[{"name":"R5-160164","title":"Corrections to EVM test case 6.5.2A.1.1","source":"CATR","contact":"Daiwei Zhou","contact-id":47509,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":161,"ainumber":"5.4.1.2.1","ainame":"\tTx Requirements (Clause 6)","tdoc_agenda_sort_order":1640,"status":"agreed","reservation_date":"2016-02-02 08:01:00","uploaded":"2016-02-02 08:05:29","revisionof":"","revisedto":"","release":"Rel-13","crspec":"36.521-1","crspecversion":"13.0.1","workitem":[{"winame":"TEI10_Test"}],"crnumber":2386.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-160128","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_70_Malta\/Docs\/R5-160164.zip","group":"R5","meeting":"R5-70","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-160362","title":"Test configuration correction for AMPR tests","source":"CMCC","contact":"Jinqiang Xing","contact-id":62081,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":161,"ainumber":"5.4.1.2.1","ainame":"\tTx Requirements (Clause 6)","tdoc_agenda_sort_order":3620,"status":"revised","reservation_date":"2016-02-04 11:59:11","uploaded":"2016-02-05 06:32:00","revisionof":"","revisedto":"R5-161041","release":"Rel-13","crspec":"36.521-1","crspecversion":"13.0.1","workitem":[{"winame":"TEI8_Test"}],"crnumber":2433.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_70_Malta\/Docs\/R5-160362.zip","group":"R5","meeting":"R5-70","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-160364","title":"Test configuration correction for ASE tests","source":"CMCC","contact":"Jinqiang Xing","contact-id":62081,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":161,"ainumber":"5.4.1.2.1","ainame":"\tTx Requirements (Clause 6)","tdoc_agenda_sort_order":3640,"status":"revised","reservation_date":"2016-02-04 12:02:02","uploaded":"2016-02-05 06:32:00","revisionof":"","revisedto":"R5-161042","release":"Rel-13","crspec":"36.521-1","crspecversion":"13.0.1","workitem":[{"winame":"TEI8_Test"}],"crnumber":2434.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_70_Malta\/Docs\/R5-160364.zip","group":"R5","meeting":"R5-70","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-160365","title":"Test configuration correction for ASEM tests","source":"CMCC","contact":"Jinqiang Xing","contact-id":62081,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":161,"ainumber":"5.4.1.2.1","ainame":"\tTx Requirements (Clause 6)","tdoc_agenda_sort_order":3650,"status":"revised","reservation_date":"2016-02-04 12:04:27","uploaded":"2016-02-05 06:32:00","revisionof":"","revisedto":"R5-161043","release":"Rel-13","crspec":"36.521-1","crspecversion":"13.0.1","workitem":[{"winame":"TEI8_Test"}],"crnumber":2435.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_70_Malta\/Docs\/R5-160365.zip","group":"R5","meeting":"R5-70","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-160370","title":"Rel-10 Test point reduction for UL 64QAM multi-cluster MPR and ACLR tests","source":"CMCC","contact":"Jinqiang Xing","contact-id":62081,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":161,"ainumber":"5.4.1.2.1","ainame":"\tTx Requirements (Clause 6)","tdoc_agenda_sort_order":3700,"status":"revised","reservation_date":"2016-02-04 12:23:55","uploaded":"2016-02-05 06:31:59","revisionof":"","revisedto":"R5-160825","release":"Rel-13","crspec":"36.521-1","crspecversion":"13.0.1","workitem":[{"winame":"TEI10_Test"}],"crnumber":2436.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_70_Malta\/Docs\/R5-160370.zip","group":"R5","meeting":"R5-70","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-160377","title":"R10 Remove editor's note for CA_39C spurious emission test","source":"CMCC","contact":"Jinqiang Xing","contact-id":62081,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":161,"ainumber":"5.4.1.2.1","ainame":"\tTx Requirements (Clause 6)","tdoc_agenda_sort_order":3770,"status":"agreed","reservation_date":"2016-02-04 12:44:39","uploaded":"2016-02-05 06:31:59","revisionof":"","revisedto":"","release":"Rel-13","crspec":"36.521-1","crspecversion":"13.0.1","workitem":[{"winame":"TEI10_Test"}],"crnumber":2437.