[{"name":"R5-253776","title":"Editorial corrections to the EN in clause 4.3.1.1.3","source":"MediaTek Inc.","contact":"Daiwei Zhou","contact-id":72872,"tdoctype":"CR","for":"Agreement","abstract":"Editorial","secretary_remarks":"Source modified on 8\/13\/2025. Original source : MediaTek Inc.","agenda_item_sort_order":679,"ainumber":"5.4.1.1","ainame":"Test frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":37760,"status":"agreed","reservation_date":"2025-08-04 08:46:22","uploaded":"2025-08-13 10:43:33","revisionof":"","revisedto":"","release":"Rel-19","crspec":"38.508-1","crspecversion":"19.0.0","workitem":[{"winame":"TEI15_Test"}],"crnumber":3519.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-252295","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5__108_Bangalore\/Docs\/R5-253776.zip","group":"R5","meeting":"R5-108","year":2025,"uicc_affected":false,"me_affected":false,"ran_affected":false,"cn_affected":false,"clauses_affected":"4.3.1.1.3.5.1 and 4.3.1.1.3.77.1","crsinpack":null,"crsinpacknumber":0},
{"name":"R5-253789","title":"Addition of test frequencies for R15 EN-DC combos within FR1","source":"KDDI Corporation","contact":"Keita Sekino","contact-id":100167,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":679,"ainumber":"5.4.1.1","ainame":"Test frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":37890,"status":"agreed","reservation_date":"2025-08-04 12:48:28","uploaded":"2025-08-14 13:10:11","revisionof":"","revisedto":"","release":"Rel-19","crspec":"38.508-1","crspecversion":"19.0.0","workitem":[{"winame":"TEI15_Test"}],"crnumber":3521.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-252295","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5__108_Bangalore\/Docs\/R5-253789.zip","group":"R5","meeting":"R5-108","year":2025,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R5-253961","title":"Correction of test frequencies for Band n254","source":"China Telecom","contact":"Lei GAO","contact-id":107221,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":679,"ainumber":"5.4.1.1","ainame":"Test frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":39610,"status":"agreed","reservation_date":"2025-08-11 06:55:48","uploaded":"2025-08-15 06:10:11","revisionof":"","revisedto":"","release":"Rel-19","crspec":"38.508-1","crspecversion":"19.0.0","workitem":[{"winame":"TEI18_Test"}],"crnumber":3525.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-252308","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5__108_Bangalore\/Docs\/R5-253961.zip","group":"R5","meeting":"R5-108","year":2025,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R5-254207","title":"Modification of the references for the RRM FR2 intra-band contiguous tables in Annex E","source":"Keysight Technologies UK Ltd","contact":"Fran Martos","contact-id":110697,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":679,"ainumber":"5.4.1.1","ainame":"Test frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":42070,"status":"withdrawn","reservation_date":"2025-08-14 08:13:27","uploaded":null,"revisionof":"","revisedto":"","release":"Rel-19","crspec":"38.508-1","crspecversion":"19.0.0","workitem":[{"winame":"TEI15_Test"},{"winame":" 5GS_NR_LTE-UEConTest"}],"crnumber":3542.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"","group":"R5","meeting":"R5-108","year":2025,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R5-254314","title":"Updates on test freq for R15 EN-DC configuration with more than three bands","source":"ZTE Corporation","contact":"Zhifeng Ma","contact-id":61569,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"Source modified on 8\/15\/2025. Original source : ZTE Corporation","agenda_item_sort_order":679,"ainumber":"5.4.1.1","ainame":"Test frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":43140,"status":"agreed","reservation_date":"2025-08-14 14:49:10","uploaded":"2025-08-15 14:33:37","revisionof":"","revisedto":"","release":"Rel-19","crspec":"38.508-1","crspecversion":"19.0.0","workitem":[{"winame":"TEI15_Test"}],"crnumber":3554.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-252297","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5__108_Bangalore\/Docs\/R5-254314.zip","group":"R5","meeting":"R5-108","year":2025,"uicc_affected":false,"me_affected":false,"ran_affected":false,"cn_affected":false,"clauses_affected":"4.3.1.4.1.3, 4.3.1.4.1.4, 4.3.1.4.1.5, 4.3.1.4.1.6, 4.3.1.5.1.3, 4.3.1.5.1.4, 4.3.1.5.1.5, 4.3.1.6.1.2, 4.3.1.6.1.3","crsinpack":null,"crsinpacknumber":0},
{"name":"R5-254326","title":"Addition of test freq for EN-DC configuration DC_1A-41A_n78A","source":"ZTE Corporation","contact":"Zhifeng Ma","contact-id":61569,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"Source modified on 8\/15\/2025. Original source : ZTE Corporation","agenda_item_sort_order":679,"ainumber":"5.4.1.1","ainame":"Test frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":43260,"status":"agreed","reservation_date":"2025-08-14 14:49:16","uploaded":"2025-08-15 14:36:14","revisionof":"","revisedto":"","release":"Rel-19","crspec":"38.508-1","crspecversion":"19.0.0","workitem":[{"winame":"TEI15_Test"}],"crnumber":3555.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-252297","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5__108_Bangalore\/Docs\/R5-254326.zip","group":"R5","meeting":"R5-108","year":2025,"uicc_affected":false,"me_affected":false,"ran_affected":false,"cn_affected":false,"clauses_affected":"4.3.1.4.1.3","crsinpack":null,"crsinpacknumber":0},
