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{"name":"R5-224488","title":"Correction of Default Configuration Parameters for Test 1 in Test Case 7.1.11","source":"STMicroelectronics","contact":"Dina Attia","contact-id":89979,"tdoctype":"CR","for":"Agreement","abstract":"RAN4 has changed the configurations for Test case 7.1.11 Test 1 in 36.133 due to R4-2210985 CR 7148. Thus the same changes need to be done for this test case in 36.521-3 to keep the specifications consistent","secretary_remarks":"","agenda_item_sort_order":720,"ainumber":"5.5.1.5","ainame":"TS 36.521-3","tdoc_agenda_sort_order":44880,"status":"withdrawn","reservation_date":"2022-08-04 18:14:14","uploaded":"2022-08-04 19:28:15","revisionof":"","revisedto":"","release":"Rel-15","crspec":"36.521-3","crspecversion":"15.6.0","workitem":[{"winame":"TEI13_Test"}],"crnumber":2648.0,"crrevision":"","crcategory":"A","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_96_Electronic\/Docs\/R5-224488.zip","group":"R5","meeting":"R5-96-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-224489","title":"Correction of Default Configuration Parameters for Test 1 in Test Case 7.1.11","source":"STMicroelectronics","contact":"Dina Attia","contact-id":89979,"tdoctype":"CR","for":"Agreement","abstract":"RAN4 has changed the configurations for Test case 7.1.11 Test 1 in 36.133 due to R4-2210985 CR 7148. Thus the same changes need to be done for this test case in 36.521-3 to keep the specifications consistent.","secretary_remarks":"","agenda_item_sort_order":720,"ainumber":"5.5.1.5","ainame":"TS 36.521-3","tdoc_agenda_sort_order":44890,"status":"withdrawn","reservation_date":"2022-08-04 18:21:06","uploaded":"2022-08-04 19:28:32","revisionof":"","revisedto":"","release":"Rel-14","crspec":"36.521-3","crspecversion":"14.5.0","workitem":[{"winame":"TEI13_Test"}],"crnumber":2649.0,"crrevision":"","crcategory":"A","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_96_Electronic\/Docs\/R5-224489.zip","group":"R5","meeting":"R5-96-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-224490","title":"Correction of Default Configuration Parameters for Test 1 in Test Case 7.1.11","source":"STMicroelectronics","contact":"Dina Attia","contact-id":89979,"tdoctype":"CR","for":"Agreement","abstract":"RAN4 has changed the configurations for Test case 7.1.11 Test 1 in 36.133 due to R4-2210985 CR 7148. Thus the same changes need to be done for this test case in 36.521-3 to keep the specifications consistent","secretary_remarks":"","agenda_item_sort_order":720,"ainumber":"5.5.1.5","ainame":"TS 36.521-3","tdoc_agenda_sort_order":44900,"status":"withdrawn","reservation_date":"2022-08-04 18:26:18","uploaded":"2022-08-04 19:28:51","revisionof":"","revisedto":"","release":"Rel-13","crspec":"36.521-3","crspecversion":"13.2.0","workitem":[{"winame":"TEI13_Test"}],"crnumber":2650.0,"crrevision":"","crcategory":"A","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_96_Electronic\/Docs\/R5-224490.zip","group":"R5","meeting":"R5-96-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-224840","title":"Update to V2X test case 12.1.2","source":"Huawei, HiSilicon","contact":"Chunying Gu","contact-id":65493,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":720,"ainumber":"5.5.1.5","ainame":"TS 36.521-3","tdoc_agenda_sort_order":48400,"status":"agreed","reservation_date":"2022-08-07 08:14:40","uploaded":"2022-08-07 08:39:06","revisionof":"","revisedto":"","release":"Rel-16","crspec":"36.521-3","crspecversion":"16.13.0","workitem":[{"winame":"TEI14_Test"},{"winame":" LTE_V2X-UEConTest"}],"crnumber":2652.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-221996","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_96_Electronic\/Docs\/R5-224840.zip","group":"R5","meeting":"R5-96-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-225837","title":"Correction of Default Configuration Parameters for Test 1 in Test Case 7.1.11","source":"STMicroelectronics","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":720,"ainumber":"5.5.1.5","ainame":"TS 36.521-3","tdoc_agenda_sort_order":44871,"status":"agreed","reservation_date":"2022-09-01 08:45:23","uploaded":"2022-09-01 08:51:20","revisionof":"R5-224487","revisedto":"","release":"Rel-16","crspec":"36.521-3","crspecversion":"16.13.0","workitem":[{"winame":"TEI13_Test"}],"crnumber":2647.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-221996","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_96_Electronic\/Docs\/R5-225837.zip","group":"R5","meeting":"R5-96-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]