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-160128","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_70_Malta\/Docs\/R5-160377.zip","group":"R5","meeting":"R5-70","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-160440","title":"Test configuration correction for UL 64QAM AMPR tests","source":"CMCC","contact":"Jinqiang Xing","contact-id":62081,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":161,"ainumber":"5.4.1.2.1","ainame":"\tTx Requirements (Clause 6)","tdoc_agenda_sort_order":4400,"status":"revised","reservation_date":"2016-02-05 02:07:30","uploaded":"2016-02-05 06:31:59","revisionof":"","revisedto":"R5-161044","release":"Rel-13","crspec":"36.521-1","crspecversion":"13.0.1","workitem":[{"winame":"LTE_UL64QAM-UEConTest"}],"crnumber":2438.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_70_Malta\/Docs\/R5-160440.zip","group":"R5","meeting":"R5-70","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-160457","title":"Test configuration correction for UL 64QAM ASE tests","source":"CMCC","contact":"Jinqiang Xing","contact-id":62081,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":161,"ainumber":"5.4.1.2.1","ainame":"\tTx Requirements (Clause 6)","tdoc_agenda_sort_order":4570,"status":"revised","reservation_date":"2016-02-05 02:59:11","uploaded":"2016-02-05 06:31:59","revisionof":"","revisedto":"R5-161045","release":"Rel-13","crspec":"36.521-1","crspecversion":"13.0.1","workitem":[{"winame":"LTE_UL64QAM-UEConTest"}],"crnumber":2441.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_70_Malta\/Docs\/R5-160457.zip","group":"R5","meeting":"R5-70","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-160458","title":"Test configuration correction for UL 64QAM ASEM tests","source":"CMCC","contact":"Jinqiang Xing","contact-id":62081,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":161,"ainumber":"5.4.1.2.1","ainame":"\tTx Requirements (Clause 6)","tdoc_agenda_sort_order":4580,"status":"revised","reservation_date":"2016-02-05 02:59:11","uploaded":"2016-02-05 06:31:59","revisionof":"","revisedto":"R5-161046","release":"Rel-13","crspec":"36.521-1","crspecversion":"13.0.1","workitem":[{"winame":"LTE_UL64QAM-UEConTest"}],"crnumber":2442.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_70_Malta\/Docs\/R5-160458.zip","group":"R5","meeting":"R5-70","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-160459","title":"Rel-13 Test point reduction for UL 64QAM multi-cluster MPR and ACLR tests","source":"CMCC","contact":"Jinqiang Xing","contact-id":62081,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":161,"ainumber":"5.4.1.2.1","ainame":"\tTx Requirements (Clause 6)","tdoc_agenda_sort_order":4590,"status":"agreed","reservation_date":"2016-02-05 02:59:11","uploaded":"2016-02-05 06:31:59","revisionof":"","revisedto":"","release":"Rel-13","crspec":"36.521-1","crspecversion":"13.0.1","workitem":[{"winame":"LTE_UL64QAM-UEConTest"},{"winame":"TEI13_Test"}],"crnumber":2443.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-160131","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_70_Malta\/Docs\/R5-160459.zip","group":"R5","meeting":"R5-70","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-160460","title":"Rel-8 Test point reduction for UL 64QAM AMPR, ASEM and ASE tests","source":"CMCC","contact":"Jinqiang Xing","contact-id":62081,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":161,"ainumber":"5.4.1.2.1","ainame":"\tTx Requirements (Clause 6)","tdoc_agenda_sort_order":4600,"status":"revised","reservation_date":"2016-02-05 02:59:11","uploaded":"2016-02-05 06:31:59","revisionof":"","revisedto":"R5-161047","release":"Rel-13","crspec":"36.521-1","crspecversion":"13.0.1","workitem":[{"winame":"TEI8_Test"}],"crnumber":2444.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_70_Malta\/Docs\/R5-160460.zip","group":"R5","meeting":"R5-70","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-160461","title":"Rel-13 Test point reduction for UL 64QAM AMPR and ASEM tests","source":"CMCC","contact":"Jinqiang Xing","contact-id":62081,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":161,"ainumber":"5.4.1.2.1","ainame":"\tTx Requirements (Clause 6)","tdoc_agenda_sort_order":4610,"status":"agreed","reservation_date":"2016-02-05 02:59:11","uploaded":"2016-02-05 06:31:59","revisionof":"","revisedto":"","release":"Rel-13","crspec":"36.521-1","crspecversion":"13.0.1","workitem":[{"winame":"LTE_UL64QAM-UEConTest"},{"winame":"TEI13_Test"}],"crnumber":2445.