"Endorsement","abstract":"","secretary_remarks":"[100-e][210] NR_pos_2","agenda_item_sort_order":140,"ainumber":"6.1.6.2.2.2.1","ainame":"PRS RSTD","tdoc_agenda_sort_order":0,"status":"endorsed","reservation_date":"2021-08-07 03:43:58","uploaded":"2021-08-26 19:31:13","revisionof":"R4-2114283","revisedto":"","release":"Rel-16","crspec":"38.133","crspecversion":"16.8.0","workitem":[{"winame":"NR_pos-Perf"}],"crnumber":"","crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_100-e\/Docs\/R4-2115308.zip","group":"R4","meeting":"R4-100-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]