[{"name":"R5-242362","title":"Introduction of test channel bandwidths and test frequencies for band n85","source":"Nokia","contact":"Tuomo S\u00e4yn\u00e4j\u00e4kangas","contact-id":69937,"tdoctype":"CR","for":"Agreement","abstract":"Band n85 Low test channel bandwidths and test frequencies for 3 MHz are specified in R5-242394 (CR 3122)","secretary_remarks":"","agenda_item_sort_order":655,"ainumber":"5.4.1.1","ainame":"Test frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":23620,"status":"revised","reservation_date":"2024-03-05 10:52:21","uploaded":"2024-05-10 14:07:29","revisionof":"","revisedto":"R5-243602","release":"Rel-18","crspec":"38.508-1","crspecversion":"18.2.0","workitem":[{"winame":"TEI17_Test"}],"crnumber":3118.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5__103_Fukuoka\/Docs\/R5-242362.zip","group":"R5","meeting":"R5-103","year":2024,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R5-242534","title":"Correction of clause structure of CA test frequencies","source":"Ericsson","contact":"Niclas Weiler","contact-id":97509,"tdoctype":"CR","for":"Agreement","abstract":"Editorial","secretary_remarks":"Source modified on 5\/8\/2024. Original source : Ericsson","agenda_item_sort_order":655,"ainumber":"5.4.1.1","ainame":"Test frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":25340,"status":"agreed","reservation_date":"2024-07-05 14:41:29","uploaded":"2024-05-08 10:04:02","revisionof":"","revisedto":"","release":"Rel-18","crspec":"38.508-1","crspecversion":"18.2.0","workitem":[{"winame":"TEI15_Test"}],"crnumber":3140.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-241017","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5__103_Fukuoka\/Docs\/R5-242534.zip","group":"R5","meeting":"R5-103","year":2024,"uicc_affected":false,"me_affected":false,"ran_affected":false,"cn_affected":false,"clauses_affected":"4.3.1.1.5.48, 4.3.1.1.5.71, 4.3.1.1.5.77, 4.3.1.1.5.78, 6.2.3.4","crsinpack":null,"crsinpacknumber":0},
{"name":"R5-242598","title":"Editorial correction for Editor Note and reference section number in 4.3.1","source":"CAICT","contact":"Yufeng Zhang","contact-id":86588,"tdoctype":"CR","for":"Agreement","abstract":"Editorial","secretary_remarks":"Source modified on 5\/10\/2024. Original source : CAICT","agenda_item_sort_order":655,"ainumber":"5.4.1.1","ainame":"Test frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":25980,"status":"agreed","reservation_date":"2024-08-05 10:28:02","uploaded":"2024-05-10 11:50:20","revisionof":"","revisedto":"","release":"Rel-18","crspec":"38.508-1","crspecversion":"18.2.0","workitem":[{"winame":"TEI15_Test"}],"crnumber":3150.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-241017","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5__103_Fukuoka\/Docs\/R5-242598.zip","group":"R5","meeting":"R5-103","year":2024,"uicc_affected":false,"me_affected":false,"ran_affected":false,"cn_affected":false,"clauses_affected":"4.3.1","crsinpack":null,"crsinpacknumber":0},
{"name":"R5-242601","title":"Addition of CBW 70MHz 90MHz and 100MHz for n40","source":"CAICT","contact":"Yufeng Zhang","contact-id":86588,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"Source modified on 5\/10\/2024. Original source : CAICT","agenda_item_sort_order":655,"ainumber":"5.4.1.1","ainame":"Test frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":26010,"status":"agreed","reservation_date":"2024-08-05 10:28:03","uploaded":"2024-05-10 11:50:20","revisionof":"","revisedto":"","release":"Rel-18","crspec":"38.508-1","crspecversion":"18.2.0","workitem":[{"winame":"TEI17_Test"}],"crnumber":3151.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-241029","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5__103_Fukuoka\/Docs\/R5-242601.zip","group":"R5","meeting":"R5-103","year":2024,"uicc_affected":false,"me_affected":false,"ran_affected":false,"cn_affected":false,"clauses_affected":"4.3.1","crsinpack":null,"crsinpacknumber":0},
{"name":"R5-242788","title":"Update of editors note for test frequencies","source":"Bureau Veritas ADT","contact":"Amy Tao","contact-id":62771,"tdoctype":"CR","for":"Agreement","abstract":"Duplicate to Join for review if agreeable from RF group","secretary_remarks":"","agenda_item_sort_order":655,"ainumber":"5.4.1.1","ainame":"Test frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":27880,"status":"revised","reservation_date":"2024-09-05 18:43:48","uploaded":"2024-05-10 16:44:03","revisionof":"","revisedto":"R5-243603","release":"Rel-18","crspec":"38.508-1","crspecversion":"18.2.0","workitem":[{"winame":"TEI15_Test"}],"crnumber":3177.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5__103_Fukuoka\/Docs\/R5-242788.zip","group":"R5","meeting":"R5-103","year":2024,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R5-242858","title":"Correction to SUL n83 test frequencies in Table 4.3.1.1.1.83-1","source":"Qualcomm Tech. Netherlands B.V","contact":"Hemish Parikh","contact-id":61982,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":655,"ainumber":"5.4.1.1","ainame":"Test frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":28580,"status":"agreed","reservation_date":"2024-10-05 02:30:26","uploaded":"2024-05-10 21:45:51","revisionof":"","revisedto":"","release":"Rel-18","crspec":"38.508-1","crspecversion":"18.2.0","workitem":[{"winame":"TEI15_Test"}],"crnumber":3191.