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-160131","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_70_Malta\/Docs\/R5-160461.zip","group":"R5","meeting":"R5-70","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-160462","title":"Rel-13 Test point reduction for UL 64QAM CA MPR and ACLR tests","source":"CMCC","contact":"Jinqiang Xing","contact-id":62081,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":161,"ainumber":"5.4.1.2.1","ainame":"\tTx Requirements (Clause 6)","tdoc_agenda_sort_order":4620,"status":"agreed","reservation_date":"2016-02-05 02:59:11","uploaded":"2016-02-05 06:31:59","revisionof":"","revisedto":"","release":"Rel-13","crspec":"36.521-1","crspecversion":"13.0.1","workitem":[{"winame":"LTE_UL64QAM-UEConTest"},{"winame":"TEI13_Test"}],"crnumber":2446.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-160131","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_70_Malta\/Docs\/R5-160462.zip","group":"R5","meeting":"R5-70","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-160463","title":"Rel-10 Test point reduction for UL 64QAM CA AMPR, ASEM and ASE tests","source":"CMCC","contact":"Jinqiang Xing","contact-id":62081,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":161,"ainumber":"5.4.1.2.1","ainame":"\tTx Requirements (Clause 6)","tdoc_agenda_sort_order":4630,"status":"revised","reservation_date":"2016-02-05 02:59:11","uploaded":"2016-02-05 06:32:00","revisionof":"","revisedto":"R5-161061","release":"Rel-13","crspec":"36.521-1","crspecversion":"13.0.1","workitem":[{"winame":"TEI10_Test"}],"crnumber":2447.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_70_Malta\/Docs\/R5-160463.zip","group":"R5","meeting":"R5-70","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-160464","title":"Rel-13 Test point reduction for UL 64QAM CA AMPR, ASEM and ASE tests","source":"CMCC","contact":"Jinqiang Xing","contact-id":62081,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":161,"ainumber":"5.4.1.2.1","ainame":"\tTx Requirements (Clause 6)","tdoc_agenda_sort_order":4640,"status":"agreed","reservation_date":"2016-02-05 02:59:11","uploaded":"2016-02-05 06:32:00","revisionof":"","revisedto":"","release":"Rel-13","crspec":"36.521-1","crspecversion":"13.0.1","workitem":[{"winame":"LTE_UL64QAM-UEConTest"},{"winame":"TEI13_Test"}],"crnumber":2448.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-160131","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_70_Malta\/Docs\/R5-160464.zip","group":"R5","meeting":"R5-70","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-160483","title":"Correction to UL CA Tx tests","source":"Anritsu","contact":"Takahiko Sato","contact-id":31320,"tdoctype":"CR","for":"","abstract":"","secretary_remarks":"","agenda_item_sort_order":161,"ainumber":"5.4.1.2.1","ainame":"\tTx Requirements (Clause 6)","tdoc_agenda_sort_order":4830,"status":"agreed","reservation_date":"2016-02-05 05:19:08","uploaded":"2016-02-06 06:26:01","revisionof":"","revisedto":"","release":"Rel-13","crspec":"36.521-1","crspecversion":"13.0.1","workitem":[{"winame":"TEI10_Test"}],"crnumber":2452.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-160128","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_70_Malta\/Docs\/R5-160483.zip","group":"R5","meeting":"R5-70","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-160548","title":"Correction to the UL CA Frequency Erorr Testcase","source":"Intel Corporation (UK) Ltd","contact":"Hassan Yaghoobi","contact-id":34546,"tdoctype":"CR","for":"Approval","abstract":"Correction to the UL CA Frequency Erorr Testcase","secretary_remarks":"","agenda_item_sort_order":161,"ainumber":"5.4.1.2.1","ainame":"\tTx Requirements (Clause 6)","tdoc_agenda_sort_order":5480,"status":"revised","reservation_date":"2016-02-05 10:03:57","uploaded":"2016-02-05 10:29:38","revisionof":"","revisedto":"R5-161062","release":"Rel-13","crspec":"36.521-1","crspecversion":"13.0.1","workitem":[{"winame":"TEI10_Test"}],"crnumber":2472.