[{"name":"R5-224078","title":"Discussion on message type for Power limit test functions","source":"Keysight technologies UK Ltd, Apple Portugal","contact":"Flores Fernandez Martos","contact-id":47301,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":710,"ainumber":"5.4.17","ainame":"Discussion Papers, Work Plan, TC lists","tdoc_agenda_sort_order":40780,"status":"revised","reservation_date":"2022-07-29 04:09:35","uploaded":"2022-07-31 16:40:54","revisionof":"","revisedto":"R5-225608","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"TEI16_Test"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_96_Electronic\/Docs\/R5-224078.zip","group":"R5","meeting":"R5-96-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-224255","title":"Discussion on precondition for the updating of test channel bandwidths in 38.508-1","source":"CAICT","contact":"Yufeng Zhang","contact-id":86588,"tdoctype":"discussion","for":"Endorsement","abstract":"CR: R5-224232, R5-224233, R5-224234","secretary_remarks":"","agenda_item_sort_order":710,"ainumber":"5.4.17","ainame":"Discussion Papers, Work Plan, TC lists","tdoc_agenda_sort_order":42550,"status":"noted","reservation_date":"2022-08-02 03:32:56","uploaded":"2022-08-02 07:50:27","revisionof":"","revisedto":"","release":"Rel-17","crspec":"38.508-1","crspecversion":"","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_96_Electronic\/Docs\/R5-224255.zip","group":"R5","meeting":"R5-96-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-224256","title":"Discussion on the treatment for the pending R15 NR FR1 band n50 and n86","source":"CAICT","contact":"Yufeng Zhang","contact-id":86588,"tdoctype":"discussion","for":"Endorsement","abstract":"CR: R5-224238","secretary_remarks":"","agenda_item_sort_order":710,"ainumber":"5.4.17","ainame":"Discussion Papers, Work Plan, TC lists","tdoc_agenda_sort_order":42560,"status":"noted","reservation_date":"2022-08-02 03:32:56","uploaded":"2022-08-02 07:50:27","revisionof":"","revisedto":"","release":"Rel-17","crspec":"38.508-1","crspecversion":"","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_96_Electronic\/Docs\/R5-224256.zip","group":"R5","meeting":"R5-96-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-224610","title":"MU discussion on FR2 PC1","source":"Anritsu, NTT DOCOMO INC.","contact":"Masafumi Setsu","contact-id":89240,"tdoctype":"discussion","for":"Endorsement","abstract":"Associated CR: R5-224611, R5-224612","secretary_remarks":"","agenda_item_sort_order":710,"ainumber":"5.4.17","ainame":"Discussion Papers, Work Plan, TC lists","tdoc_agenda_sort_order":46100,"status":"revised","reservation_date":"2022-08-05 09:13:07","uploaded":"2022-08-05 11:17:25","revisionof":"","revisedto":"R5-225639","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_96_Electronic\/Docs\/R5-224610.zip","group":"R5","meeting":"R5-96-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-224613","title":"MU discussion on 40 cm Quiet Zone","source":"Anritsu","contact":"Masafumi Setsu","contact-id":89240,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":710,"ainumber":"5.4.17","ainame":"Discussion Papers, Work Plan, TC lists","tdoc_agenda_sort_order":46130,"status":"noted","reservation_date":"2022-08-05 09:13:10","uploaded":"2022-08-05 11:17:25","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_96_Electronic\/Docs\/R5-224613.zip","group":"R5","meeting":"R5-96-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-224806","title":"Discussion on fading crest factor","source":"Qualcomm Korea","contact":"Vijay Balasubramanian","contact-id":84569,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":710,"ainumber":"5.4.17","ainame":"Discussion Papers, Work Plan, TC lists","tdoc_agenda_sort_order":48060,"status":"noted","reservation_date":"2022-08-05 21:19:15","uploaded":"2022-08-08 18:20:36","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_96_Electronic\/Docs\/R5-224806.zip","group":"R5","meeting":"R5-96-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-224808","title":"Applicability of FWA devices for Demod and RRM test cases","source":"Qualcomm Korea","contact":"Vijay Balasubramanian","contact-id":84569,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":710,"ainumber":"5.4.17","ainame":"Discussion Papers, Work Plan, TC lists","tdoc_agenda_sort_order":48080,"status":"revised","reservation_date":"2022-08-05 21:19:16","uploaded":"2022-08-08 21:49:30","revisionof":"","revisedto":"R5-225640","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_96_Electronic\/Docs\/R5-224808.zip","group":"R5","meeting":"R5-96-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-225023","title":"Handling of FR2 PC1 in RAN5","source":"NTT DOCOMO INC., Anritsu, Keysight","contact":"Takashi Akao","contact-id":83320,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":710,"ainumber":"5.4.17","ainame":"Discussion Papers, Work Plan, TC