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-241018","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5__103_Fukuoka\/Docs\/R5-242858.zip","group":"R5","meeting":"R5-103","year":2024,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R5-243008","title":"Clarification of test frequency for n5 CBW 25 MHz","source":"Anritsu","contact":"Masafumi Setsu","contact-id":89240,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":655,"ainumber":"5.4.1.1","ainame":"Test frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":30080,"status":"agreed","reservation_date":"2024-10-05 07:34:42","uploaded":"2024-05-10 08:38:21","revisionof":"","revisedto":"","release":"Rel-18","crspec":"38.508-1","crspecversion":"18.2.0","workitem":[{"winame":"TEI17_Test"}],"crnumber":3195.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-241030","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5__103_Fukuoka\/Docs\/R5-243008.zip","group":"R5","meeting":"R5-103","year":2024,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R5-243293","title":"Addition to 4.3.1 for FR2 Redcap UE test channel bandwidth","source":"ZTE Corporation","contact":"Zhifeng Ma","contact-id":61569,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"Source modified on 5\/11\/2024. Original source : ZTE Corporation","agenda_item_sort_order":655,"ainumber":"5.4.1.1","ainame":"Test frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":32930,"status":"revised","reservation_date":"2024-10-05 17:12:56","uploaded":"2024-05-11 05:26:35","revisionof":"","revisedto":"R5-243750","release":"Rel-18","crspec":"38.508-1","crspecversion":"18.2.0","workitem":[{"winame":"TEI17_Test"}],"crnumber":3208.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5__103_Fukuoka\/Docs\/R5-243293.zip","group":"R5","meeting":"R5-103","year":2024,"uicc_affected":false,"me_affected":false,"ran_affected":false,"cn_affected":false,"clauses_affected":"4.3.1.0A, 4.3.1.0B, 4.3.1.0C","crsinpack":null,"crsinpacknumber":0},
{"name":"R5-243294","title":"Corrections on 4.3.1.4.1.2 for test frequency for DC_38A_n78A","source":"ZTE Corporation","contact":"Zhifeng Ma","contact-id":61569,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"Source modified on 5\/11\/2024. Original source : ZTE Corporation","agenda_item_sort_order":655,"ainumber":"5.4.1.1","ainame":"Test frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":32940,"status":"agreed","reservation_date":"2024-10-05 17:12:57","uploaded":"2024-05-11 05:26:35","revisionof":"","revisedto":"","release":"Rel-18","crspec":"38.508-1","crspecversion":"18.2.0","workitem":[{"winame":"TEI15_Test"}],"crnumber":3209.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-241019","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5__103_Fukuoka\/Docs\/R5-243294.zip","group":"R5","meeting":"R5-103","year":2024,"uicc_affected":false,"me_affected":false,"ran_affected":false,"cn_affected":false,"clauses_affected":"4.3.1.4.1.2","crsinpack":null,"crsinpacknumber":0},
{"name":"R5-243602","title":"Introduction of test channel bandwidths and test frequencies for band n85","source":"Nokia","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":655,"ainumber":"5.4.1.1","ainame":"Test frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":23621,"status":"agreed","reservation_date":"2024-04-06 07:10:17","uploaded":"2024-06-04 07:11:07","revisionof":"R5-242362","revisedto":"","release":"Rel-18","crspec":"38.508-1","crspecversion":"18.2.0","workitem":[{"winame":"TEI17_Test"}],"crnumber":3118.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-241033","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5__103_Fukuoka\/Docs\/R5-243602.zip","group":"R5","meeting":"R5-103","year":2024,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R5-243603","title":"Update of editors note for test frequencies","source":"Bureau Veritas ADT","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"Source modified on 04\/06\/2024. Original source : Bureau Veritas ADT","agenda_item_sort_order":655,"ainumber":"5.4.1.1","ainame":"Test frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":27881,"status":"agreed","reservation_date":"2024-04-06 07:10:18","uploaded":"2024-06-04 07:11:07","revisionof":"R5-242788","revisedto":"","release":"Rel-18","crspec":"38.508-1","crspecversion":"18.2.0","workitem":[{"winame":"TEI15_Test"}],"crnumber":3177.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-241021","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5__103_Fukuoka\/Docs\/R5-243603.zip","group":"R5","meeting":"R5-103","year":2024,"uicc_affected":false,"me_affected":false,"ran_affected":false,"cn_affected":false,"clauses_affected":"4.3.1","crsinpack":null,"crsinpacknumber":0},
{"name":"R5-243750","title":"Addition to 4.3.1 for FR2 Redcap UE test channel bandwidth","source":"ZTE Corporation","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"Source modified on 04\/06\/2024. Original source : ZTE Corporation","agenda_item_sort_order":655,"ainumber":"5.4.1.1","ainame":"Test frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":32931,"status":"agreed","reservation_date":"2024-04-06 07:13:22","uploaded":"2024-06-04 07:21:15","revisionof":"R5-243293","revisedto":"","release":"Rel-18","crspec":"38.508-1","crspecversion":"18.2.0","workitem":[{"winame":"TEI17_Test"}],"crnumber":3208.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-241033","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5__103_Fukuoka\/Docs\/R5-243750.zip","group":"R5","meeting":"R5-103","year":2024,"uicc_affected":false,"me_affected":false,"ran_affected":false,"cn_affected":false,"clauses_affected":"4.3.1.0A, 4.3.1.0B, 4.3.1.0C","crsinpack":null,"crsinpacknumber":0}]