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_70_Malta\/Docs\/R5-160548.zip","group":"R5","meeting":"R5-70","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-160549","title":"Correction to the UL CA Testcases \u2013 Removal of references to Annex A.3","source":"Intel Corporation (UK) Ltd","contact":"Hassan Yaghoobi","contact-id":34546,"tdoctype":"CR","for":"Approval","abstract":"Correction to the UL CA Testcases \u2013 Removal of references to Annex A.3","secretary_remarks":"","agenda_item_sort_order":161,"ainumber":"5.4.1.2.1","ainame":"\tTx Requirements (Clause 6)","tdoc_agenda_sort_order":5490,"status":"withdrawn","reservation_date":"2016-02-05 10:10:35","uploaded":"2016-02-05 10:29:38","revisionof":"","revisedto":"","release":"Rel-13","crspec":"36.521-1","crspecversion":"13.0.1","workitem":[{"winame":"TEI10_Test"}],"crnumber":2473.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_70_Malta\/Docs\/R5-160549.zip","group":"R5","meeting":"R5-70","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-160550","title":"Addition of expected power disctribution in UL CA testcases.","source":"Intel Corporation (UK) Ltd","contact":"Hassan Yaghoobi","contact-id":34546,"tdoctype":"CR","for":"Approval","abstract":"Addition of expected power disctribution in UL CA testcases.","secretary_remarks":"","agenda_item_sort_order":161,"ainumber":"5.4.1.2.1","ainame":"\tTx Requirements (Clause 6)","tdoc_agenda_sort_order":5500,"status":"withdrawn","reservation_date":"2016-02-05 10:16:00","uploaded":"2016-02-05 10:29:38","revisionof":"","revisedto":"","release":"Rel-13","crspec":"36.521-1","crspecversion":"13.0.1","workitem":[{"winame":"TEI10_Test"}],"crnumber":2474.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_70_Malta\/Docs\/R5-160550.zip","group":"R5","meeting":"R5-70","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-160581","title":"Minor correction to TC 6.6.3.2","source":"Rohde & Schwarz","contact":"Niels Petrovic","contact-id":49274,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":161,"ainumber":"5.4.1.2.1","ainame":"\tTx Requirements (Clause 6)","tdoc_agenda_sort_order":5810,"status":"revised","reservation_date":"2016-02-05 12:23:30","uploaded":"2016-02-05 14:18:29","revisionof":"","revisedto":"R5-160802","release":"Rel-13","crspec":"36.521-1","crspecversion":"13.0.1","workitem":[{"winame":"TEI8_Test"}],"crnumber":2483.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_70_Malta\/Docs\/R5-160581.zip","group":"R5","meeting":"R5-70","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-160582","title":"CA RF: Corrections to Notes in TC 7.3A.3","source":"Rohde & Schwarz","contact":"Niels Petrovic","contact-id":49274,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":161,"ainumber":"5.4.1.2.1","ainame":"\tTx Requirements (Clause 6)","tdoc_agenda_sort_order":5820,"status":"agreed","reservation_date":"2016-02-05 12:23:30","uploaded":"2016-02-05 14:18:28","revisionof":"","revisedto":"","release":"Rel-13","crspec":"36.521-1","crspecversion":"13.0.1","workitem":[{"winame":"TEI10_Test"}],"crnumber":2484.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-160128","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_70_Malta\/Docs\/R5-160582.zip","group":"R5","meeting":"R5-70","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-160585","title":"Removal of editor\u2019s notes in TC 6.5.2A.2.1 & 6.5.2A.3.1","source":"Rohde & Schwarz","contact":"Niels Petrovic","contact-id":49274,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":161,"ainumber":"5.4.1.2.1","ainame":"\tTx Requirements (Clause 6)","tdoc_agenda_sort_order":5850,"status":"revised","reservation_date":"2016-02-05 12:23:30","uploaded":"2016-02-05 14:18:28","revisionof":"","revisedto":"R5-160803","release":"Rel-13","crspec":"36.521-1","crspecversion":"13.0.1","workitem":[{"winame":"TEI10_Test"}],"crnumber":2487.