[{"name":"R5-255620","title":"Correction of UL test frequencies and CBWs for n71","source":"Nokia","contact":"Tuomo S\u00e4yn\u00e4j\u00e4kangas","contact-id":69937,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":688,"ainumber":"5.4.1.1","ainame":"Test frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":562000,"status":"agreed","reservation_date":"2025-10-31 07:07:23","uploaded":"2025-11-06 11:30:35","revisionof":"","revisedto":"","release":"Rel-19","crspec":"38.508-1","crspecversion":"19.1.1","workitem":[{"winame":"TEI18_Test"}],"crnumber":3606.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-253600","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5__109_Dallas\/Docs\/R5-255620.zip","group":"R5","meeting":"R5-109","year":2025,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R5-256318","title":"Removal of test frequencies for pending R15 configurations including FR1 and FR2","source":"ZTE Corporation","contact":"Zhifeng Ma","contact-id":61569,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"Source modified on 11\/7\/2025. Original source : ZTE Corporation","agenda_item_sort_order":688,"ainumber":"5.4.1.1","ainame":"Test frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":631800,"status":"revised","reservation_date":"2025-07-11 13:18:01","uploaded":"2025-11-07 18:04:47","revisionof":"","revisedto":"R5-256939","release":"Rel-19","crspec":"38.508-1","crspecversion":"19.1.1","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":3661.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5__109_Dallas\/Docs\/R5-256318.zip","group":"R5","meeting":"R5-109","year":2025,"uicc_affected":false,"me_affected":false,"ran_affected":false,"cn_affected":false,"clauses_affected":"4.3.1.6.1.2, 4.3.1.6.1.3","crsinpack":null,"crsinpacknumber":0},
{"name":"R5-256381","title":"Adding test frequency for band n79 with 30, 70 and 90MHz channel bandwidth","source":"Huawei, HiSilicon","contact":"Chunying Gu","contact-id":65493,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"Source modified on 11\/7\/2025. Original source : Huawei, HiSilicon","agenda_item_sort_order":688,"ainumber":"5.4.1.1","ainame":"Test frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":638100,"status":"agreed","reservation_date":"2025-07-11 14:51:57","uploaded":"2025-11-07 20:01:53","revisionof":"","revisedto":"","release":"Rel-19","crspec":"38.508-1","crspecversion":"19.1.1","workitem":[{"winame":"TEI17_Test"}],"crnumber":3669.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-253598","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5__109_Dallas\/Docs\/R5-256381.zip","group":"R5","meeting":"R5-109","year":2025,"uicc_affected":false,"me_affected":false,"ran_affected":false,"cn_affected":false,"clauses_affected":"4.3.1.1.1.79","crsinpack":null,"crsinpacknumber":0},
{"name":"R5-256477","title":"Correction to RedCap high test channel bandwidth for n38 in Table 4.3.1.0C-1","source":"Apple","contact":"Xinrong Wang","contact-id":102059,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":688,"ainumber":"5.4.1.1","ainame":"Test frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":647700,"status":"agreed","reservation_date":"2025-07-11 17:41:47","uploaded":"2025-11-07 23:22:47","revisionof":"","revisedto":"","release":"Rel-19","crspec":"38.508-1","crspecversion":"19.1.1","workitem":[{"winame":"TEI17_Test"}],"crnumber":3672.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-253598","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5__109_Dallas\/Docs\/R5-256477.zip","group":"R5","meeting":"R5-109","year":2025,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R5-256939","title":"Removal of test frequencies for pending R15 configurations including FR1 and FR2","source":"ZTE Corporation","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"Source modified on 01\/12\/2025. Original source : ZTE Corporation","agenda_item_sort_order":688,"ainumber":"5.4.1.1","ainame":"Test frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":631801,"status":"withdrawn","reservation_date":"2025-01-12 13:42:57","uploaded":"2025-12-01 13:51:10","revisionof":"R5-256318","revisedto":"","release":"Rel-19","crspec":"38.508-1","crspecversion":"19.1.1","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":3661.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5__109_Dallas\/Docs\/R5-256939.zip","group":"R5","meeting":"R5-109","year":2025,"uicc_affected":false,"me_affected":false,"ran_affected":false,"cn_affected":false,"clauses_affected":"4.3.1.6.1.2, 4.3.1.6.1.3","crsinpack":null,"crsinpacknumber":0}]