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{"name":"R5-230161","title":"Discussion on FR2 PC1 MU","source":"Keysight Technologies UK Ltd, Anritsu","contact":"Adan Toril","contact-id":62705,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":613,"ainumber":"5.4.17","ainame":"Discussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":1610,"status":"revised","reservation_date":"2023-08-02 16:33:46","uploaded":"2023-02-17 11:31:14","revisionof":"","revisedto":"R5-231778","release":"Rel-17","crspec":"","crspecversion":"","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_98_Athens\/Docs\/R5-230161.zip","group":"R5","meeting":"R5-98","year":2023,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R5-230203","title":"Spurious Emissions TRP Measurement Grids for PC1","source":"Keysight Technologies UK Ltd","contact":"Thorsten Hertel","contact-id":77978,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":613,"ainumber":"5.4.17","ainame":"Discussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":2030,"status":"revised","reservation_date":"2023-09-02 14:54:25","uploaded":"2023-02-17 23:24:48","revisionof":"","revisedto":"R5-231789","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_98_Athens\/Docs\/R5-230203.zip","group":"R5","meeting":"R5-98","year":2023,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R5-230209","title":"MU discussion on FR2 PC1","source":"Anritsu, NTT DOCOMO INC.","contact":"Masafumi Setsu","contact-id":89240,"tdoctype":"discussion","for":"Endorsement","abstract":"Associated CR: R5-230211, R5-230212, R5-230213\nDepending on the outcome of discussion R5-230210 (Testability analysis on ACLR MU assumes that ACLR testing level is fixed in R5-230210)","secretary_remarks":"","agenda_item_sort_order":613,"ainumber":"5.4.17","ainame":"Discussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":2090,"status":"revised","reservation_date":"2023-10-02 08:53:08","uploaded":"2023-02-17 10:12:22","revisionof":"","revisedto":"R5-231851","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_98_Athens\/Docs\/R5-230209.zip","group":"R5","meeting":"R5-98","year":2023,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R5-230210","title":"Correction of RB allocation in MPR and ACLR for FR2 PC1","source":"Anritsu","contact":"Masafumi Setsu","contact-id":89240,"tdoctype":"discussion","for":"Endorsement","abstract":"Associated CR: R5-230214, R5-230215","secretary_remarks":"","agenda_item_sort_order":613,"ainumber":"5.4.17","ainame":"Discussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":2100,"status":"noted","reservation_date":"2023-10-02 08:53:09","uploaded":"2023-02-17 10:12:22","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_98_Athens\/Docs\/R5-230210.zip","group":"R5","meeting":"R5-98","year":2023,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R5-230216","title":"Testability analysis on ACS and IBB for FR2c","source":"Anritsu","contact":"Masafumi Setsu","contact-id":89240,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":613,"ainumber":"5.4.17","ainame":"Discussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":2160,"status":"noted","reservation_date":"2023-10-02 08:53:19","uploaded":"2023-02-17 10:12:22","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"NR_bands_BW_R16-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_98_Athens\/Docs\/R5-230216.zip","group":"R5","meeting":"R5-98","year":2023,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R5-230217","title":"Maintenance of EVM including symbols with transient period","source":"Anritsu","contact":"Masafumi Setsu","contact-id":89240,"tdoctype":"discussion","for":"Endorsement","abstract":"Associated CR: R5-230218","secretary_remarks":"","agenda_item_sort_order":613,"ainumber":"5.4.17","ainame":"Discussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":2170,"status":"noted","reservation_date":"2023-10-02 08:53:19","uploaded":"2023-02-17 10:12:22","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"TEI16_Test"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_98_Athens\/Docs\/R5-230217.zip","group":"R5","meeting":"R5-98","year":2023,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R5-230220","title":"On the uncertainty of the network analyzer","source":"ROHDE & SCHWARZ","contact":"Edwin Menzel","contact-id":65839,"tdoctype":"discussion","for":"Endorsement","abstract":"associated CRs R5-230221 and R5-230222","secretary_remarks":"","agenda_item_sort_order":613,"ainumber":"5.4.17","ainame":"Discussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":2200,"status":"noted","reservation_date":"2023-10-02 16:14:41","uploaded":"2023-02-18 08:52:22","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_98_Athens\/Docs\/R5-230220.zip","group":"R5","meeting":"R5-98","year":2023,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R5-230223","title":"On the MU for FR2 PC1 TRx test cases","source":"ROHDE & SCHWARZ","contact":"Edwin Menzel","contact-id":65839,"tdoctype":"discussion","for":"Endorsement","abstract":"associated CRs in R5-230224 and R5-230225","secretary_remarks":"","agenda_item_sort_order":613,"ainumber":"5.4.17","ainame":"Discussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":2230,"status":"noted","reservation_date":"2023-10-02 16:14:42","uploaded":"2023-02-18 08:52:22","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_98_Athens\/Docs\/R5-230223.zip","group":"R5","meeting":"R5-98","year":2023,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R5-230781","title":"Discussion on Testability for RRM FR1-FR2","source":"Qualcomm Incorporated","contact":"Fernando Alonso Macias","contact-id":67793,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":613,"ainumber":"5.4.17","ainame":"Discussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":7810,"status":"noted","reservation_date":"2023-02-16 19:07:20","uploaded":"2023-02-18 