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_70_Malta\/Docs\/R5-160585.zip","group":"R5","meeting":"R5-70","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-160689","title":"A-SEM test with frequency hopping","source":"Ericsson","contact":"Mikael Zir\u00e9n","contact-id":35491,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":161,"ainumber":"5.4.1.2.1","ainame":"\tTx Requirements (Clause 6)","tdoc_agenda_sort_order":6890,"status":"withdrawn","reservation_date":"2016-02-05 19:36:09","uploaded":null,"revisionof":"","revisedto":"","release":"Rel-13","crspec":"36.521-1","crspecversion":"13.0.1","workitem":[{"winame":"TEI8_Test"}],"crnumber":2521.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"","group":"R5","meeting":"R5-70","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-160690","title":"Correction to A-MPR test with frequency hopping","source":"Ericsson","contact":"Mikael Zir\u00e9n","contact-id":35491,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":161,"ainumber":"5.4.1.2.1","ainame":"\tTx Requirements (Clause 6)","tdoc_agenda_sort_order":6900,"status":"revised","reservation_date":"2016-02-05 19:36:09","uploaded":"2016-02-05 21:33:05","revisionof":"","revisedto":"R5-161064","release":"Rel-13","crspec":"36.521-1","crspecversion":"13.0.1","workitem":[{"winame":"TEI8_Test"}],"crnumber":2522.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_70_Malta\/Docs\/R5-160690.zip","group":"R5","meeting":"R5-70","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-160697","title":"Introduction of Spectrum emissions test cases with PUSCH frequency hopping","source":"Ericsson","contact":"Mikael Zir\u00e9n","contact-id":35491,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":161,"ainumber":"5.4.1.2.1","ainame":"\tTx Requirements (Clause 6)","tdoc_agenda_sort_order":6970,"status":"revised","reservation_date":"2016-02-05 20:02:22","uploaded":"2016-02-05 21:33:06","revisionof":"","revisedto":"R5-161063","release":"Rel-13","crspec":"36.521-1","crspecversion":"13.0.1","workitem":[{"winame":"TEI8_Test"}],"crnumber":2523.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_70_Malta\/Docs\/R5-160697.zip","group":"R5","meeting":"R5-70","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-160802","title":"Minor correction to TC 6.6.3.2","source":"Rohde & Schwarz","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":161,"ainumber":"5.4.1.2.1","ainame":"\tTx Requirements (Clause 6)","tdoc_agenda_sort_order":5811,"status":"agreed","reservation_date":"2016-03-04 13:34:53","uploaded":"2016-08-31 15:49:23","revisionof":"R5-160581","revisedto":"","release":"Rel-13","crspec":"36.521-1","crspecversion":"13.0.1","workitem":[{"winame":"TEI8_Test"}],"crnumber":2483.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-160118","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_70_Malta\/Docs\/R5-160802.zip","group":"R5","meeting":"R5-70","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-160803","title":"Removal of editor\u2019s notes in TC 6.5.2A.2.1 & 6.5.2A.3.1","source":"Rohde & Schwarz","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":161,"ainumber":"5.4.1.2.1","ainame":"\tTx Requirements (Clause 6)","tdoc_agenda_sort_order":5851,"status":"agreed","reservation_date":"2016-03-04 13:34:55","uploaded":"2016-08-31 15:49:23","revisionof":"R5-160585","revisedto":"","release":"Rel-13","crspec":"36.521-1","crspecversion":"13.0.1","workitem":[{"winame":"TEI10_Test"}],"crnumber":2487.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-160128","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_70_Malta\/Docs\/R5-160803.zip","group":"R5","meeting":"R5-70","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-160825","title":"Rel-10 Test point reduction for UL 64QAM multi-cluster MPR and ACLR tests","source":"CMCC","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":161,"ainumber":"5.4.1.2.1","ainame":"\tTx Requirements (Clause 6)","tdoc_agenda_sort_order":3701,"status":"agreed","reservation_date":"2016-03-04 13:35:21","uploaded":"2016-08-31 15:49:24","revisionof":"R5-160370","revisedto":"","release":"Rel-13","crspec":"36.521-1","crspecversion":"13.0.1","workitem":[{"winame":"TEI10_Test"}],"crnumber":2436.