{"name":"R5-254373","title":"Correction of test frequencies for Band n99","source":"ROHDE & SCHWARZ","contact":"Edwin Menzel","contact-id":65839,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":679,"ainumber":"5.4.1.1","ainame":"Test frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":43730,"status":"agreed","reservation_date":"2025-08-14 15:17:10","uploaded":"2025-08-16 07:59:41","revisionof":"","revisedto":"","release":"Rel-19","crspec":"38.508-1","crspecversion":"19.0.0","workitem":[{"winame":"TEI17_Test"}],"crnumber":3557.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-252305","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5__108_Bangalore\/Docs\/R5-254373.zip","group":"R5","meeting":"R5-108","year":2025,"uicc_affected":false,"me_affected":false,"ran_affected":false,"cn_affected":false,"clauses_affected":"4.3.1.1.1.99","crsinpack":null,"crsinpacknumber":0},
{"name":"R5-254374","title":"Correction of test frequencies for Band n29","source":"ROHDE & SCHWARZ","contact":"Edwin Menzel","contact-id":65839,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":679,"ainumber":"5.4.1.1","ainame":"Test frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":43740,"status":"agreed","reservation_date":"2025-08-14 15:17:10","uploaded":"2025-08-16 07:59:41","revisionof":"","revisedto":"","release":"Rel-19","crspec":"38.508-1","crspecversion":"19.0.0","workitem":[{"winame":"TEI16_Test"}],"crnumber":3558.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-252302","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5__108_Bangalore\/Docs\/R5-254374.zip","group":"R5","meeting":"R5-108","year":2025,"uicc_affected":false,"me_affected":false,"ran_affected":false,"cn_affected":false,"clauses_affected":"4.3.1.1.1.29","crsinpack":null,"crsinpacknumber":0},
{"name":"R5-254375","title":"Correction of test frequencies for Band n75 and n76","source":"ROHDE & SCHWARZ","contact":"Edwin Menzel","contact-id":65839,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":679,"ainumber":"5.4.1.1","ainame":"Test frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":43750,"status":"agreed","reservation_date":"2025-08-14 15:17:11","uploaded":"2025-08-16 07:59:41","revisionof":"","revisedto":"","release":"Rel-19","crspec":"38.508-1","crspecversion":"19.0.0","workitem":[{"winame":"TEI15_Test"}],"crnumber":3559.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-252297","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5__108_Bangalore\/Docs\/R5-254375.zip","group":"R5","meeting":"R5-108","year":2025,"uicc_affected":false,"me_affected":false,"ran_affected":false,"cn_affected":false,"clauses_affected":"4.3.1.1.1.75, 4.3.1.1.1.76","crsinpack":null,"crsinpacknumber":0},
{"name":"R5-254736","title":"Definition of UL Mid CBW for n8","source":"Anritsu","contact":"Masafumi Setsu","contact-id":89240,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":679,"ainumber":"5.4.1.1","ainame":"Test frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":47360,"status":"agreed","reservation_date":"2025-08-15 17:09:20","uploaded":"2025-08-15 17:49:49","revisionof":"","revisedto":"","release":"Rel-19","crspec":"38.508-1","crspecversion":"19.0.0","workitem":[{"winame":"TEI15_Test"}],"crnumber":3589.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-252298","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5__108_Bangalore\/Docs\/R5-254736.zip","group":"R5","meeting":"R5-108","year":2025,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R5-254737","title":"Correction to test frequencies of n105","source":"Anritsu","contact":"Masafumi Setsu","contact-id":89240,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":679,"ainumber":"5.4.1.1","ainame":"Test frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":47370,"status":"agreed","reservation_date":"2025-08-15 17:09:21","uploaded":"2025-08-15 17:49:49","revisionof":"","revisedto":"","release":"Rel-19","crspec":"38.508-1","crspecversion":"19.0.0","workitem":[{"winame":"TEI18_Test"}],"crnumber":3590.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-252308","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5__108_Bangalore\/Docs\/R5-254737.zip","group":"R5","meeting":"R5-108","year":2025,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R5-254793","title":"Adding test frequencies for several EN-DC configurations including band n40","source":"Huawei, HiSilicon","contact":"Chunying Gu","contact-id":65493,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"Source modified on 8\/16\/2025. Original source : Huawei, HiSilicon","agenda_item_sort_order":679,"ainumber":"5.4.1.1","ainame":"Test frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":47930,"status":"agreed","reservation_date":"2025-08-15 18:56:22","uploaded":"2025-08-16 06:19:39","revisionof":"","revisedto":"","release":"Rel-19","crspec":"38.508-1","crspecversion":"19.0.0","workitem":[{"winame":"TEI15_Test"}],"crnumber":3593.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-252299","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5__108_Bangalore\/Docs\/R5-254793.zip","group":"R5","meeting":"R5-108","year":2025,"uicc_affected":false,"me_affected":false,"ran_affected":false,"cn_affected":false,"clauses_affected":"4.3.1.4.1.2","crsinpack":null,"crsinpacknumber":0}]