03:59:26","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_98_Athens\/Docs\/R5-230781.zip","group":"R5","meeting":"R5-98","year":2023,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R5-230786","title":"Discussion on RRM applicability rules and test optimization","source":"Qualcomm Incorporated","contact":"Fernando Alonso Macias","contact-id":67793,"tdoctype":"discussion","for":"Endorsement","abstract":"Associated t-docs\nR5-231320, R5-231321","secretary_remarks":"","agenda_item_sort_order":613,"ainumber":"5.4.17","ainame":"Discussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":7860,"status":"revised","reservation_date":"2023-02-16 19:07:23","uploaded":"2023-02-18 03:59:26","revisionof":"","revisedto":"R5-231871","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_98_Athens\/Docs\/R5-230786.zip","group":"R5","meeting":"R5-98","year":2023,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R5-230788","title":"Discussion on FR2 RLM\/BFD and beam sweeping from multiple directions","source":"Qualcomm Incorporated","contact":"Fernando Alonso Macias","contact-id":67793,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":613,"ainumber":"5.4.17","ainame":"Discussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":7880,"status":"revised","reservation_date":"2023-02-16 19:07:24","uploaded":"2023-02-18 03:59:26","revisionof":"","revisedto":"R5-231832","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_98_Athens\/Docs\/R5-230788.zip","group":"R5","meeting":"R5-98","year":2023,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R5-230933","title":"On the MU Threshold for DL AWGN absolute power for RRM FR2 PC1","source":"ROHDE & SCHWARZ","contact":"Adrian Cardalda Garcia","contact-id":66591,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":613,"ainumber":"5.4.17","ainame":"Discussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":9330,"status":"noted","reservation_date":"2023-02-17 06:52:27","uploaded":"2023-02-17 14:37:57","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_98_Athens\/Docs\/R5-230933.zip","group":"R5","meeting":"R5-98","year":2023,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R5-230934","title":"On AP#97.25 RRM 1x2 channel configuration","source":"ROHDE & SCHWARZ","contact":"Adrian Cardalda Garcia","contact-id":66591,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":613,"ainumber":"5.4.17","ainame":"Discussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":9340,"status":"agreed","reservation_date":"2023-02-17 06:52:27","uploaded":"2023-02-17 14:37:57","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_98_Athens\/Docs\/R5-230934.zip","group":"R5","meeting":"R5-98","year":2023,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R5-230950","title":"Discussion on handling simultaneous Rx\/Tx capability for REFSENS testing","source":"Huawei, HiSilicon","contact":"Yaping Zhang","contact-id":85042,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":613,"ainumber":"5.4.17","ainame":"Discussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":9500,"status":"revised","reservation_date":"2023-02-17 07:12:00","uploaded":"2023-02-17 08:29:40","revisionof":"","revisedto":"R5-231862","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_98_Athens\/Docs\/R5-230950.zip","group":"R5","meeting":"R5-98","year":2023,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R5-231060","title":"Handling of FR2 PC1 in RAN5","source":"NTT DOCOMO INC.","contact":"Takashi Akao","contact-id":83320,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":613,"ainumber":"5.4.17","ainame":"Discussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":10600,"status":"noted","reservation_date":"2023-02-17 10:38:00","uploaded":"2023-02-17 11:07:13","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"TEI17_Test"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_98_Athens\/Docs\/R5-231060.zip","group":"R5","meeting":"R5-98","year":2023,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R5-231108","title":"FR2 RRM test cases: Known Issue List","source":"Ericsson","contact":"Jakub Kolodziej","contact-id":76956,"tdoctype":"discussion","for":"Information","abstract":"Document for tracking FR2 RRM known issues","secretary_remarks":"","agenda_item_sort_order":613,"ainumber":"5.4.17","ainame":"Discussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":11080,"status":"revised","reservation_date":"2023-02-17 12:14:40","uploaded":"2023-02-17 19:22:28","revisionof":"","revisedto":"R5-231773","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_98_Athens\/Docs\/R5-231108.zip","group":"R5","meeting":"R5-98","year":2023,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R5-231109","title":"Principle of testing on a mix of E-UTRA_FR1 - FR2 carriers","source":"Ericsson","contact":"Jakub Kolodziej","contact-id":76956,"tdoctype":"discussion","for":"Information","abstract":"","secretary_remarks":"","agenda_item_sort_order":613,"ainumber":"5.4.17","ainame":"Discussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":11090,"status":"revised","reservation_date":"2023-02-17 12:14:40","uploaded":"2023-02-17 19:22:28","revisionof":"","revisedto":"R5-231820","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_98_Athens\/Docs\/R5-231109.zip","group":"R5","meeting":"R5-98","year":2023,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R5-231309","title":"FR2 SEM test time reduction by utilizing coarse TRP grid","source":"Ericsson","contact":"Mikael Ziren","contact-id":88614,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":613,"ainumber":"5.4.17","ainame":"Discussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":13090,"status":"noted","reservation_date":"2023-02-17 17:49:57","uploaded":"2023-02-17 20:35:24","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_98_Athens\/Docs\/R5-231309.zip","group":"R5","meeting":"R5-98","year":2023,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
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