[{"name":"R5-222186","title":"Discussion on NR part UL power testing for Rel-15 PC2 UEs of Inter-band EN-DC within FR1","source":"CAICT","contact":"Yufeng Zhang","contact-id":86588,"tdoctype":"discussion","for":"Endorsement","abstract":"Proposals applied in CR R5-222193","secretary_remarks":"","agenda_item_sort_order":601,"ainumber":"5.4.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":21860,"status":"revised","reservation_date":"2022-04-20 07:47:01","uploaded":"2022-04-21 08:16:26","revisionof":"","revisedto":"R5-223645","release":"Rel-17","crspec":"38.521-3","crspecversion":"","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_95_Electronic\/Docs\/R5-222186.zip","group":"R5","meeting":"R5-95-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-222340","title":"Discussion on TT and testability proposal for FR2 EVM","source":"Keysight Technologies UK Ltd","contact":"Adan Toril","contact-id":62705,"tdoctype":"discussion","for":"Discussion","abstract":"Associated CRs R5-222341, R5-222343","secretary_remarks":"","agenda_item_sort_order":601,"ainumber":"5.4.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":23400,"status":"revised","reservation_date":"2022-04-21 06:29:45","uploaded":"2022-04-22 06:56:20","revisionof":"","revisedto":"R5-223620","release":"Rel-16","crspec":"38.521-2","crspecversion":"","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_95_Electronic\/Docs\/R5-222340.zip","group":"R5","meeting":"R5-95-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-222435","title":"Discussion on updates required in Test points analysis for MPR, SEM and ACLR","source":"Keysight technologies UK Ltd","contact":"Flores Fernandez Martos","contact-id":47301,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":601,"ainumber":"5.4.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":24350,"status":"revised","reservation_date":"2022-04-22 09:06:23","uploaded":"2022-04-25 20:12:56","revisionof":"","revisedto":"R5-223637","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_95_Electronic\/Docs\/R5-222435.zip","group":"R5","meeting":"R5-95-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-222436","title":"Discussion on Rel-15 Common Uplink Configuration for PC2, PC3 and PC4","source":"Keysight technologies UK Ltd","contact":"Flores Fernandez Martos","contact-id":47301,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":601,"ainumber":"5.4.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":24360,"status":"noted","reservation_date":"2022-04-22 09:06:23","uploaded":"2022-04-25 20:12:56","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_95_Electronic\/Docs\/R5-222436.zip","group":"R5","meeting":"R5-95-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-222548","title":"On LTE-NR coexistence performance test cases","source":"ROHDE & SCHWARZ","contact":"Edwin Menzel","contact-id":65839,"tdoctype":"discussion","for":"Endorsement","abstract":"Associated CR in R5-222549","secretary_remarks":"","agenda_item_sort_order":601,"ainumber":"5.4.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":25480,"status":"revised","reservation_date":"2022-04-22 15:01:27","uploaded":"2022-04-25 18:19:00","revisionof":"","revisedto":"R5-223627","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_95_Electronic\/Docs\/R5-222548.zip","group":"R5","meeting":"R5-95-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-222553","title":"On QoQZ for 40cm QZ","source":"Keysight Technologies UK Ltd","contact":"Thorsten Hertel","contact-id":77978,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":601,"ainumber":"5.4.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":25530,"status":"revised","reservation_date":"2022-04-22 19:33:58","uploaded":"2022-04-25 22:27:27","revisionof":"","revisedto":"R5-223614","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_95_Electronic\/Docs\/R5-222553.zip","group":"R5","meeting":"R5-95-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-222554","title":"On Permitted Methodologies and Applicability","source":"Keysight Technologies UK Ltd","contact":"Thorsten Hertel","contact-id":77978,"tdoctype":"discussion","for":"Endorsement","abstract":"This contribution addresses the need to define and clarify the permitted methodologies. CRs in TDOC #+1, and #+2.\ndiscussion paper for CRs in R5-222555 and R5-222556.","secretary_remarks":"","agenda_item_sort_order":601,"ainumber":"5.4.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":25540,"status":"noted","reservation_date":"2022-04-22 19:33:59","uploaded":"2022-04-25 22:27:27","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_95_Electronic\/Docs\/R5-222554.zip","group":"R5","meeting":"R5-95-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-222589","title":"Discussion on fading crest factor","source":"QUALCOMM Europe Inc. - Italy","contact":"Vijay Balasubramanian","contact-id":84569,"tdoctype":"discussion","for":"Endorsement","abstract":"AP#89e.23\nAssociated CRs R5-222590, R5-222591","secretary_remarks":"","agenda_item_sort_order":601,"ainumber":"5.4.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":25890,"status":"noted","reservation_date":"2022-04-23 20:14:12","uploaded":"2022-04-25 14:42:34","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_95_Electronic\/Docs\/R5-222589.zip","group":"R5","meeting":"R5-95-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-223165","title":"RAN5 5G NR Test Tolerance review discussion","source":"Ericsson","contact":"Jakub Kolodziej","contact-id":76956,"tdoctype":"discussion","for":"Information","abstract":"Discussion on the NR FR1 and FR2 Test Tolerance reviewing process","secretary_remarks":"","agenda_item_sort_order":601,"ainumber":"5.4.