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-160128","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_70_Malta\/Docs\/R5-160825.zip","group":"R5","meeting":"R5-70","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-161041","title":"Test configuration correction for AMPR tests","source":"CMCC","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":161,"ainumber":"5.4.1.2.1","ainame":"\tTx Requirements (Clause 6)","tdoc_agenda_sort_order":3621,"status":"agreed","reservation_date":"2016-03-04 16:13:09","uploaded":"2016-08-31 15:49:25","revisionof":"R5-160362","revisedto":"","release":"Rel-13","crspec":"36.521-1","crspecversion":"13.0.1","workitem":[{"winame":"TEI8_Test"}],"crnumber":2433.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-160118","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_70_Malta\/Docs\/R5-161041.zip","group":"R5","meeting":"R5-70","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-161042","title":"Test configuration correction for ASE tests","source":"CMCC","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":161,"ainumber":"5.4.1.2.1","ainame":"\tTx Requirements (Clause 6)","tdoc_agenda_sort_order":3641,"status":"agreed","reservation_date":"2016-03-04 16:13:10","uploaded":"2016-08-31 15:49:25","revisionof":"R5-160364","revisedto":"","release":"Rel-13","crspec":"36.521-1","crspecversion":"13.0.1","workitem":[{"winame":"TEI8_Test"}],"crnumber":2434.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-160118","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_70_Malta\/Docs\/R5-161042.zip","group":"R5","meeting":"R5-70","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-161043","title":"Test configuration correction for ASEM tests","source":"CMCC","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":161,"ainumber":"5.4.1.2.1","ainame":"\tTx Requirements (Clause 6)","tdoc_agenda_sort_order":3651,"status":"agreed","reservation_date":"2016-03-04 16:13:11","uploaded":"2016-08-31 15:49:25","revisionof":"R5-160365","revisedto":"","release":"Rel-13","crspec":"36.521-1","crspecversion":"13.0.1","workitem":[{"winame":"TEI8_Test"}],"crnumber":2435.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-160118","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_70_Malta\/Docs\/R5-161043.zip","group":"R5","meeting":"R5-70","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-161044","title":"Test configuration correction for UL 64QAM AMPR tests","source":"CMCC","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":161,"ainumber":"5.4.1.2.1","ainame":"\tTx Requirements (Clause 6)","tdoc_agenda_sort_order":4401,"status":"agreed","reservation_date":"2016-03-04 16:13:13","uploaded":"2016-08-31 15:49:25","revisionof":"R5-160440","revisedto":"","release":"Rel-13","crspec":"36.521-1","crspecversion":"13.0.1","workitem":[{"winame":"TEI13_Test"},{"winame":"LTE_UL64QAM-UEConTest"}],"crnumber":2438.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-160131","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_70_Malta\/Docs\/R5-161044.zip","group":"R5","meeting":"R5-70","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-161045","title":"Test configuration correction for UL 64QAM ASE tests","source":"CMCC","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":161,"ainumber":"5.4.1.2.1","ainame":"\tTx Requirements (Clause 6)","tdoc_agenda_sort_order":4571,"status":"agreed","reservation_date":"2016-03-04 16:13:14","uploaded":"2016-08-31 15:49:25","revisionof":"R5-160457","revisedto":"","release":"Rel-13","crspec":"36.521-1","crspecversion":"13.0.1","workitem":[{"winame":"TEI13_Test"},{"winame":"LTE_UL64QAM-UEConTest"}],"crnumber":2441.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-160131","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_70_Malta\/Docs\/R5-161045.zip","group":"R5","meeting":"R5-70","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-161046","title":"Test configuration correction for UL 64QAM ASEM tests","source":"CMCC","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":161,"ainumber":"5.4.1.2.1","ainame":"\tTx Requirements (Clause 6)","tdoc_agenda_sort_order":4581,"status":"agreed","reservation_date":"2016-03-04 16:13:15","uploaded":"2016-08-31 15:49:25","revisionof":"R5-160458","revisedto":"","release":"Rel-13","crspec":"36.521-1","crspecversion":"13.0.1","workitem":[{"winame":"TEI13_Test"},{"winame":"LTE_UL64QAM-UEConTest"}],"crnumber":2442.