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{"name":"R5-222479","title":"Update FR2 TRx MU in 38.903","source":"Anritsu","contact":"Masafumi Setsu","contact-id":89240,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":599,"ainumber":"5.4.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":24790,"status":"revised","reservation_date":"2022-04-22 12:56:58","uploaded":"2022-04-25 12:16:50","revisionof":"","revisedto":"R5-223618","release":"Rel-16","crspec":"38.903","crspecversion":"16.11.0","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":307.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_95_Electronic\/Docs\/R5-222479.zip","group":"R5","meeting":"R5-95-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-222514","title":"TT analysis for RRM test case 5.7.4.1 and 5.7.4.2","source":"ROHDE & SCHWARZ","contact":"Adrian Cardalda Garcia","contact-id":66591,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":599,"ainumber":"5.4.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":25140,"status":"revised","reservation_date":"2022-04-22 14:09:28","uploaded":"2022-04-25 09:24:45","revisionof":"","revisedto":"R5-223865","release":"Rel-16","crspec":"38.903","crspecversion":"16.11.0","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":308.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_95_Electronic\/Docs\/R5-222514.zip","group":"R5","meeting":"R5-95-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-222591","title":"Predicted SNR upper bound update","source":"QUALCOMM Europe Inc. - Italy","contact":"Vijay Balasubramanian","contact-id":84569,"tdoctype":"CR","for":"Agreement","abstract":"AP#89e.23\nDependent on disc paper R5-222589","secretary_remarks":"","agenda_item_sort_order":599,"ainumber":"5.4.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":25910,"status":"withdrawn","reservation_date":"2022-04-23 20:14:13","uploaded":"2022-04-25 13:04:48","revisionof":"","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.11.0","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":309.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_95_Electronic\/Docs\/R5-222591.zip","group":"R5","meeting":"R5-95-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-223170","title":"Test Tolerances for Intra-frequency SS-RSRP measurement accuracy tests in FR2","source":"Ericsson","contact":"Jakub Kolodziej","contact-id":76956,"tdoctype":"CR","for":"Agreement","abstract":"Test tolerance analysis correction related to the dicsussion paper","secretary_remarks":"","agenda_item_sort_order":599,"ainumber":"5.4.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":31700,"status":"revised","reservation_date":"2022-04-25 14:22:41","uploaded":"2022-04-25 20:02:35","revisionof":"","revisedto":"R5-223866","release":"Rel-16","crspec":"38.903","crspecversion":"16.11.0","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":318.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_95_Electronic\/Docs\/R5-223170.zip","group":"R5","meeting":"R5-95-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-223186","title":"Test Tolerance analysis for FR2 CSI-RS based L1-RSRP measurement for beam reporting test cases","source":"Ericsson","contact":"Jakub Kolodziej","contact-id":76956,"tdoctype":"CR","for":"Agreement","abstract":"Test tolerance analysis correction","secretary_remarks":"","agenda_item_sort_order":599,"ainumber":"5.4.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":31860,"status":"revised","reservation_date":"2022-04-25 14:22:57","uploaded":"2022-04-25 19:47:47","revisionof":"","revisedto":"R5-223609","release":"Rel-16","crspec":"38.903","crspecversion":"16.11.0","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":320.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_95_Electronic\/Docs\/R5-223186.zip","group":"R5","meeting":"R5-95-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-223608","title":"Add Test Tolerance analyses for EN-DC FR2 RLM tests for PSCell configured with CSI-RS-based RLM RS in non-DRX","source":"Anritsu","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":599,"ainumber":"5.4.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":21831,"status":"agreed","reservation_date":"2022-05-24 07:36:15","uploaded":"2022-05-24 07:41:31","revisionof":"R5-222183","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.11.0","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":306.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-221119","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_95_Electronic\/Docs\/R5-223608.zip","group":"R5","meeting":"R5-95-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-223609","title":"Test Tolerance analysis for FR2 CSI-RS based L1-RSRP measurement for beam reporting test cases","source":"Ericsson","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":599,"ainumber":"5.4.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":31861,"status":"agreed","reservation_date":"2022-05-24 07:36:16","uploaded":"2022-05-24 07:41:31","revisionof":"R5-223186","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.11.0","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":320.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-221119","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_95_Electronic\/Docs\/R5-223609.zip","group":"R5","meeting":"R5-95-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-223618","title":"Update FR2 TRx MU in 38.903","source":"Anritsu","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":599,"ainumber":"5.4.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":24791,"status":"withdrawn","reservation_date":"2022-05-24 07:36:31","uploaded":"2022-05-24 07:41:31","revisionof":"R5-222479","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.11.0","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":307.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_95_Electronic\/Docs\/R5-223618.zip","group":"R5","meeting":"R5-95-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-223865","title":"TT analysis for RRM test case 5.7.4.1 and 5.7.4.2","source":"ROHDE & SCHWARZ","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":599,"ainumber":"5.4.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":25141,"status":"agreed","reservation_date":"2022-05-24 10:10:34","uploaded":"2022-05-24 10:11:12","revisionof":"R5-222514","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.11.0","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":308.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-221119","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_95_Electronic\/Docs\/R5-223865.zip","group":"R5","meeting":"R5-95-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-223866","title":"Test Tolerances for Intra-frequency SS-RSRP measurement accuracy tests in FR2","source":"Ericsson","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":599,"ainumber":"5.4.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":31701,"status":"agreed","reservation_date":"2022-05-24 10:10:36","uploaded":"2022-05-24 10:11:12","revisionof":"R5-223170","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.11.0","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":318.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-221119","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_95_Electronic\/Docs\/R5-223866.zip","group":"R5","meeting":"R5-95-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]