[{"name":"R4-1702755","title":"PDSCH allocation parameters for UE Cat M1 RSRP Test Cases","source":"ANRITSU LTD","contact":"Ian Rose","contact-id":9381,"tdoctype":"CR","for":"","abstract":"Change the PDSCH allocation to for example \u00a1\u00b0Follows R.20 FDD\u00a1\u00b1, since the PDSCH allocation in the Test system must follow the Frequency hopping pattern of the PDSCH Reference channel.","secretary_remarks":"","agenda_item_sort_order":50,"ainumber":"5.4.5.1","ainame":"Test cases for CE Mode A [LTE_MTCe2_L1-Perf]","tdoc_agenda_sort_order":27550,"status":"agreed","reservation_date":"2017-03-22 15:55:14","uploaded":"2017-03-23 10:14:33","revisionof":"","revisedto":"","release":"Rel-13","crspec":"36.133","crspecversion":"13.7.0","workitem":[{"winame":"LTE_MTCe2_L1-Perf"}],"crnumber":4602.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-171309","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_82Bis\/Docs\/R4-1702755.zip","group":"R4","meeting":"R4-82","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1702756","title":"PDSCH allocation parameters for UE Cat M1 RSRP Test Cases","source":"ANRITSU LTD","contact":"Ian Rose","contact-id":9381,"tdoctype":"CR","for":"","abstract":"Change the PDSCH allocation to for example \u00a1\u00b0Follows R.20 FDD\u00a1\u00b1, since the PDSCH allocation in the Test system must follow the Frequency hopping pattern of the PDSCH Reference channel.","secretary_remarks":"","agenda_item_sort_order":50,"ainumber":"5.4.5.1","ainame":"Test cases for CE Mode A [LTE_MTCe2_L1-Perf]","tdoc_agenda_sort_order":27560,"status":"agreed","reservation_date":"2017-03-22 15:58:19","uploaded":"2017-04-13 08:27:23","revisionof":"","revisedto":"","release":"Rel-14","crspec":"36.133","crspecversion":"14.3.0","workitem":[{"winame":"LTE_MTCe2_L1-Perf"}],"crnumber":4603.0,"crrevision":"","crcategory":"A","tsg_crp":"RP-171309","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_82Bis\/Docs\/R4-1702756.zip","group":"R4","meeting":"R4-82","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1703165","title":"Correction to event triggered reporting test cases in eMTC","source":"Qualcomm Incorporated","contact":"Achaleshwar Sahai","contact-id":63246,"tdoctype":"CR","for":"Approval","abstract":"Test case is modified to prevent collision of first MPDCCH and Gap","secretary_remarks":"Post-meeting note: It was noted before RAN#76 that there is a cover sheet error. So it was revised to R4-1704379","agenda_item_sort_order":50,"ainumber":"5.4.5.1","ainame":"Test cases for CE Mode A [LTE_MTCe2_L1-Perf]","tdoc_agenda_sort_order":31650,"status":"revised","reservation_date":"2017-03-23 23:59:19","uploaded":"2017-03-24 20:16:16","revisionof":"","revisedto":"R4-1704379","release":"Rel-13","crspec":"36.133","crspecversion":"13.7.0","workitem":[{"winame":"LTE_MTCe2_L1-Perf"}],"crnumber":4713.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_82Bis\/Docs\/R4-1703165.zip","group":"R4","meeting":"R4-82","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1703166","title":"Correction to event triggered reporting test cases in eMTC","source":"Qualcomm Incorporated","contact":"Achaleshwar Sahai","contact-id":63246,"tdoctype":"CR","for":"Approval","abstract":"Mirror CR","secretary_remarks":"","agenda_item_sort_order":50,"ainumber":"5.4.5.1","ainame":"Test cases for CE Mode A [LTE_MTCe2_L1-Perf]","tdoc_agenda_sort_order":31660,"status":"agreed","reservation_date":"2017-03-23 23:59:20","uploaded":"2017-04-13 08:27:24","revisionof":"","revisedto":"","release":"Rel-14","crspec":"36.133","crspecversion":"14.3.0","workitem":[{"winame":"LTE_MTCe2_L1-Perf"}],"crnumber":4714.0,"crrevision":"","crcategory":"A","tsg_crp":"RP-171309","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_82Bis\/Docs\/R4-1703166.zip","group":"R4","meeting":"R4-82","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1703710","title":"CR on RA test for Cat-M1 normal coverage R13","source":"Nokia, Alcatel-Lucent Shanghai Bell","contact":"Li Zhang","contact-id":73602,"tdoctype":"CR","for":"Approval","abstract":"CR on RA test for Cat-M1 normal coverage R13","secretary_remarks":"","agenda_item_sort_order":50,"ainumber":"5.4.5.1","ainame":"Test cases for CE Mode A [LTE_MTCe2_L1-Perf]","tdoc_agenda_sort_order":37100,"status":"agreed","reservation_date":"2017-03-24 14:37:11","uploaded":"2017-03-24 21:55:02","revisionof":"","revisedto":"","release":"Rel-13","crspec":"36.133","crspecversion":"13.7.0","workitem":[{"winame":"LTE_MTCe2_L1-Perf"}],"crnumber":4818.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-171309","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_82Bis\/Docs\/R4-1703710.zip","group":"R4","meeting":"R4-82","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1703711","title":"CR on RA test for Cat-M1 normal coverage R14","source":"Nokia, Alcatel-Lucent Shanghai Bell","contact":"Li Zhang","contact-id":73602,"tdoctype":"CR","for":"Approval","abstract":"CR on RA test for Cat-M1 normal coverage R14","secretary_remarks":"","agenda_item_sort_order":50,"ainumber":"5.4.5.1","ainame":"Test cases for CE Mode A [LTE_MTCe2_L1-Perf]","tdoc_agenda_sort_order":37110,"status":"agreed","reservation_date":"2017-03-24 14:37:12","uploaded":"2017-04-13 08:27:24","revisionof":"","revisedto":"","release":"Rel-14","crspec":"36.133","crspecversion":"14.3.0","workitem":[{"winame":"LTE_MTCe2_L1-Perf"}],"crnumber":4819.0,"crrevision":"","crcategory":"A","tsg_crp":"RP-171309","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_82Bis\/Docs\/R4-1703711.zip","group":"R4","meeting":"R4-82","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1704379","title":"Correction to event triggered reporting test cases in eMTC","source":"Qualcomm Incorporated","contact":"Achaleshwar Sahai","contact-id":63246,"tdoctype":"CR","for":"Approval","abstract":"Test case is modified to prevent collision of first MPDCCH and Gap","secretary_remarks":"","agenda_item_sort_order":50,"ainumber":"5.4.5.1","ainame":"Test cases for CE Mode A [LTE_MTCe2_L1-Perf]","tdoc_agenda_sort_order":31650,"status":"agreed","reservation_date":"2017-06-02 08:39:39","uploaded":"2017-07-10 09:10:12","revisionof":"R4-1703165","revisedto":"","release":"Rel-13","crspec":"36.133","crspecversion":"13.7.0","workitem":[{"winame":"LTE_MTCe2_L1-Perf"}],"crnumber":4713.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-171309","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_82Bis\/Docs\/R4-1704379.zip","group":"R4","meeting":"R4-82","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]