lists","tdoc_agenda_sort_order":50230,"status":"revised","reservation_date":"2022-08-08 09:50:24","uploaded":"2022-08-08 10:00:51","revisionof":"","revisedto":"R5-225641","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_96_Electronic\/Docs\/R5-225023.zip","group":"R5","meeting":"R5-96-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-225029","title":"EIRP-based test metric for FR2 SEM test","source":"Apple Portugal","contact":"Ashwin Mohan","contact-id":90592,"tdoctype":"discussion","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":710,"ainumber":"5.4.17","ainame":"Discussion Papers, Work Plan, TC lists","tdoc_agenda_sort_order":50290,"status":"noted","reservation_date":"2022-08-08 10:08:18","uploaded":"2022-08-08 20:13:24","revisionof":"","revisedto":"","release":"Rel-16","crspec":"","crspecversion":"","workitem":[{"winame":"TEI15_Test"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_96_Electronic\/Docs\/R5-225029.zip","group":"R5","meeting":"R5-96-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-225104","title":"On additional spurious emission for EN-DC with FR2","source":"ROHDE & SCHWARZ","contact":"Edwin Menzel","contact-id":65839,"tdoctype":"discussion","for":"Endorsement","abstract":"Associated CRs in R5-225105 and R5-225106","secretary_remarks":"","agenda_item_sort_order":710,"ainumber":"5.4.17","ainame":"Discussion Papers, Work Plan, TC lists","tdoc_agenda_sort_order":51040,"status":"noted","reservation_date":"2022-08-08 11:53:16","uploaded":"2022-08-08 17:30:39","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_96_Electronic\/Docs\/R5-225104.zip","group":"R5","meeting":"R5-96-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-225122","title":"On the feasibility of the PHR method","source":"ROHDE & SCHWARZ","contact":"Edwin Menzel","contact-id":65839,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":710,"ainumber":"5.4.17","ainame":"Discussion Papers, Work Plan, TC lists","tdoc_agenda_sort_order":51220,"status":"revised","reservation_date":"2022-08-08 11:53:34","uploaded":"2022-08-08 17:30:39","revisionof":"","revisedto":"R5-225642","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_96_Electronic\/Docs\/R5-225122.zip","group":"R5","meeting":"R5-96-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-225123","title":"On the MU for FR2 PC1 TRx test cases","source":"ROHDE & SCHWARZ","contact":"Edwin Menzel","contact-id":65839,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":710,"ainumber":"5.4.17","ainame":"Discussion Papers, Work Plan, TC lists","tdoc_agenda_sort_order":51230,"status":"revised","reservation_date":"2022-08-08 11:53:34","uploaded":"2022-08-08 17:30:39","revisionof":"","revisedto":"R5-225643","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_96_Electronic\/Docs\/R5-225123.zip","group":"R5","meeting":"R5-96-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-225136","title":"FR2 RRM test cases: Known Issue List","source":"Ericsson","contact":"Jakub Kolodziej","contact-id":76956,"tdoctype":"discussion","for":"Information","abstract":"Document for tracking FR2 RRM known issues","secretary_remarks":"","agenda_item_sort_order":710,"ainumber":"5.4.17","ainame":"Discussion Papers, Work Plan, TC lists","tdoc_agenda_sort_order":51360,"status":"revised","reservation_date":"2022-08-08 13:07:54","uploaded":"2022-08-08 20:50:57","revisionof":"","revisedto":"R5-225677","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_96_Electronic\/Docs\/R5-225136.zip","group":"R5","meeting":"R5-96-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-225185","title":"On 40cm QoQZ and XPD MUs","source":"Keysight Technologies UK Ltd","contact":"Thorsten Hertel","contact-id":77978,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":710,"ainumber":"5.4.17","ainame":"Discussion Papers, Work Plan, TC lists","tdoc_agenda_sort_order":51850,"status":"revised","reservation_date":"2022-08-08 15:31:43","uploaded":"2022-08-08 21:26:08","revisionof":"","revisedto":"R5-225644","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_96_Electronic\/Docs\/R5-225185.zip","group":"R5","meeting":"R5-96-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-225191","title":"New method for preventing SCell drop in RAN5 FR2 UL CA test cases","source":"Ericsson","contact":"Mikael Ziren","contact-id":88614,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":710,"ainumber":"5.4.17","ainame":"Discussion Papers, Work Plan, TC lists","tdoc_agenda_sort_order":51910,"status":"revised","reservation_date":"2022-08-08 15:50:26","uploaded":"2022-08-08 18:14:50","revisionof":"","revisedto":"R5-225613","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"TEI15_Test"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_96_Electronic\/Docs\/R5-225191.zip","group":"R5","meeting":"R5-96-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-225194","title":"Discussion on TT and testability for FR2 EVM","source":"Ericsson","contact":"Mikael