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":31650,"status":"revised","reservation_date":"2022-04-25 14:22:40","uploaded":"2022-04-25 19:47:47","revisionof":"","revisedto":"R5-223601","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_95_Electronic\/Docs\/R5-223165.zip","group":"R5","meeting":"R5-95-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-223166","title":"FR2 RRM test cases: Known Issue List","source":"Ericsson","contact":"Jakub Kolodziej","contact-id":76956,"tdoctype":"discussion","for":"Information","abstract":"Document for tracking FR2 RRM known issues","secretary_remarks":"","agenda_item_sort_order":601,"ainumber":"5.4.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":31660,"status":"revised","reservation_date":"2022-04-25 14:22:40","uploaded":"2022-04-25 19:47:47","revisionof":"","revisedto":"R5-223624","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_95_Electronic\/Docs\/R5-223166.zip","group":"R5","meeting":"R5-95-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-223167","title":"FR2 RRM test cases: Known Issue List - after RAN5_95e","source":"Ericsson","contact":"Jakub Kolodziej","contact-id":76956,"tdoctype":"discussion","for":"Information","abstract":"Placeholder for document for tracking FR2 RRM known issues","secretary_remarks":"","agenda_item_sort_order":601,"ainumber":"5.4.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":31670,"status":"revised","reservation_date":"2022-04-25 14:22:40","uploaded":"2022-04-25 19:47:47","revisionof":"","revisedto":"R5-223625","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_95_Electronic\/Docs\/R5-223167.zip","group":"R5","meeting":"R5-95-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-223168","title":"Further discussion on large UE gain range","source":"Ericsson","contact":"Jakub Kolodziej","contact-id":76956,"tdoctype":"discussion","for":"Endorsement","abstract":"In this document we further discuss the issue of large UE antenna gain range and propose a solution to make UE accuracy testing more meaningful.","secretary_remarks":"","agenda_item_sort_order":601,"ainumber":"5.4.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":31680,"status":"revised","reservation_date":"2022-04-25 14:22:40","uploaded":"2022-04-25 19:47:47","revisionof":"","revisedto":"R5-223628","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_95_Electronic\/Docs\/R5-223168.zip","group":"R5","meeting":"R5-95-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-223199","title":"Discussion on mandatory channel bandwidths after Rel-15","source":"Keysight technologies UK Ltd","contact":"Flores Fernandez Martos","contact-id":47301,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":601,"ainumber":"5.4.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":31990,"status":"revised","reservation_date":"2022-04-25 14:50:44","uploaded":"2022-04-25 20:11:21","revisionof":"","revisedto":"R5-223626","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_95_Electronic\/Docs\/R5-223199.zip","group":"R5","meeting":"R5-95-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-223271","title":"EIRP-based test metric for FR2 SEM verifications","source":"Apple Portugal","contact":"Ashwin Mohan","contact-id":90592,"tdoctype":"discussion","for":"Agreement","abstract":"RAN4#103-e t-doc R4-2207675\t draftCR","secretary_remarks":"","agenda_item_sort_order":601,"ainumber":"5.4.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":32710,"status":"revised","reservation_date":"2022-04-25 17:55:36","uploaded":"2022-04-25 21:06:32","revisionof":"","revisedto":"R5-223622","release":"Rel-16","crspec":"38.521-2","crspecversion":"","workitem":[{"winame":"TEI15_Test"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_95_Electronic\/Docs\/R5-223271.zip","group":"R5","meeting":"R5-95-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-223278","title":"Discussion on testability aspects for new test function to limit Pcell power","source":"Keysight technologies UK Ltd","contact":"Flores Fernandez Martos","contact-id":47301,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":601,"ainumber":"5.4.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":32780,"status":"revised","reservation_date":"2022-04-25 18:12:33","uploaded":"2022-04-25 20:11:49","revisionof":"","revisedto":"R5-223646","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_95_Electronic\/Docs\/R5-223278.zip","group":"R5","meeting":"R5-95-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-223300","title":"New method for preventing SCell drop in RAN5 FR2 UL CA test cases","source":"Ericsson","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Discussion","abstract":"we have discovered another solution for SCell drop which is simpler and more robust compared to Option 1 which we chose not to move forward on at last meeting. The new solution is based on UE Power Headroom Reporting which has not been discussed before in RAN5. We think this (called Option 1C) need to be discussed in RAN5 as a potential short term solution.\no\tdraft discussion paper that you are now requesting a late tdoc,  as a possible way fwd RAN5 is requested to consider instead of what has been indicated as way fwd at RAN5#94-e\no\tList all the Ran5#95-e CR\u2019s that this late discussion paper ( if agreed as a way fwd) will result in withdrawal\no\tProvide draftCR\u2019s addressing the topic aligned with the intended proposal in late discussion paper","secretary_remarks":"","agenda_item_sort_order":601,"ainumber":"5.4.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":330000,"status":"revised","reservation_date":"2022-05-24 07:31:42","uploaded":"2022-05-24 07:41:14","revisionof":"","revisedto":"R5-223633","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_95_Electronic\/Docs\/R5-223300.zip","group":"R5","meeting":"R5-95-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-223601","title":"RAN5 5G NR Test Tolerance review discussion","source":"Ericsson","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Information","abstract":"","secretary_remarks":"","agenda_item_sort_order":601,"ainumber":"5.4.