[{"name":"R5-222547","title":"Correction to test frequency for n53","source":"ROHDE & SCHWARZ","contact":"Edwin Menzel","contact-id":65839,"tdoctype":"CR","for":"Agreement","abstract":"The carrier centre frequency for mid-range test frequency of band n53 for CBW=10 MHz, SCS=60 kHz has been corrected to match the ARFCN value. \nIt seems that SIG is not using this test frequency based on Table 6.2.3.1-3 in TS 38.508-1. However, it's note sure whether any SIG spec is directly referring to Table 4.3.1.1.1.53-3 of TS 38.508-1.","secretary_remarks":"","agenda_item_sort_order":562,"ainumber":"5.4.1.1","ainame":"\tTest frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":25470,"status":"revised","reservation_date":"2022-04-22 15:01:26","uploaded":"2022-04-25 18:19:00","revisionof":"","revisedto":"R5-223792","release":"Rel-17","crspec":"38.508-1","crspecversion":"17.4.0","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":2322.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_95_Electronic\/Docs\/R5-222547.zip","group":"R5","meeting":"R5-95-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-222836","title":"Clarification of Annex C for calculation of SSB and CORESET#0 for PCells","source":"Ericsson","contact":"Leif Mattisson","contact-id":10602,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":562,"ainumber":"5.4.1.1","ainame":"\tTest frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":28360,"status":"agreed","reservation_date":"2022-04-25 07:30:03","uploaded":"2022-04-25 14:47:14","revisionof":"","revisedto":"","release":"Rel-17","crspec":"38.508-1","crspecversion":"17.4.0","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":2354.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-221118","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_95_Electronic\/Docs\/R5-222836.zip","group":"R5","meeting":"R5-95-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-222875","title":"Clarification of PCC and SCC configuration for CA test cases","source":"Huawei, HiSilicon, CMCC","contact":"Chunying Gu","contact-id":65493,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":562,"ainumber":"5.4.1.1","ainame":"\tTest frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":28750,"status":"revised","reservation_date":"2022-04-25 08:28:49","uploaded":"2022-04-25 12:33:13","revisionof":"","revisedto":"R5-223793","release":"Rel-17","crspec":"38.508-1","crspecversion":"17.4.0","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":2369.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_95_Electronic\/Docs\/R5-222875.zip","group":"R5","meeting":"R5-95-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-223602","title":"Correction to 4.3.1.4.1.3 on test frequencies for DC_1A-28A_n78C","source":"ZTE Corporation","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":562,"ainumber":"5.4.1.1","ainame":"\tTest frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":333100,"status":"agreed","reservation_date":"2022-05-24 07:36:01","uploaded":"2022-05-24 07:41:31","revisionof":"","revisedto":"","release":"Rel-17","crspec":"38.508-1","crspecversion":"17.4.0","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":2415.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-221118","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_95_Electronic\/Docs\/R5-223602.zip","group":"R5","meeting":"R5-95-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-223792","title":"Correction to test frequency for n53","source":"ROHDE & SCHWARZ","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":562,"ainumber":"5.4.1.1","ainame":"\tTest frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":25471,"status":"agreed","reservation_date":"2022-05-24 10:08:24","uploaded":"2022-05-24 10:11:11","revisionof":"R5-222547","revisedto":"","release":"Rel-17","crspec":"38.508-1","crspecversion":"17.4.0","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":2322.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-221118","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_95_Electronic\/Docs\/R5-223792.zip","group":"R5","meeting":"R5-95-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-223793","title":"Clarification of PCC and SCC configuration for CA test cases","source":"Huawei, HiSilicon, CMCC","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":562,"ainumber":"5.4.1.1","ainame":"\tTest frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":28751,"status":"agreed","reservation_date":"2022-05-24 10:08:25","uploaded":"2022-05-24 10:11:11","revisionof":"R5-222875","revisedto":"","release":"Rel-17","crspec":"38.508-1","crspecversion":"17.4.0","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":2369.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-221118","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_95_Electronic\/Docs\/R5-223793.zip","group":"R5","meeting":"R5-95-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]