Ziren","contact-id":88614,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":710,"ainumber":"5.4.17","ainame":"Discussion Papers, Work Plan, TC lists","tdoc_agenda_sort_order":51940,"status":"revised","reservation_date":"2022-08-08 15:50:28","uploaded":"2022-08-08 18:14:50","revisionof":"","revisedto":"R5-225645","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"TEI15_Test"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_96_Electronic\/Docs\/R5-225194.zip","group":"R5","meeting":"R5-96-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-225203","title":"Discussion on handling p-MaxEUTRA and p-NR-FR1","source":"Huawei, HiSilicon","contact":"Chunying Gu","contact-id":65493,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":710,"ainumber":"5.4.17","ainame":"Discussion Papers, Work Plan, TC lists","tdoc_agenda_sort_order":52030,"status":"noted","reservation_date":"2022-08-08 16:21:54","uploaded":"2022-08-29 11:51:21","revisionof":"","revisedto":"","release":"Rel-15","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_96_Electronic\/Docs\/R5-225203.zip","group":"R5","meeting":"R5-96-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-225206","title":"Discussion on QoQZ and XPD MUs for 40cm","source":"ROHDE & SCHWARZ","contact":"Jose M. Fortes Lopez","contact-id":78787,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":710,"ainumber":"5.4.17","ainame":"Discussion Papers, Work Plan, TC lists","tdoc_agenda_sort_order":52060,"status":"revised","reservation_date":"2022-08-08 16:51:12","uploaded":"2022-08-08 20:46:14","revisionof":"","revisedto":"R5-225646","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_96_Electronic\/Docs\/R5-225206.zip","group":"R5","meeting":"R5-96-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-225221","title":"On PC1 measurement uncertainties for other test cases","source":"Keysight technologies UK Ltd","contact":"Flores Fernandez Martos","contact-id":47301,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":710,"ainumber":"5.4.17","ainame":"Discussion Papers, Work Plan, TC lists","tdoc_agenda_sort_order":52210,"status":"noted","reservation_date":"2022-08-08 18:21:35","uploaded":"2022-08-29 11:51:21","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_96_Electronic\/Docs\/R5-225221.zip","group":"R5","meeting":"R5-96-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-225229","title":"Discussion on L1-RSRP measurement accuracy test cases","source":"Keysight Technologies UK Ltd","contact":"Emilio Ruiz","contact-id":62021,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":710,"ainumber":"5.4.17","ainame":"Discussion Papers, Work Plan, TC lists","tdoc_agenda_sort_order":52290,"status":"noted","reservation_date":"2022-08-08 18:34:39","uploaded":"2022-08-08 18:38:05","revisionof":"","revisedto":"","release":"Rel-17","crspec":"38.533","crspecversion":"","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_96_Electronic\/Docs\/R5-225229.zip","group":"R5","meeting":"R5-96-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-225608","title":"Discussion on message type for Power limit test functions","source":"Keysight technologies UK Ltd, Apple Portugal","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":710,"ainumber":"5.4.17","ainame":"Discussion Papers, Work Plan, TC lists","tdoc_agenda_sort_order":40781,"status":"noted","reservation_date":"2022-09-01 08:39:07","uploaded":"2022-09-01 08:41:17","revisionof":"R5-224078","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"TEI16_Test"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_96_Electronic\/Docs\/R5-225608.zip","group":"R5","meeting":"R5-96-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-225609","title":"RAN5#96-e RF FR2_PCC_SCC_Prio Session meeting minute","source":"Keysight Technologies UK Ltd","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"report","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":710,"ainumber":"5.4.17","ainame":"Discussion Papers, Work Plan, TC lists","tdoc_agenda_sort_order":527000,"status":"noted","reservation_date":"2022-09-01 08:39:07","uploaded":"2022-09-01 08:41:17","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_96_Electronic\/Docs\/R5-225609.zip","group":"R5","meeting":"R5-96-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-225613","title":"New method for preventing SCell drop in RAN5 FR2 UL CA test cases","source":"Ericsson","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":710,"ainumber":"5.4.17","ainame":"Discussion Papers, Work Plan, TC lists","tdoc_agenda_sort_order":51911,"status":"noted","reservation_date":"2022-09-01 08:39:14","uploaded":"2022-09-01 08:41:17","revisionof":"R5-225191","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"TEI15_Test"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_96_Electronic\/Docs\/R5-225613.zip","group":"R5","meeting":"R5-96-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-225639","title":"MU discussion on FR2 