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-160131","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_70_Malta\/Docs\/R5-161046.zip","group":"R5","meeting":"R5-70","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-161047","title":"Rel-8 Test point reduction for UL 64QAM AMPR, ASEM and ASE tests","source":"CMCC","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":161,"ainumber":"5.4.1.2.1","ainame":"\tTx Requirements (Clause 6)","tdoc_agenda_sort_order":4601,"status":"agreed","reservation_date":"2016-03-04 16:13:16","uploaded":"2016-08-31 15:49:25","revisionof":"R5-160460","revisedto":"","release":"Rel-13","crspec":"36.521-1","crspecversion":"13.0.1","workitem":[{"winame":"TEI8_Test"}],"crnumber":2444.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-160118","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_70_Malta\/Docs\/R5-161047.zip","group":"R5","meeting":"R5-70","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-161061","title":"Rel-10 Test point reduction for UL 64QAM CA AMPR, ASEM and ASE tests","source":"CMCC","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":161,"ainumber":"5.4.1.2.1","ainame":"\tTx Requirements (Clause 6)","tdoc_agenda_sort_order":4631,"status":"agreed","reservation_date":"2016-03-04 16:13:32","uploaded":"2016-08-31 15:49:25","revisionof":"R5-160463","revisedto":"","release":"Rel-13","crspec":"36.521-1","crspecversion":"13.0.1","workitem":[{"winame":"TEI10_Test"}],"crnumber":2447.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-160128","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_70_Malta\/Docs\/R5-161061.zip","group":"R5","meeting":"R5-70","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-161062","title":"Correction to the UL CA Frequency Erorr Testcase","source":"Intel Corporation (UK) Ltd","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":161,"ainumber":"5.4.1.2.1","ainame":"\tTx Requirements (Clause 6)","tdoc_agenda_sort_order":5481,"status":"agreed","reservation_date":"2016-03-04 16:13:33","uploaded":"2016-08-31 15:49:25","revisionof":"R5-160548","revisedto":"","release":"Rel-13","crspec":"36.521-1","crspecversion":"13.0.1","workitem":[{"winame":"TEI10_Test"}],"crnumber":2472.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-160128","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_70_Malta\/Docs\/R5-161062.zip","group":"R5","meeting":"R5-70","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-161063","title":"Introduction of Spectrum emissions test cases with PUSCH frequency hopping","source":"Ericsson","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":161,"ainumber":"5.4.1.2.1","ainame":"\tTx Requirements (Clause 6)","tdoc_agenda_sort_order":6971,"status":"not pursued","reservation_date":"2016-03-04 16:13:34","uploaded":"2016-08-31 15:49:25","revisionof":"R5-160697","revisedto":"","release":"Rel-13","crspec":"36.521-1","crspecversion":"13.0.1","workitem":[{"winame":"TEI8_Test"}],"crnumber":2523.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_70_Malta\/Docs\/R5-161063.zip","group":"R5","meeting":"R5-70","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-161064","title":"Correction to A-MPR test with frequency hopping","source":"Ericsson","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":161,"ainumber":"5.4.1.2.1","ainame":"\tTx Requirements (Clause 6)","tdoc_agenda_sort_order":6901,"status":"agreed","reservation_date":"2016-03-04 16:13:35","uploaded":"2016-08-31 15:49:25","revisionof":"R5-160690","revisedto":"","release":"Rel-13","crspec":"36.521-1","crspecversion":"13.0.1","workitem":[{"winame":"TEI8_Test"}],"crnumber":2522.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-160118","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_70_Malta\/Docs\/R5-161064.zip","group":"R5","meeting":"R5-70","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]