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":31651,"status":"noted","reservation_date":"2022-05-24 07:36:01","uploaded":"2022-05-24 07:41:31","revisionof":"R5-223165","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_95_Electronic\/Docs\/R5-223601.zip","group":"R5","meeting":"R5-95-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-223614","title":"On QoQZ for 40cm QZ","source":"Keysight Technologies UK Ltd","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":601,"ainumber":"5.4.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":25531,"status":"noted","reservation_date":"2022-05-24 07:36:26","uploaded":"2022-05-24 07:41:31","revisionof":"R5-222553","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_95_Electronic\/Docs\/R5-223614.zip","group":"R5","meeting":"R5-95-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-223620","title":"Discussion on TT and testability proposal for FR2 EVM","source":"Keysight Technologies UK Ltd","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":601,"ainumber":"5.4.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":23401,"status":"noted","reservation_date":"2022-05-24 07:36:32","uploaded":"2022-05-24 07:41:31","revisionof":"R5-222340","revisedto":"","release":"Rel-16","crspec":"38.521-2","crspecversion":"","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_95_Electronic\/Docs\/R5-223620.zip","group":"R5","meeting":"R5-95-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-223622","title":"EIRP-based test metric for FR2 SEM verifications","source":"Apple Portugal","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":601,"ainumber":"5.4.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":32711,"status":"noted","reservation_date":"2022-05-24 07:36:32","uploaded":"2022-05-24 07:41:31","revisionof":"R5-223271","revisedto":"","release":"Rel-16","crspec":"38.521-2","crspecversion":"","workitem":[{"winame":"TEI15_Test"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_95_Electronic\/Docs\/R5-223622.zip","group":"R5","meeting":"R5-95-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
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{"name":"R5-223627","title":"On LTE-NR coexistence performance test cases","source":"ROHDE & SCHWARZ","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":601,"ainumber":"5.4.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":25481,"status":"noted","reservation_date":"2022-05-24 07:36:33","uploaded":"2022-05-24 07:41:31","revisionof":"R5-222548","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_95_Electronic\/Docs\/R5-223627.zip","group":"R5","meeting":"R5-95-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-223628","title":"Further discussion on large UE gain range","source":"Ericsson","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":601,"ainumber":"5.4.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":31681,"status":"noted","reservation_date":"2022-05-24 07:36:33","uploaded":"2022-05-24 07:41:31","revisionof":"R5-223168","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_95_Electronic\/Docs\/R5-223628.zip","group":"R5","meeting":"R5-95-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-223633","title":"New method for preventing SCell drop in RAN5 FR2 UL CA test cases","source":"Ericsson","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":601,"ainumber":"5.4.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":330001,"status":"noted","reservation_date":"2022-05-24 07:36:34","uploaded":"2022-05-24 07:41:31","revisionof":"R5-223300","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_95_Electronic\/Docs\/R5-223633.zip","group":"R5","meeting":"R5-95-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-223637","title":"Discussion on updates required in Test points analysis for MPR, SEM and ACLR","source":"Keysight technologies UK Ltd","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":601,"ainumber":"5.4.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":24351,"status":"noted","reservation_date":"2022-05-24 07:36:35","uploaded":"2022-05-24 07:41:31","revisionof":"R5-222435","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_95_Electronic\/Docs\/R5-223637.zip","group":"R5","meeting":"R5-95-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-223645","title":"Discussion on NR part UL power testing for Rel-15 PC2 UEs of Inter-band EN-DC within FR1","source":"CAICT","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":601,"ainumber":"5.4.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":21861,"status":"noted","reservation_date":"2022-05-24 07:36:40","uploaded":"2022-05-24 07:41:31","revisionof":"R5-222186","revisedto":"","release":"Rel-17","crspec":"38.521-3","crspecversion":"","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_95_Electronic\/Docs\/R5-223645.zip","group":"R5","meeting":"R5-95-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-223646","title":"Discussion on testability aspects for new test function to limit Pcell power","source":"Keysight technologies UK Ltd","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":601,"ainumber":"5.4.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":32781,"status":"noted","reservation_date":"2022-05-24 07:36:40","uploaded":"2022-05-24 07:41:31","revisionof":"R5-223278","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_95_Electronic\/Docs\/R5-223646.zip","group":"R5","meeting":"R5-95-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]