PC1","source":"Anritsu, NTT DOCOMO INC.","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":710,"ainumber":"5.4.17","ainame":"Discussion Papers, Work Plan, TC lists","tdoc_agenda_sort_order":46101,"status":"noted","reservation_date":"2022-09-01 08:39:48","uploaded":"2022-09-01 08:41:17","revisionof":"R5-224610","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_96_Electronic\/Docs\/R5-225639.zip","group":"R5","meeting":"R5-96-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-225640","title":"Applicability of FWA devices for Demod and RRM test cases","source":"Qualcomm Korea","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":710,"ainumber":"5.4.17","ainame":"Discussion Papers, Work Plan, TC lists","tdoc_agenda_sort_order":48081,"status":"noted","reservation_date":"2022-09-01 08:39:48","uploaded":"2022-09-01 08:41:17","revisionof":"R5-224808","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_96_Electronic\/Docs\/R5-225640.zip","group":"R5","meeting":"R5-96-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-225641","title":"Handling of FR2 PC1 in RAN5","source":"NTT DOCOMO INC., Anritsu, Keysight","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":710,"ainumber":"5.4.17","ainame":"Discussion Papers, Work Plan, TC lists","tdoc_agenda_sort_order":50231,"status":"noted","reservation_date":"2022-09-01 08:39:48","uploaded":"2022-09-01 08:41:17","revisionof":"R5-225023","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_96_Electronic\/Docs\/R5-225641.zip","group":"R5","meeting":"R5-96-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-225642","title":"On the feasibility of the PHR method","source":"ROHDE & SCHWARZ","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":710,"ainumber":"5.4.17","ainame":"Discussion Papers, Work Plan, TC lists","tdoc_agenda_sort_order":51221,"status":"noted","reservation_date":"2022-09-01 08:39:48","uploaded":"2022-09-01 08:41:17","revisionof":"R5-225122","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_96_Electronic\/Docs\/R5-225642.zip","group":"R5","meeting":"R5-96-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-225643","title":"On the MU for FR2 PC1 TRx test cases","source":"ROHDE & SCHWARZ","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":710,"ainumber":"5.4.17","ainame":"Discussion Papers, Work Plan, TC lists","tdoc_agenda_sort_order":51231,"status":"noted","reservation_date":"2022-09-01 08:39:48","uploaded":"2022-09-01 08:41:17","revisionof":"R5-225123","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_96_Electronic\/Docs\/R5-225643.zip","group":"R5","meeting":"R5-96-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-225644","title":"On 40cm QoQZ and XPD MUs","source":"Keysight Technologies UK Ltd","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":710,"ainumber":"5.4.17","ainame":"Discussion Papers, Work Plan, TC lists","tdoc_agenda_sort_order":51851,"status":"noted","reservation_date":"2022-09-01 08:39:49","uploaded":"2022-09-01 08:41:17","revisionof":"R5-225185","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_96_Electronic\/Docs\/R5-225644.zip","group":"R5","meeting":"R5-96-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-225645","title":"Discussion on TT and testability for FR2 EVM","source":"Ericsson","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":710,"ainumber":"5.4.17","ainame":"Discussion Papers, Work Plan, TC lists","tdoc_agenda_sort_order":51941,"status":"noted","reservation_date":"2022-09-01 08:39:49","uploaded":"2022-09-01 08:41:17","revisionof":"R5-225194","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"TEI15_Test"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_96_Electronic\/Docs\/R5-225645.zip","group":"R5","meeting":"R5-96-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-225646","title":"Discussion on QoQZ and XPD MUs for 40cm","source":"ROHDE & SCHWARZ","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":710,"ainumber":"5.4.17","ainame":"Discussion Papers, Work Plan, TC lists","tdoc_agenda_sort_order":52061,"status":"noted","reservation_date":"2022-09-01 08:39:49","uploaded":"2022-09-01 08:41:17","revisionof":"R5-225206","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_96_Electronic\/Docs\/R5-225646.zip","group":"R5","meeting":"R5-96-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-225677","title":"FR2 RRM test cases: Known Issue List","source":"Ericsson","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Information","abstract":"","secretary_remarks":"","agenda_item_sort_order":710,"ainumber":"5.4.17","ainame":"Discussion Papers, Work Plan, TC lists","tdoc_agenda_sort_order":51361,"status":"noted","reservation_date":"2022-09-01 08:40:25","uploaded":"2022-09-01 08:41:19","revisionof":"R5-225136","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_96_Electronic\/Docs\/R5-225677.zip","group":"R5","meeting":"R5-96-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]